論文 - 井田 隆
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The effect of oxygen pressure on the synthesis of LiNiO2（共著） 査読あり
B.H. Kim, J.H. Kim, M.Y. Song, Takashi Ida, N. Ishizawa
Solid State Phenomena 124-126 1043 - 1046 2006年12月
記述言語：英語 掲載種別：研究論文（学術雑誌）
To investigate the effect of oxygen pressure on the synthesis of LiNiO2 cathode material for Li secondary battery, powder was prepared by emulsion method and calcined at 750°C for 24 h under various oxygen gas pressures. LiNiO2 single phase could be synthesized under oxygen pressure of 101.3~103.3 kPa but not under air atmosphere. Cation mixing in Li site of LiNiO2 lowered as oxygen pressure increased and was saturated around 103.3 kPa. The lowest cation mixing, 7.0% of Ni3+ in the Li site was obtained at 750°C for 24 h under 103.3 kPa of oxygen pressure.
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検出器多連装型高分解能軌道放射光粉末回折計により測定された回折データの解析法の開発（共著）
井田隆, 日比野寿
名古屋工業大学 セラミックス基盤工学研究センター年報 5 1 - 11 2006年04月
担当区分：筆頭著者 記述言語：日本語 掲載種別：研究論文（大学，研究機関等紀要）
A new analytical method to obtain a series of aberration-free diffraction intensity data from the segmented intensity data collected with a high-resolution synchrotron X-ray powder diffractometer with a multiple-detector system has been developed. The method includes (i) adjustment of variation in peak profiles measured with different detectors, (ii) deconvolution of axial-divergence aberration, and (iii) removal of asymmetry introduced by the aberration of the beamline optics. The method has been applied to analyze the diffraction intensity data of a ZnO powder sample (NIST SRM674) measured with a multiple-detector diffractometer (MDS) on the beamline 4B2 at the Photon Factory, KEK in Tsukuba. The characteristics of the beamline aberration had been separately evaluated by analyzing the diffraction intensity data of Si powder (NIST SRM640b). It has been confirmed that the observed asymmetry caused by the aberrations of the beamline-optics and the diffractometer can certainly be removed by the method.
As a result, the integrated diffraction intensity can easily be evaluated by profile fitting method based on application of a simple symmetric model profile function. -
A compact furnace for synchrotron powder diffraction experiments up to 1800 K（共著） 査読あり
Masatomo Yashima, Kenjiro Oh-uchi, Masahiko Tanaka, Takashi Ida
J. Am. Ceram. Soc. 89 ( 4 ) 1395 - 1399 2006年04月
記述言語：英語 掲載種別：研究論文（学術雑誌）
A new electric furnace has been designed and fabricated for measurements of the high-resolution synchrotron radiation powder diffraction profiles from materials at high temperatures up to 1807 K in air, suitable for the multiple-detector system installed at the BL-4B2 experimental station of the Photon Factory, Tsukuba, Japan. In the present study, at 1703 K in air, the whole powder pattern of National Institute of Standard and Technology ceria powder was step scanned at a step interval of 0.004° in 2θ, by the counting time of 1.5 s/step and with a monochromatized 1.205363(5) Å X-ray, in just 7 h. The full width at half-maximum of the 111 reflection of the ceria was narrow (0.0139°). The δd/d resolution of the ceria ranged from 0.058% to 0.126% at 1703 K, where d and δd are the lattice spacing and peak width, respectively. Precise unit-cell parameter 5.51259(1) Å and the atomic displacement parameters were refined by the Rietveld analysis of the powder data measured at 1703 K. An electron-density map of ceria at 1703 K was obtained by the maximum-entropy method.
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Symmetrization of diffraction peak profiles measured with a high-resolution synchrotron X-ray powder diffractometer（共著）
T. Ida, H. Hibino
J. Appl. Cryst. 39 ( 1 ) 90 - 100 2006年02月
担当区分：筆頭著者 記述言語：英語 掲載種別：研究論文（学術雑誌）
An analytical method to obtain symmetric peak profiles from experimental data with asymmetric peak profiles measured with a high-resolution synchrotron X-ray powder diffractometer has been developed. The method has successfully been applied to the diffraction intensity profiles of a ZnO powder sample measured with a synchrotron X-ray powder diffractometer on beamline BL4B2 at the Photon Factory.
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A non-centrosymmetric polymorph of Gd3RuO7（共著） 査読あり
N. Ishizawa, K. Hiraga, D. du Boulay, H. Hibino, T. Ida, S. Oishi
Acta Cryst. E 62 ( 1 ) i13 - i16 2006年01月
記述言語：英語 掲載種別：研究論文（学術雑誌）
A new non-centrosymmetric modification has been found for trigadolinium ruthenium heptaoxide, Gd3RuO7, crystallizing in the space group P21nb. The structure is composed of infinite single chains of corner-linked [RuO6] octahedra embedded in the [Gd3O] matrix. The octahedra in the P21nb modification have two tilt systems about the a and c axes, in contrast to the previously reported Cmcm modification [Bontchev et al. (2000). Phys. Rev. B, 62, 12235-12240], with only one tilt system about the a axis. Changes in the coordination of Gd atoms in the title compound are closely related to the tilting mechanism about the c axis.
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A compact furnace for synchrotron powder diffractioin measurements up to 1807 K（共著） 査読あり
M. Yashima, M. Tanaka, K. Oh-uchi, T. Ida
J. Appl. Cryst. 38 ( 5 ) 854 - 855 2005年10月
記述言語：英語 掲載種別：研究論文（学術雑誌）
A compact furnace has been designed and fabricated for measurements of high-resolution synchrotron radiation powder diffraction profiles from materials at high temperatures up to 1807 K in air, suitable for the multiple-detector system installed at the BL-4B2 experimental station of the Photon Factory in Tsukuba, Japan
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Connection of segmented intensity data measured with a multiple-detector system for powder diffractometry 査読あり
T. Ida
J. Appl. Cryst. 38 ( 5 ) 795 - 803 2005年10月
担当区分：筆頭著者 記述言語：英語 掲載種別：研究論文（学術雑誌）
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Correction for counting losses in X-ray diffractometry（共著） 査読あり
T. Ida, Y. Iwata
J. Appl. Cryst. 38 ( 3 ) 426 - 432 2005年06月
担当区分：筆頭著者 記述言語：英語 掲載種別：研究論文（学術雑誌）
Non-extended and extended dead-time models, a pulse-height analyser (PHA) windowing model, and a model intermediate between the non-extended and extended models for losses in counting methods are compared. The validities of the methods are examined by application to the analysis of powder diffraction peak intensity profiles measured by a foil method. The intermediate model including parameters for the dead-time and degree of extension can reproduce both the non-extended and the extended models and also intermediate dependence between the two models. A convenient approximate formula for the intermediate model, the maximum relative deviation of which is 0.0003, is also proposed. The determination of the parameters and a correction for the measured intensities can easily be achieved by applying the approximate model, because it provides simple formulae for the correction function expressed as a combination of elementary functions. Experimental and analytical methods for precise evaluation of the parameters to specify the counting losses are also presented. Systematic deviations of the observed dependence from the non-extended and extended dead-time models have been detected by the precise analyses of experimental data, while the PHA windowing model, intermediate model and its approximation have reproduced the observed dependence within the experimental errors.
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T. Fukano, T. Motohiro, T. Ida, H. Hashizume
J. Appl. Phys. 97 084316 2005年04月
記述言語：英語 掲載種別：研究論文（学術雑誌）
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粉末Ｘ線回折ピーク形状における有限な結晶粒サイズの効果
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名古屋工業大学セラミックス基盤工学研究センター年報 3 23 - 35 2004年04月
記述言語：日本語 掲載種別：研究論文（大学，研究機関等紀要）
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ラマン分光法によるBaTiO3ナノ粒子の誘電特性の評価（共著） 査読あり
大野智也,鈴木大輔,鈴木久男,井田隆
粉体工学会誌 41 ( 2 ) 86 - 91 2004年02月
記述言語：日本語 掲載種別：研究論文（学術雑誌）
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Deconvolution of synchrtron powder diffraction data
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Photon Factory Activity Report 2002 - Part B - 20 ( 2 ) 208 2003年11月
記述言語：英語 掲載種別：研究論文（その他学術会議資料等）
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Diffraction peak profiles from spherical crystallites with lognormal size distribution（共著） 査読あり
T. Ida, S. Shimazaki, H. Hibino, H. Toraya
J. Appl. Cryst. 36 ( 5 ) 1107 - 1115 2003年10月
担当区分：筆頭著者 記述言語：英語 掲載種別：研究論文（学術雑誌）
An efficient and accurate method to evaluate the theoretical diffraction peak profiles from spherical crystallites with lognormal size distribution (SLN profile) is presented. Precise results can be obtained typically by an eight-term numerical integral for any values of the parameters, by applying an appropriate substitution of the variable to the integral formula. The calculated SLN profiles have been verified by comparison with those calculated by inverse Fourier transform from the exact analytical solution of the Fourier-transformed SLN profile. It has been found that the shape of the SLN profile strongly depends on the variance of size distribution. When the logarithmic standard deviation [omega] of the size distribution is close to 0.76, the SLN profile becomes close to a Lorentzian profile, and `super-Lorentzian' profiles are predicted for larger values of [omega], as has been concluded by Popa & Balzar [J. Appl. Cryst. (2002), 35, 338-346]. The intrinsic diffraction peak profiles of an SiC powder sample obtained by deconvolution of the instrumental function have certainly shown `super-Lorentzian' line profiles, and they are well reproduced by the SLN profile for the value [omega] = 0.93.
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デコンボリューションによる粉末Ｘ線回折データからの装置収差の除去 招待あり 査読あり
井田隆
日本結晶学会誌 45 ( 4 ) 249 - 255 2003年08月
担当区分：筆頭著者 記述言語：日本語 掲載種別：研究論文（学術雑誌）
A novel method for eliminating instrumental aberrations from powder X-ray diffraction data has been developed. The method is based on fast Fourier transformation (FFT) combined with abscissa-scale transformation appropriately modeled for each instrumental aberration. All the main aberrations of laboratory powder diffractometer with Bragg-Brentano geometry, (1) Ka2 subpeak, (2) axial-divergence aberration,（3）flat-specimen aberration, and (4) sample transparency effect, can be automatically removed from the whole powder diffraction data ranging wide diffraction angles in quite a simple procedure. Propagation of the statistical errors attached to the source data through the Fourier transformation is also discussed.
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Quantitative basis for the rocking-curve measurement of preferred orientation in polycrystalline thin films（共著） 査読あり
H. Toraya, H. Hibino, T. Ida, N. Kuwano
J. Appl. Cryst. 36 ( 3 ) 890 - 897 2003年06月
記述言語：英語 掲載種別：研究論文（学術雑誌）
A quantitative basis for the rocking-curve measurement of the preferred orientation in polycrystalline thin films is presented. Gaussian functions are used for modeling the density distribution of the normals to the crystal plane around the normal to the specimen surface. An intensity formula for the rocking curve is derived from the kinematical theory applied to the case of asymmetric Bragg reflection. The density distribution is determined by the least-squares fit of a theoretical rocking curve to the observed curve, and a volume fraction of crystallites, whose normals to the crystal plane are present within a defined angular range, can be obtained from it. AlN and Au polycrystalline thin films were used for testing the present procedure. Parameter values of the model function, refined using both synchrotron radiation and laboratory X-rays, agree well with each other within the experimental errors although these intensity data sets were collected under different experimental conditions in instrumentation and wavelength. A distribution of depth-dependent preferred orientation in the AlN thin film was revealed by using double-layer and multiple-layer models. A very small degree of preferred orientation in Au thin films could also be measured. Parallel-beam optics and integrated intensities instead of peak height intensities are important for reliable rocking curve measurement.
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Deconvolution of instrumental aberrations for synchrotron powder X-ray diffractometry（共著） 査読あり
T. Ida, H. Hibino, H. Toraya
J. Appl. Cryst. 36 ( 2 ) 181 - 187 2003年04月
担当区分：筆頭著者 記述言語：英語 掲載種別：研究論文（学術雑誌）
A method to deconvolute the instrumental aberration functions from the experimental powder X-ray data measured with a high-resolution synchrotron powder diffractometer has been developed. The effects of the diffractometer aberration and asymmetry caused by the beamline optics have been eliminated from the entire observed diffraction pattern of LaB6 powder.
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Crystal structure determination of (H2pc)<sub>3</sub> PF<sub>6-x</sub>Cl<sub>x</sub> by synchrotron powder diffractometry（共著）
T. Ida, F. Sato, H. Okuno, H. Yamakado, H. Toraya
Photon Factory Activity Report 2001 - Part B - 19 ( 2 ) 157 - 157 2002年09月
担当区分：筆頭著者 記述言語：日本語 掲載種別：研究論文（その他学術会議資料等）
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粉末Ｘ線回折パターンからのKα2線と装置収差の影響の除去（共著）
井田隆,虎谷秀穂
名古屋工業大学セラミックス基盤工学研究センター年報 1 23 - 29 2002年03月
担当区分：筆頭著者 記述言語：日本語 掲載種別：研究論文（大学，研究機関等紀要）
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Deconvolution of the instrumental functions in powder X-ray diffractometry（共著） 査読あり
T. Ida, H. Toraya
J. Appl. Cryst. 35 ( 1 ) 58 - 68 2002年02月
担当区分：筆頭著者 記述言語：英語 掲載種別：研究論文（学術雑誌）
A novel method to deconvolute the instrumental aberration functions from the experimental powder X-ray data has been developed. The method is based on the combination of scale transformation, interpolation of data and fast Fourier transformation. The effects of axial divergence, flat specimen, sample transparency and spectroscopic profile of the source X-ray are eliminated from the entire observed diffraction pattern in three-step operations. The errors in the deconvoluted data propagated from the statistical uncertainty in the source data are approximated by the reciprocal of the square root of the correlation between the reciprocal of the variance in the source data and the squared instrumental function. The deconvolution of the instrumental aberration functions enables automatic correction of peak shift and line broadening, and supplies narrow and symmetric peak profiles for a well crystallized sample, which can be fitted by a simple model function. It will be useful in preparatory data processing for precise line profile analysis, accurate determination of lattice parameters and whole pattern fitting for crystal structure analysis.
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Standardless Estimation of Lattice Constants Based on Fundamental-Parameters Method（共著） 査読あり
Takashi Ida, Hideo Toraya
Materials Science Forum 378-381 86 - 91 2001年10月
記述言語：英語 掲載種別：研究論文（国際会議プロシーディングス）
