論文 - 井田 隆
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Deconvolutional treatment about sample transparency aberration interfered by opaque and translucent sample holders in Bragg-Brentano geometry 査読あり
Takashi Ida
Powder Diffraction 39 ( 4 ) 2024年12月
担当区分：筆頭著者, 責任著者 記述言語：英語 掲載種別：研究論文（学術雑誌）
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Bragg-Brentano 型粉末回折装置の試料透過性収差 に及ぼす側壁遮蔽効果の影響 査読あり
井田隆
名古屋工業大学先進セラミックスセンター年報 12 34 - 38 2024年07月
担当区分：筆頭著者, 責任著者 記述言語：日本語 掲載種別：研究論文（大学，研究機関等紀要）
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Lotgering 因子 査読あり
井田隆
名古屋工業大学 先進セラミックス研究センター 年報 11 44 - 47 2023年07月
担当区分：筆頭著者, 責任著者 記述言語：日本語 掲載種別：研究論文（大学，研究機関等紀要）
その他リンク： http://www.crl.nitech.ac.jp/ar/2022/4447_acrc_ar2022_review.pdf
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Powder X-ray diffraction intensities of corundum calculated by conventional and density functional theory methods and extracted by deconvolutional treatment on experimental data 査読あり
Takashi Ida
Powder Diffraction 38 ( 2 ) 81 - 89 2023年06月
担当区分：筆頭著者, 責任著者 記述言語：英語 掲載種別：研究論文（学術雑誌）
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Convolution and deconvolutional treatment on sample transparency aberration in Bragg-Brentano geometry 査読あり
Takashi Ida
Powder Diffraction 37 ( 1 ) 13 - 21 2022年03月
担当区分：筆頭著者 記述言語：英語 掲載種別：研究論文（学術雑誌）
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Continuous series of symmetric peak profile functions determined by standard deviation and kurtosis 査読あり 国際誌
Takashi Ida
Powder Diffraction 36 ( 4 ) 2021年12月
担当区分：筆頭著者 記述言語：英語 掲載種別：研究論文（学術雑誌） 出版者・発行元：International Centre for Diffraction Data
A mathematical system for modeling the effects of symmetrized instrumental aberrations has been developed. The system is composed of the truncated Gaussian, sheared Gaussian and Rosin-Rammler type functions. The shape of the function can uniquely be determined by the standard deviation and kurtosis. A practical method to evaluate the convolution with the Lorentzian function and results of application to analysis of experimental powder diffraction data are briefly described.
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Equatorial aberration for powder diffraction data collected by continuous scan of a silicon strip X-ray detector 招待あり 査読あり 国際誌
Takashi Ida
Powder Diffraction 64 ( 3 ) 169 - 175 2021年09月
担当区分：筆頭著者 記述言語：英語 掲載種別：研究論文（学術雑誌） 出版者・発行元：International Centre for Diffraction Data
Application of continuous-scan integration to collect X-ray diffraction data with a Si strip X-ray detector (CSI-SSXD) introduces additional effects on the peak-shift and deformation of peak shape caused by the equatorial aberration. A deconvolutional method to correct the effects of equatorial aberration in CSI-SSXD data is proposed in this study. There are four critical angles related to the effects of spill-over of the incident X-ray beam from the specimen face in the CSI-SSXD data. Exact values of cumulants of the equatorial aberration function are efficiently evaluated by 4×4 point two-dimensional Gauss-Legendre integral. A naïve two-step deconvolutional method has been applied to remove the effects of the first and third-order cumulants of the equatorial aberration function from the observed CSI-SSXD data. The performance of the algorithm has been tested by analyses of CSI-SSXD data of three LaB6 powder specimens with the widths of 20, 10 and 5 mm, collected with a diffractometer with the goniometer radius of 150 mm.
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Application of deconvolutional treatment to powder diffraction data collected with a Bragg-Brentano diffractometer with a contaminated Cu target with a Ni filter 査読あり
Takashi Ida
Powder Diffraction 35 ( 03 ) 166 - 177 2020年09月
担当区分：筆頭著者 記述言語：英語 掲載種別：研究論文（学術雑誌） 出版者・発行元：International Centre for Diffraction Data
A deconvolutional method for preprocessing powder diffraction data has been improved. The cumulants of instrumental aberration functions of Bragg-Brentano (Parrish) diffractometer calculated up to the fourth order are presented. The treatments of axial-divergence aberration and the effective spectroscopic profilee of the source X-ray have been simplified from those used in the previous methods. The current method has been applied to powder diffraction data collected with a Cu-target X-ray tube, used over 20 years, and a N-foil K_beta filter.
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Equatorial aberration of powder diffraction data collected with an Si strip X-ray detector by a continuous-scan integration method 査読あり 国際誌
T. Ida
Journal of Applied Crystallography 53 679 - 685 2020年05月
担当区分：筆頭著者 記述言語：英語 掲載種別：研究論文（学術雑誌） 出版者・発行元：International Union of Crystallography
Exact and approximate mathematical formulas of equatorial aberration for powder diffraction data collected with an Si strip X-ray detector in continuous-scan integration mode are presented. An approximate formula is applied to treat the experimental data measured with a commercial powder diffractometer.
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Takashi Ida, Shoki Ono, Daiki Hattan, Takehiro Yoshida, Yoshinobu Takatsu, Katsuhiro Nomura
Powder Diffraction 33 ( 2 ) 80 - 87 2018年06月
担当区分：筆頭著者 記述言語：英語 掲載種別：研究論文（学術雑誌） 出版者・発行元：International Centre for Diffraction Data
A method to remove small CuKβ peaks and step structures caused by NiK-edge absorption as well as CuKα2 sub-peaks from powder diffraction intensity data measured with Cu-target X-ray source and Ni-foil filter is proposed. The method is based on deconvolution–convolution treatment applying scale transform of abscissa, Fourier transform, and a realistic spectroscopic model for the source X-ray. The validity of the method has been tested by analysis of the powder diffraction data of a standard LaB6 powder (NIST SRM660a) sample, collected with the combination of CuKα X-ray source, Ni-foil Kβ filter, flat powder specimen and one-dimensional Si strip detector. The diffraction intensity data treated with the method have certainly shown background intensity profile without CuKβ peaks and NiK-edge step structures.
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Takashi Ida, Shoki Ono, Daiki Hattan, Takehiro Yoshida, Yoshinobu Takatsu, Katsuhiro Nomura
Powder Diffraction 33 ( 2 ) 121 - 133 2018年06月
担当区分：筆頭著者 記述言語：英語 掲載種別：研究論文（学術雑誌） 出版者・発行元：International Centre for Diffraction Data
An improved method to correct observed shift and asymmetric deformation of diffraction peak profile caused by the axial-divergence aberration in Bragg–Brentano geometry is proposed. The method is based on deconvolution–convolution treatment applying scale transform of abscissa, Fourier transform, and cumulant analysis of an analytical model for the axial-divergence aberration. The method has been applied to the powder diffraction data of a standard LaB6 powder (NIST SRM660a) sample, collected with a one-dimensional Si strip detector. The locations, widths and shape of the peaks in the deconvolved–convolved powder diffraction data have been analyzed. The finally obtained whole powder diffraction pattern ranging from 10° to 145° in diffraction angle has been simulated by the Pawley method applying a symmetric Pearson VII peak profile model to each peak with ten background, two peak-shift, three line-width, and two peak-shape parameters, and the Rp value of the best fit has been estimated at 4.4%.
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Removal of small parasite peaks in powder diffraction data by a multiple deconvolution method 査読あり 国際誌
Takashi Ida, Shoki Ono, Daiki Hattan, Takehiro Yoshida, Yoshinobu Takatsu, Katsuhiro Nomura
Powder Diffraction 33 ( 2 ) 108 - 114 2018年06月
担当区分：筆頭著者 記述言語：英語 掲載種別：研究論文（学術雑誌） 出版者・発行元：International Centre for Diffraction Data
Four series of small parasite peaks observed in powder diffraction data recorded with a Cu-target X-ray tube and a Ni filter on the diffracted beam side in Bragg–Brentano geometry are investigated. One series of the parasite peaks is assigned to the tungsten Lα-emission. Other three types of the parasite peak series are likely to be caused by the K-emissions of Ni, but the peak locations are deviated from those predicted by the Bragg's law. An empirical formula to locate the parasite peaks and a method to remove them from observed powder diffraction data are proposed. The method is based on the whole-pattern deconvolution–convolution treatment on the transformed scale of abscissa. The parameters optimized for the diffraction data measured for Si powder has been applied on treatment of the data of LaB6 powder recorded under the same experimental conditions. It has been confirmed that the parasite peaks in the observed data can effectively be removed by the deconvolution treatment with parameters determined by a reference measurement.
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Phase transition behavior of (K,Na) Nb O3 - based high-performance lead-free piezoelectric ceramic composite with different phase compositions depending on Na fraction 査読あり
Hideto Yamada, Takayuki Matsuoka, Masato Yamazaki, Kazushige Ohbayashi, Takashi Ida
Japanese Journal of Applied Physics 57 ( 1 ) 011502 2018年01月
記述言語：英語 掲載種別：研究論文（学術雑誌） 出版者・発行元：The Japan Society of Applied Physics
The structures of the main (K1− x Nax)NbO3 perovskite in a high-performance lead-free piezoelectric ceramic composite (K1− x Nax)0.86 Ca0.04 Li0.02 Nb0.85 O3−δ–K0.85 Ti0.85 Nb1.15 O5 – Ba Zr O3 – MgO – Fe2 O3 (x = 0.52 and 0.70) with trace amounts of Li Mg Fe Ti O4 inverse spinel and (Li,K)2 (Mg,Fe,Ti,Nb)6 O13 layered structure have been investigated by transmission electron microscopy (TEM) and synchrotron powder X-ray diffractometry (XRD) with varying temperatures. The bright-field TEM images have shown tetragonal 90°-domain contrasts at 80 and 40 °C, and the XRD profile has been simulated by adding an average structure of two differently oriented tetragonal structures bound by a 90°-domain wall for the x = 0.52 sample. Aggregates of tilted NbO6 nanodomains have been observed in a high-resolution TEM image, and the crossover of P4mm–Amm2 features from 60 to 20 °C and diffuse 2 × 2 × 2 superlattice reflections of the tilted NbO6 Imm2 structure have been observed in XRD data for the x = 0.70 sample.
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Analysis of powder diffraction data collected with synchrotron x-ray and multiple 2D x-ray detectors applying a beta-distribution peak profile model 査読あり 国際誌
T. Ida, K. Wachi, D. Hattan, S. Ono, S. Tachiki, Y. Nakanishi, Y. Sakuma, A. Wada, S. Towata
Powder Diffraction 32 ( 3 ) S172 2017年09月
担当区分：筆頭著者 記述言語：英語 掲載種別：研究論文（国際会議プロシーディングス） 出版者・発行元：International Centre for Diffraction Data
A powder diffraction measurement system constructed on a beam-line BL5S2 at Aichi Synchrotron Radiation Center in Seto, Japan, has been modified for extensive use of two-dimensional (2D) X-ray detectors. Four flat 2D detectors are currently mounted on the movable stages on supporting rods radially attached to the 2Θ-wheel of the goniometer with the interval of 25°. The 2D powder diffraction intensity data are reduced to conventional 1D format of powder diffraction data by the method based on averaging of the pixel intensities with geometrical corrections, which also enables evaluation of standard uncertainties about the reduced intensity data. The 1D powder diffraction data of a 0.1 mm-capillary LaB6 (NIST SRM660b) sample obtained at the camera length of 340 mm have shown almost symmetric peak profile with slight asymmetry simulated by a beta-distribution profile function.
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Crystal structure and phase transition behavior in (K1-x)NbO3-based lead-free piezoelectric ceramic over a wide range of temperatures 査読あり 国際誌
H. Yamada, T. Matsuoka, H. Kozuka, M. Yamazaki, K. Ohbayashi, T. Ida
Journal of Applied Physics 120 214102 2016年12月
記述言語：英語 掲載種別：研究論文（学術雑誌） 出版者・発行元：American Institute of Physics
The phase transition temperature in a (K, Na)NbO3 (KNN) phase of a KNN-based composite lead-free piezoelectric ceramic with a KTiNbO5 system ((K1−xNax)0.86Ca0.04Li0.02Nb0.85O3−δ–K0.85Ti0.85Nb1.15O5–BaZrO3–Co3O4–Fe2O3–ZnO) is lower than that in an undoped KNN ceramic by approximately 200 °C. We have studied the structural changes around the phase transition by using synchrotron powder X-ray diffraction and transmission electron microscopy. The crystal system of the main KNN phase is assigned to tetragonal as a stable structure at room temperature and does not change to orthorhombic on lowering the temperature all at once. The crystal structure changes from tetragonal to orthorhombic through the successive transition state. The curve of the phase transition temperature from x = 0.33 to 0.75 has a V shape and reaches its lowest value of approximately 0 °C in the vicinity of x = 0.56. From selected-area electron diffraction patterns of the KNN phase, weak superlattice spots owing to the tilt-ordered NbO6 octahedra are observed for x ≥ 0.56. This tilt-ordered NbO6 octahedral phase is formed at the nanometer-scale (nanodomains) in the tetragonal and orthorhombic KNN matrices, regardless of the phase transition. The minimum x to generate the nanodomains is substantially equal to the Na fraction at which the starting temperature of the successive phase transition shifts to the lowest.
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ギ酸で安定化させたアルミナ前駆体水溶液の乾燥方法がα-Al2O3への相転移と粒子形態に及ぼす影響 査読あり
吉田道之,加藤雄太,櫻田修,尾畑成造,井田隆,田中誠,北岡諭
粉体工学会誌 53 ( 9 ) 571 - 576 2016年09月
記述言語：日本語 掲載種別：研究論文（学術雑誌） 出版者・発行元：粉体工学会
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Experimental estimation of uncertainties in powder diffraction intensities with a two-dimensional X-ray detector 査読あり 国際誌
Takashi Ida
Powder Diffraction 31 ( 3 ) 216 - 222 2016年09月
担当区分：筆頭著者 記述言語：英語 掲載種別：研究論文（学術雑誌） 出版者・発行元：International Centre for Diffraction Data
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Improvement of the Piezoelectric Properties in (K, Na)NbO3-Based Lead-Free Piezoelectric Ceramic With Two-Phase Co-Existing State （共著） 査読あり
H. Yamada, T. Matsuoka, H. Kozuka, M. Yamazaki, K. Ohbayashi, T. Ida
Journal of Applied Physics 117 ( 21 ) 214102 2015年06月
記述言語：英語 掲載種別：研究論文（学術雑誌）
添加物を加えた (K, Na)NbO3 系圧電体の結晶構造と微細組織が Na の分率によってどのように変化するかをシンクロトロン粉末回折と制限視野電子回折，高分解能透過電子顕微鏡観察によって調べた。低 Na 分率では室温で強誘電性を持つ正方晶が安定であったが，高 Na 分率では配位八面体のティルトを伴う斜方晶相が共存し始め，中間的な Na 分率領域で比較的大きな誘電率と電気機械結合定数を示すことがわかった。
DOI： 10.1063/1.4921860
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Effect of Preferrred Orientation in Synchrotron X-ray Powder Diffraction 査読あり
Takashi Ida
名古屋工業大学先進セラミックス研究センター年報 2 7 - 11 2014年06月
担当区分：筆頭著者 記述言語：英語 掲載種別：研究論文（大学，研究機関等紀要）
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Analytical method for observed powder diffraction intensity data based on maximum likelihood estimation 招待あり 査読あり
T. Ida, F. Izumi
Powder Diffraction Journal 28 ( 2 ) 124 - 126 2013年06月
記述言語：英語 掲載種別：研究論文（学術雑誌）
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