Papers - ICHIMURA Masaya

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  • Unveiling the dynamics of phase-transition from ferroelectric to relaxor behavior in Nd-doped BNT-based lead-free piezoelectric ceramics Reviewed

    J. Eom, G. Lee, M. Saleem, M. Ichimura, M. Zubair Khan, M. Bilal Hanif, R. Ahmed Malikg, and J. H. Koh

    J. Mater. Chem. C   12   19463 - 19475   2024.12

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    DOI: 10.1039/d4tc03664f

  • Concentrations Influence of Complexing Agents on the Physicochemical Properties of Chemical Bath Deposited n-type FeSxOy for Homostructure Solar Cell Reviewed International coauthorship

    A. A. Ariff, A. Supee, M. Ichimura, M. Z. Mohd Yusop, A. Abdul Jalil

    Physica Status Solidi (a)   221   2400376   2024.10

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    DOI: https://doi.org/10.1002/pssa.202400376

  • Drop-dry deposition of SnO2 using Na2SnO3 and fabrication of SnO2/NiO transparent solar cells Reviewed

    M. Ichimura, T. Okada, A. Fukuda, T. Li

    J. Electron. Mater.   53   5265 - 5272   2024.09

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    DOI: https://doi.org/10.1007/s11664-024-11254-y

  • Low-temperature deposition of β-Ga2O3 thin films employing in situ pulsed laser-assisted RF sputtering system Reviewed International coauthorship

    Y.Y. Huh, C.H. Jo, M. Ichimura, J.H. Koh

    Mat. Sci. Semicond. Proc.   179   108428   2024.08

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    DOI: https://doi.org/10.1016/j.mssp.2024.108428

  • Enhanced soft piezoelectric properties of Sb2O3 doped 0.5Ba(Zr0.2Ti0.8)O3-0.5(Ba0.7Ca0.3)TiO3 materials Reviewed International coauthorship

    T.W. Kim, G. Lee, M. Ichimura, J.H. Koh

    J. Alloy Comp.   987   174163   2024.06

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    DOI: https://doi.org/10.1016/j.jallcom.2024.174163

  • Dip-dry deposition of semiconducting aluminum oxide-hydroxide thin films Reviewed

    M. Ichimura, C. Baixian, T. Li

    Jpn. J. Appl. Phys.   63   018001   2024.01

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    DOI: https://doi.org/10.35848/1347-4065/ad1423

  • Theoretical study of doping in GaOOH for electronics applications Reviewed

    Electron. Mater.   4 ( 4 )   148 - 157   2023.11

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    Authorship:Lead author, Corresponding author   Language:English   Publishing type:Research paper (scientific journal)  

    Other Link: https://www.mdpi.com/2673-3978/4/4/13

  • Drop-Dry Deposition of SnO2 Using a Complexing Agent and Fabrication of Heterojunctions with Co3O4 Reviewed

    T. Li, M. Ichimura

    Materials   16   5273   2023.08

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    Other Link: https://www.mdpi.com/1996-1944/16/15/5273

  • Low temperature processed CO2 laser-assisted RF-sputtered GaN thin film for wide bandgap semiconductors Reviewed International coauthorship

    S.-H. Kim, C.-H. Jo, M.-S. Bae, M. Ichimura and J.-H. Koh

    J. Asian Ceramic Soc.   10 ( 1 )   68 - 79   2023.01

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  • Fabrication of Transparent ZnO/Cu-Mg(OH)2 Heterojunction Diodes by Electrochemical Deposition Reviewed

    M. Ichimura, M. Tanaka, T. Li

    Solid St. Electron.   198   108479   2022.12

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  • Drop-dry deposition of Ni(OH)2 precursors for fabrication of NiO thin films Reviewed

    T. Li, T. Okada, M. Ichimura

    Materials   15   4513   2022.07

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    Authorship:Corresponding author   Language:English   Publishing type:Research paper (scientific journal)  

  • Hole capture cross section of the Al acceptor level in 4H-SiC Reviewed

    M. Kato, J. Di, Y. Ohkouchi, T. Mizuno, M. Ichimura, K. Kojima

    Mater. Today Commun.   31   103648   2022.04

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  • Fabrication of a Co3O4/ZnO Heterostructure by Electrochemical Deposition Reviewed International journal

    M. Ichimura, Y. Tomita

    Int. J. Electrochem. Sci.   16 ( 12 )   211223   2021.12

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  • Drop-dry Deposition of Co3O4 and Fabrication of Heterojunction Solar Cells with Electrochemically Deposited ZnO Reviewed International journal

    T. Li, M. Ichimura

    Semicond. Sci. Technol.   36   095030   2021.09

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  • Galvanostatic electrochemical deposition of Cu-doped Mg(OH)2 thin films and fabrication of p-n homojunction Reviewed International coauthorship International journal

    J. Kang, M. Keikhaei, T. Li, M. Ichimura

    Mater. Res. Bull.   137   111207   2021.05

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  • Fabrication of transparent Mg(OH)2 thin films by drop-dry deposition Reviewed International journal

    T. Li, M. Ichimura

    Materials   14   724   2021.04

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  • Pulse electrochemical deposition of Cu-doped p-type Fe-O thin films and fabrication of n-Fe-O/p-Fe-O solar cells Reviewed

    R. Takayanagi, M. Ichimura

    Jpn. J. Appl. Phys.   59 ( 11 )   111002   2020.11

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  • Fabrication of Transparent ZnO/(CuZn)O Heterojunction Solar Cells by Electrochemical Deposition Reviewed International journal

    M. Keikhaei, M. Tanaka, M. Ichimura

    Mater. Res. Exp.   7   106411   2020.11

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  • Impurity Doping in Mg(OH)2 for n-Type and p-Type Conductivity Control Reviewed International journal

    M. Ichimura

    Materials   13   2972   2020.07

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  • Surface recombination velocities for 4H-SiC: Temperature dependence and difference in conductivity type at several crystal faces Reviewed International journal

    M. Kato, Z. Xinchi, K. Kohama, S. Fukaya, M. Ichimura

    J. Appl. Phys.   127   195702   2020.05

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    DOI: 10.1063/5.0007900

  • n-type and p-type semiconducting Cu-doped Mg (OH)2 thin films Reviewed International journal

    M. Keikhaei, M. Ichimura

    Semicond. Sci. Technol.   35 ( 3 )   035020   2020.03

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  • Fabrication of p-type Transparent (CuZn)O Thin Films by the Electrochemical Deposition Method Reviewed International journal

    M. Keikhaei and M. Ichimura

    Int. J. Electrochem. Sci.   2020.01

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  • Fabrication of ZnO/NiO transparent solar cells by electrochemical deposition Reviewed

    M. Koyama, M. Ichimura

    Jpn. J. Appl. Phys.   58   128003   2019.12

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  • Fabrication of Mg(OH)2 Thin Films by Electrochemical Deposition with Cu Catalyst Reviewed

    M. Keikhaei, M. Ichimura

    Thin Solid Films   681   41 - 46   2019.07

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  • Fabrication of photovoltaic FeSxOy/ZnO heterostructures by electrochemical deposition

    W. Ji, M. Ichimura

    Jpn. J. Appl. Phys.   58   050922   2019.05

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  • Semiconducting Cu-doped AlOx films fabricated by drop-photochemical deposition Reviewed International journal

    M. Umemura, M. Ichimura

    Mater. Res. Express   6   035904   2019.03

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    Language:English   Publishing type:Research paper (scientific journal)  

    DOI: 10.1088/2053-1591/aaf47b

  • On the Possibility of Valence Control of Aluminum Oxide for Electronics Applications Reviewed International journal

    M. Ichimura

    J. Electron. Mater.   6 ( 1 )   583 - 588   2019.01

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    DOI: 10.1007/s11664-018-6749-9

  • Fabrication of Pyrite FeS2 Films from Electrochemically Deposited FeOOH by Sulfur Annealing Reviewed International journal

    S. Maki, N. Takeda, M. Ichimura

    Int. J. Electrochem. Sci.   13   10829 - 10836   2018.10

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  • Fabrication of Copper Oxide Thin Films by Galvanostatic Deposition from Weakly Acidic Solutions Reviewed International journal

    M. Keikhaei, M. Ichimura

    Int. J. Electrochem. Sci.   13   9931 - 9941   2018.09

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  • Electrochemical deposition of Cu-doped p-type iron oxide thin films Reviewed International journal

    S. Kobayashi, M. Ichimura

    Semicond. Sci. Technol.   33 ( 9 )   105006   2018.09

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    DOI: 10.1088/1361-6641/aad76a

  • Passivation of surface recombination at the Si-face of 4H-SiC by acidic solutions Reviewed International journal

    Y. Ichikawa, M. Ichimura, T. Kimoto, M. Kato

    ECS J. Solid St. Sci. Technol.   7 ( 8 )   Q127 - Q130   2018.08

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  • Fast electrochemical deposition of Ni(OH)2 precursor involving water electrolysis for fabrication of NiO thin films Reviewed International journal

    M. Koyama, M. Ichimura

    Semicond. Sci. Technol.   33 ( 5 )   055011   2018.05

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    DOI: 10.1088/1361-6641/aab98f

  • Effects of Complexing Agents on Electrochemical Deposition of FeSxOy in ZnO/FeSxOy Heterostructures Reviewed International journal

    A. Supee, M. Ichimura

    Applied Physics A   123   722   2017.11

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    DOI: 10.1007/s00339-017-1340-4

  • Improved performance of 3C-SiC photocathodes by using a pn junction Reviewed International journal

    N. Ichikawa, M. Ichimura, M. Kato

    Int. J. Hydrogen Energy   42   22698 - 22703   2017.10

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  • Electrochemical deposition of transparent p-type semiconductor NiO Reviewed

    137   542 - 546   2017.09

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    Language:Japanese   Publishing type:Research paper (scientific journal)  

  • Drop-photochemical deposition of aluminum oxide thin films from aqueous solutions Reviewed International journal

    S. Sato and M. Ichimura

    Materials Research Express   4   046405   2017.04

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    DOI: 10.1088/2053-1591/aa6c0f

  • Three-step pulse electrochemical deposition of FeSxOy thin films and their characterization Reviewed International journal

    A. Supee and M. Ichimura

    Materials Research Express   4   036410   2017.03

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  • The enhanced performance of 3C-SiC photocathodes for the generation of hydrogen Reviewed International journal

    N. Ichikawa, M. Kato, M. Ichimura

    Appl. Phys. Lett.   109   153904   2016.10

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  • Effects of annealing on properties of electrochemically deposited CuxZnyS thin films Reviewed

    Bayingaerdi Tong and M. Ichimura

    Trans. Mater. Res. Soc. Jpn.   41   255   2016.09

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  • Annealing of p-type wide-gap CuxZnyS thin films deposited by the photochemical deposition method Reviewed

    Bayingaerdi Tong and M. Ichimura

    Jpn. J. Appl. Phys.   55   098004   2016.09

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    DOI: 10.7567/JJAP.55.098004

  • Effects of complexing agents on electrochemical deposition of FeSxOy thin films Reviewed

    A. Supee and M. Ichimura

    Jpn. J. Appl. Phys.   55   081202   2016.08

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    DOI: 10.7567/JJAP.55.081202

  • Enhancement of Photoelectrochemical Activity of SnS Photoelectrodes using TiO2, Nb2O5, and Ta2O5 Metal Oxide Layers Reviewed

    J. J. M. Vequizo, M. Yokoyama, M. Ichimura, and A. Yamakata

    Appl. Phys. Exp.   9   067101   2016.06

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    DOI: 10.7567/APEX.9.067101

  • Effects of Tartaric Acid on Electrochemical Deposition of SnS in ZnO/SnS Heterostructures Reviewed

    A. Supee and M. Ichimura

    Trans. Mater. Res. Soc. Jpn.   41   193   2016.06

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  • Mössbauer study of electrochemically deposited amorphous iron-sulfide-oxide thin films Reviewed

    M. Ichimura, T. Kajima, S. Kawai, K. Mibu

    Jpn. J. Appl. Phys.   55   038006   2016.03

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  • Comparison of amorphous Fe-S-O and crystalline FeS2 pyrite for photovoltaic application Reviewed International journal

    S. Kawai, T. Kajima, M. Ichimura

    Materials Research Express   3   025901   2016.02

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    DOI: 10.1088/2053-1591/3/2/025901

  • Spectral response, carrier lifetime, and photocurrents of SiC photocathodes Reviewed

    M. Kato, K. Miyake, T. Yasuda, M. Ichimura, T. Hatayama, T. Ohshima

    Jpn. J. Appl. Phys.   55   01AC02   2016.01

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    DOI: 10.7567/JJAP.55.01AC02

  • Fabrication of Cu2O/Fe–O heterojunction solar cells by electrodeposition Reviewed International journal

    J. J. M. Vequizo, C. Zhang, M. Ichimura

    Thin Solid Films   597   83   2015.12

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    DOI: 10.1016/j.tsf.2015.11.034

  • Carrier lifetime measurements on various crystal faces of rutile TiO2 single crystals Reviewed International journal

    M. Kato, K. Kohama, Y. Ichikawa, M. Ichimura

    Mater. Lett.   160   397   2015.12

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    DOI: 10.1016/j.matlet.2015.08.018

  • Conduction type of nonstoichiometric alloy semiconductor CuxZnyS deposited by the photochemical deposition method Reviewed International journal

    M. Ichimura, Y. Maeda

    Thin Solid Films   594   277   2015.11

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    DOI: 10.1016/j.tsf.2015.04.071

  • Effects of Complexing Agents on Three Steps Pulse Electrodeposited SnS Thin Films Reviewed International journal

    A. Supee, Y. Tanaka, M. Ichimura

    Mater. Sci. Semicond. Processing   38   290   2015.10

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    DOI: 10.1016/j.mssp.2015.04.028

  • Photocathode for hydrogen generation using 3C-SiC epilayer grown on vicinal off-angle 4H-SiC substrate Reviewed

    N. Ichikawa, M. Kato, M. Ichimura

    Appl. Phys. Exp.   8   091301   2015.08

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    DOI: 10.7567/APEX.8.091301

  • Fabrication of transparent CuxZnyS/ZnS heterojunction diodes by photochemical deposition Reviewed International journal

    M. Ichimura, Y. Maeda

    Physica Status Solidi (c)   12   504   2015.06

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    DOI: 10.1002/pssc.201400229

  • Heterojunctions Based on Photochemically Deposited CuxZnyS and Electrochemically Deposited ZnO Reviewed

    M. Ichimura, Y. Maeda

    Solid St. Electron.   107   8   2015.05

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    DOI: 10.1016/j.sse.2015.02.016

  • Microwave reflectivity from 4H-SiC under a high-injection condition: impacts of electron–hole scattering Reviewed

    M. Kato, Y. Mori, M. Ichimura

    Jpn. J. Appl. Phys.   54   04DP14   2015.04

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  • Band alignment at the CdS/FeS2 interface based on the first-principles calculation Reviewed

    M. Ichimura and S. Kawai

    Jpn. J. Appl. Phys.   54 ( 3 )   038002   2015.03

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  • Physical properties of rf magnetron sputter deposited NiO:WO3 thin films Reviewed International coauthorship International journal

    K. S. Usha, R Sivakumar, C. Sanjeeviraja, M. Ichimura

    Mater. Res. Express   2   016401   2015.01

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  • Influence of Secondary Phases in Kesterite-Cu2ZnSnS4 Absorber Material Based on the First-Principles Calculation Reviewed

    W. Bao, M. Ichimura

    Int. J. Photoenergy   2015   592079   2015.01

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  • Electrochemical Deposition of Fe-S-O Thin Films Reviewed

    K. Yang, S. Kawai, M. Ichimura

    Thin Solid Films   573   1 - 5   2014.12

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    DOI: 10.1016/j.tsf.2014.10.072

  • Surface recombination velocities for n-type 4H-SiC treated by various processes Reviewed

    Y. Mori, M. Kato, M. Ichimura

    J. Phys. D: Appl. Phys.   47   335102   2014.07

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    DOI: 10.1088/0022-3727/47/33/335102

  • Electrochemical deposition of aluminum oxide thin films from aqueous baths Reviewed

    A.M. Abdel Haleem, M. Ichimura

    Materials Letters   130   26 - 28   2014.06

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    DOI: 10.1016/j.matlet.2014.05.061

  • Observation of deep levels and their hole capture behavior in p-type 4H-SiC epilayers with and without electron irradiation Reviewed

    M. Kato, K. Yoshihara, M. Ichimura, T. Hatayama, T. Ohshima

    Jpn. J. Appl. Phys.   53   04EP09   2014.04

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  • Fabrication of Cu2O/γ-FeOOH heterojunction solar cells by electrodeposition Reviewed

    J. J. M. Vequizo, M. Ichimura

    Appl. Phys. Express   7   045501   2014.04

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    DOI: 10.7567/APEX.7.045501

  • Epitaxial p-type SiC as a self-driven photocathode for water splitting Reviewed

    M. Kato, T. Yasuda, K. Miyake, M. Ichimura, and T. Hatayama

    Int. J. Hydrogen Energy   39   4845 - 4849   2014.03

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  • Electrochemical deposition of iron sulfide thin films and heterojunction diodes with zinc oxide Reviewed

    S. Kawai, R. Yamazaki, S. Sobue, E. Okuno, and M. Ichimura

    APL Matter   2 ( 3 )   032108   2014.03

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  • Electrodeposition and Characterization of g-FeOOH Thin Films from Oxygen-Bubbled Aqueous Iron Sulfate Solutions Reviewed

    J. J. M. Vequizo and M. Ichimura

    Appl. Phys. Express   6   125501   2013.12

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  • Efficiency of a solar cell with intermediate energy levels: An example study on hydrogen implanted Si solar cells Reviewed

    M. Ichimura, H. Sakakibara, K. Wada, and M. Kato

    J. Appl. Phys.   114 ( 11 )   114505   2013.09

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  • Excess carrier lifetime and strain distributions in a 3C-SiC wafer grown on an undulant Si substrate Reviewed

    M. Kato, A. Yoshida, M. Ichimura, H. Nagasawa

    Physica Status Solidi A   210   1719 - 1725   2013.08

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  • Fabrication of TiO2/Cu2O heterojunction solar cells by electrophoretic deposition and electrodeposition Reviewed

    M. Ichimura and Y. Kato

    Mater. Sci. Semicond. Processing   16   1538 - 1541   2013.07

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  • Electrodeposition of Ga-O Thin Films from Aqueous Gallium Sulfate Solutions Reviewed

    J. J. M. Vequizo and M. Ichimura

    Jpn. J. Appl. Phys.   52 ( 7 )   075503   2013.07

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  • Heterostructure Solar Cells Based on Sol-Gel Deposited SnO2 and Electrochemically Deposited Cu2O Reviewed

    A. Fukuda and M. Ichimura

    Mater. Sci. Appl.   4 ( 6A )   1 - 4   2013.06

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  • Band Offsets at the ZnO/Cu2ZnSnS4 Interface Based on the First Principles Calculation Reviewed

    Wujisiguleng Bao and M. Ichimura

    Jpn. J. Appl. Phys.   52 ( 6 )   061203   2013.06

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  • Leakage Current Suppression by Passivation of Defects by Anodic Oxidation of 4H-SiC Schottky Contacts Reviewed

    M. Kato, M. Kimura, and M. Ichimura

    Jpn. J. Appl. Phys.   52 ( 4 )   04CP02   2013.04

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  • H2O2 treatment of electrochemically deposited Cu2O thin films for enhancing optical absorption Reviewed

    Y. Song and M. Ichimura

    Int. J. Photoenergy   2013   738063   2013.02

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  • Structural, Optical, and Electrical Characterization of Spray Pyrolysed Indium Sulfide Thin Films Reviewed

    F. Rahman, J. Podder, and M. Ichimura

    Surface Review and Letters   20 ( 2 )   1350014   2013.02

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  • 光化学堆積SnO2薄膜を用いた携帯式水素検出器の試作 Reviewed

    オドンボリル、森口、市村

    電気学会論文誌A   133 ( 1 )   28 - 29   2013.01

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  • First Principles Study on Influences of Crystal Structure and Orientation on Band Offsets at the CdS/Cu2ZnSnS4 Interface Reviewed

    Wujisiguleng Bao, M. Ichimura

    Int. J. Photoenergy   2012   619812   2012.12

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  • Improvement of Electrochemically Deposited Cu2O/ZnO Heterojunction Solar Cells by Modulation of Deposition Current Reviewed

    Y. Song and M. Ichimura

    Jpn. J. Appl. Phys.   51   10NC39   2012.10

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  • Fabrication of Electrodeposited SnS/SnO2 Heterojunction Solar Cells Reviewed

    J. J. M. Vequizo and M. Ichimura

    Jpn. J. Appl. Phys.   51   10NC38   2012.10

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  • Prediction of the Band Offsets at the CdS/Cu2ZnSnS4 Interface Based on the First-Principles Calculation Reviewed

    Wujisiguleng Bao and M. Ichimura

    Jpn. J. Appl. Phys.   51   10NC31   2012.10

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  • Photochemical deposition of p-type transparent alloy semiconductor CuxZnyS Reviewed

    Mandula, K. Yang, and M. Ichimura

    Semicond. Sci. Technol.   27   125007   2012.10

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  • Deposition of Fe doped nanocrystalline SnO2 thin films by the photochemical deposition method Reviewed

    Dengbaoleer Ao and M. Ichimura

    Trans. Mater. Res. Soc. Jpn.   37   377 - 380   2012.09

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  • Deposition and characterization of Sb and Cu doped nanocrystalline SnO2 thin films fabricated by the photochemical method Reviewed

    Dengbaoleer Ao and M. Ichimura

    J. Non-Crystalline Solids   358   2470 - 2473   2012.09

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  • Fabrication of Cu–Zn–Sn–S–O Thin Films by the Electrochemical Deposition Method and Application to Heterojunction Cells Reviewed

    K. Yang and M. Ichimura

    Int. J. Photoenergy   2012   154704   2012.08

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  • SiC photoelectrodes for a self-driven water-splitting cell Reviewed

    T. Yasuda, M. Kato, M. Ichimura, and T. Hatayama

    Appl. Phys. Lett.   101   053902   2012.08

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  • Fabrication of Copper Oxide Thin Films by the Drop Chemical Deposition Technique Reviewed

    M. Muhibbullah and M. Ichimura

    Mater. Res. Bull.   47   1968 - 1972   2012.08

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  • Electrochemical deposition of CuxSnySzO thin films and their application for heterojunction solar cells Reviewed

    Y. Nakashima and M. Ichimura

    Int. J. Photoenergy   2012   171432   2012.05

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  • UV irradiation effects on hydrogen sensors based on SnO2 thin films fabricated by the photochemical deposition Reviewed

    Dengbaoleer Ao and M. Ichimura

    Solid St. Electron.   69   1 - 3   2012.03

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  • Electrochemical Deposition of CuxS and CuxZnyS Thin Films with p-Type Conduction and Photosensitivity Reviewed

    K. Yang, Y. Nakashima, and M. Ichimura

    J. Electrochem. Soc.   159 ( 3 )   H250 - H254   2012.03

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  • Electrochemical deposition of Estimation of Surface Recombination Velocity from Thickness Dependence of Carrier Lifetime in n-Type 4H-SiC Epilayers Reviewed

    M. Kato, A. Yoshida, and M. Ichimura

    Jpn. J. Appl. Phys.   51 ( 2 )   02BP12   2012.02

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  • Structural, electrical and optical characterization of CuInS2 thin films deposited by spray pyrolysis Reviewed

    K. M. A. Hussain, J. Podder, D. K. Saha, and M. Ichimura

    Indian J. Pure Appl. Phys.   50   117 - 122   2012.02

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  • Excess Carrier Lifetime in p-Type 4H-SiC Epilayers with and without Low-Energy Electron Irradiation Reviewed

    M. Kato, Y. Matsushita, M. Ichimura, T. Hatayama, and T. Ohshima

    Jpn. J. Appl. Phys.   51 ( 2 )   028006   2012.02

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  • New approach for generating Cu2O/TiO2 composite films for solar cell applications Reviewed

    A. R. Zainun, T. Sakamoto, U. M. Noor, M. Rusop, M. Ichimura

    Mater. Lett.   66   254 - 256   2012.01

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  • Fabrication of Heterojunctions Based on Chemically Deposited Copper Oxide Thin Films for Solar Cell Application Reviewed

    M. Muhibbullah and M. Ichimura

    Trans. Mater. Res. Soc. Jpn.   36   195 - 198   2011.07

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  • Characteristics of Ferroelectric Electron Emitters with Three-dimensional Emission Sites Formed by Chemical Etching Reviewed

    T. Sugiyama, I. Ohwada, T. Nanataki, O. Eryu, M. Ichimura, and M. Gomi

    J. Vac. Sci. Technol. B   92 ( 5 )   032210   2011.05

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  • Band Alignment at the Cu2O/ZnO Heterojunction Reviewed

    M. Ichimura and Y. Song

    Jpn. J. Appl. Phys.   50 ( 5 )   051002   2011.05

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  • Fabrication of Transparent p-Type CuxZnyS Thin Films by the Electrochemical Deposition Method Reviewed

    K. Yang and M. Ichimura

    Jpn. J. Appl. Phys.   20 ( 4 )   040202   2011.04

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  • Observation of Defects that Reduce Schottky Barrier Height in 4H-SiC Schottky Contacts Using Electrochemical Deposition of ZnO Reviewed

    M. Kato, H. Ono, M. Ichimura, G. Feng, T. Kimoto

    Jpn. J. Appl. Phys.   50 ( 3 )   036603 - 036603   2011.03

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  • Electrodeposition of SnO2 Thin Films from Aqueous Tin Sulfate Solutions Reviewed

    J. M. Vequizo, J. Wang, and M. Ichimura

    Jpn. J. Appl. Phys.   49   125502   2010.12

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  • Electrochemical deposition and characterization of CuGaxSyOz Reviewed

    S. Chowdhury, M. Ichimura

    Mater. Sci. Semicond. Processing   13 ( 4 )   252 - 256   2010.12

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  • Pulsed electrodeposition of oxygen-free tin monosulfide thin films using lactic acid/sodium lactate buffered electrolytes Reviewed

    F. Kang and M. Ichimura

    Thin Solid Films   519   725 - 728   2010.10

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  • Deep levels affecting the resistivity in semi-insulating 6H–SiC Reviewed

    M. Kato, K. Kito, and M. Ichimura

    J. Appl. Phys.   108   053718   2010.09

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  • Fabrication of Photoconductive Copper Oxide Thin Films by the Chemical Bath Deposition Technique Reviewed

    M. Muhibbullah and M. Ichimura

    Jpn. J. Appl. Phys.   49   081102   2010.08

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  • Photochemical Deposition of GaSxOy Thin Films from Aqueous Solutions Reviewed

    S. Chowdhury and M. Ichimura

    Jpn. J. Appl. Phys.   49   062302   2010.06

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  • Improved emission of ferroelectric electron emitter by surface treatments in gas atmosphere Reviewed

    T. Sugiyama, I. Ohwada, T. Nanataki, O. Eryu, M. Ichimura, and M. Gomi

    J. Appl. Phys.   107   114109   2010.06

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  • Deposition of ZnS1-xOx thin films by the photochemical dip coating method and application for heterojunction solar cells Reviewed

    M. Ichimura, K. Akita

    Phys. Status Solidi C   7 ( 3-4 )   929 - 932   2010.03

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  • Properties of gas sensors based on photochemically deposited nanocrystalline SnO2 films Reviewed

    M. Ichimura, Aodengbaoleer, T. Sueyoshi

    Phys. Status Solidi C   7 ( 3-4 )   1168 - 1171   2010.03

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  • Experimental determination of band offsets at the SnS/CdS and SnS/InSxOy heterojunctions Reviewed

    A. M. Abdel Haleem, M. Ichimura

    J. Appl. Phys.   107   034507   2010.02

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  • Annealing Study of the electrochemically deposited InSxOy Thin Film and its Photovoltaic Application

    A.M. Abdel Haleem, M. Ichimura

    IEICE Transactions on Electronics   E92-C ( 12 )   1464 - 1469   2009.12

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  • Electrodeposition of wide band gap InGaxSyOz thin films for solar cell applications Reviewed

    A.M. Abdel Haleem, M. Ichimura

    Mater. Sci. Eng. B   164   180 - 185   2009.10

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  • Analysis of Atomic and Electronic Structures of Cu2ZnSnS4 Based on First-Principle Calculation Reviewed

    M. Ichimura, Y. Nakashima

    Jpn. J. Appl. Phys.   48 ( 9 )   090202   2009.09

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  • Room Temperature Gas Sensor with a High Sensitivity to Hydrogen Based on SnO2 Films Prepared by Photochemical Techniques Reviewed

    M. Ichimura and T. Sueyoshi

    Jpn. J. Appl. Phys.   48 ( 1 )   015503   2009.04

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  • Annealing Study of the electrochemically deposited InSxOy Thin Film and its Photovoltaic Application Reviewed

    A.M. Abdel Haleem, M. Kato, and M. Ichimura

    IEICE Transactions on Electronics   E92-C ( 12 )   1464 - 1469   2009.04

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  • Electrodeposition of wide band gap InGaxSyOz thin films for solar cell applications Reviewed

    A.M. Abdel Haleem and M. Ichimura

    Mater. Sci. Eng. B   164   180 - 185   2009.04

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  • Analysis of Atomic and Electronic Structures of Cu2ZnSnS4 Based on First-Principle Calculation Reviewed

    M. Ichimura and Y. Nakashima

    Jpn. J. Appl. Phys.   48 ( 9 )   090202   2009.04

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  • Wide Bandgap InS-based Thin Film: Deposition, Characterization, and Application for SnS Solar Cells Reviewed

    A. M. Abdel Haleem and M. Ichimura

    Jpn. J. Appl. Phys.   48 ( 3 )   035506   2009.04

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  • Photochemical deposition of FeSxOy Reviewed

    H. Rezagholipour Dizaji and M. Ichimura

    Mater. Sci. Eng. B   158   26 - 29   2009.04

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  • Calculation of Band offsets at the CdS/SnS heterojunction Reviewed

    M. Ichimura

    Solar Energy Mater. Solar Cells   93   375 - 378   2009.04

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  • Electrodeposited ZnO/SnS Heterostructures for Solar Cell Application Reviewed

    M. Ichimura and H. Takagi

    Jpn. J. Appl. Phys   47 ( 10 )   7845 - 7847   2008.04

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  • Fabrication of ZnO thin films by the photochemical deposition method Reviewed

    M. Azuma and M. Ichimura

    Mater. Res. Bull.   43   3537 - 3542   2008.04

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  • Electrochemical deposition of indium sulfide thin films using two-step pulse biasing Reviewed

    A.M. Abdel Haleem, and M. Ichimura

    Thin Solid Films   516   7783 - 7789   2008.04

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  • Characterization of plasma etching damage on p-type GaN using Schottky diodes Reviewed

    M. Kato, K. Mikamo, M. Ichimura, M. Kanechika, O. Ishiguro, and T. Kachi

    J. Appl. Phys.   103   093701   2008.04

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  • Direct Fabrication of Fine Gold Patterns from an Aqueous Solution by a UV Laser Reviewed

    A. Senthil Kumaran and M. Ichimura

    J. Electron. Mater.   37 ( 4 )   523 - 526   2008.04

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  • Photovoltaic cells based on pulsed electrochemically deposited SnS and photochemically deposited CdS and Cd1-xZnxS Reviewed

    M. Gunasekaran and M. Ichimura

    Solar Energy Mater. Solar Cells   91 ( 9 )   774 - 778   2007.04

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  • Observation of Inhomogeneity of Schottky Barrier Height on 4H-SiC Using the Electrochemical Deposition Reviewed

    M. Kato, K. Ogawa, and M. Ichimura

    Jpn. J. Appl. Phys.   46   L997 - L999   2007.04

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  • Excess Carrier Lifetime in a Bulk p-type 4H-SiC Wafer Measured by the Microwave Photoconductivity Decay Method Reviewed

    M. Kato, M. Kawai, T. Mori, M. Ichimura, S. Sumie, and H. Hashizume

    Jpn. J. Appl. Phys.   46 ( 8 )   5057 - 5061   2007.04

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  • Fabrication of ZnS thin films by an improved photochemical deposition method and application to ZnS/SnS heterojunction cells Reviewed

    T. Miyawaki and M. Ichimura

    Materials Letters   61   4683 - 4686   2007.04

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  • Photochemical deposition of patterned gold thin films Reviewed

    A. Senthil Kumaran,T. Miyawaki, and M. Ichimura

    Jpn. J. Appl. Phys.   45 ( 48 )   L1283 - L1285   2006.04

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  • Temperature dependence of a slow component of excess carrier decay curves Reviewed

    M. Ichimura

    Solid St. Electron.   50 ( 11-12 )   1761 - 1766   2006.04

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  • Optical cross sections of deep levels in 4H-SiC Reviewed

    M. Kato, S. Tanaka, M. Ichimura, E. Arai, S. Nakamura T. Kimoto, and R.Passler

    J. Appl. Phys.   100   053708   2006.04

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  • Room-Temperature Hydrogen Sensing Properties of SnO2 Thin Films Fabricated by the Photochemical Deposition and Doping Methods Reviewed

    D. Ito and M. Ichimura

    Jpn. J. Appl. Phys.   45 ( 9 )   7094 - 7096   2006.04

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  • Electrochemical deposition of ZnO thin films from acidic solutions Reviewed

    N. Fathy and M. Ichimura

    J. Cryst. Growth   294 ( 2 )   191 - 196   2006.04

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  • Preparation of ternary Cd1-xZnxS alloy by photochemical deposition (PCD) and its application to photovoltaic devices Reviewed

    M. Gunasekaran, P. Ramasamy, and M. Ichimura

    Phys. Stat. Sol. (c)   3 ( 8 )   2656 - 2660   2006.04

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  • Optical and Electrical Characterization of Photochemically Deposited CdS and Cd1-xZnxS Alloys Reviewed

    M. Gunasekaran, P. Ramasamy, and M. Ichimura

    J. Electrochem. Soc.   153 ( 7 )   G664 - G668   2006.04

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  • Deposition of SnSxOy Films by Electrochemical Deposition Using Three-Step Pulse and Their Characterization Reviewed

    K. Omoto, N. Fathy and M. Ichimura

    Jpn. J. Appl. Phys.   45 ( 3 )   1500 - 1505   2006.04

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  • Deposition of cadmium sulphide and cadmium zinc sulphide thin films by photochemical deposition and their characterisation Reviewed

    M. Gunasekaran, R. Gopalakrishnan, R. Sivakumar, P. Ramasamy and M. Ichimura

    Surface Engineering   22   73 - 77   2006.04

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  • Excess Carrier Lifetime Measurement of Bulk SiC Wafers and Its Relationship with Structural Defect Distribution Reviewed

    T. Mori, M. Kato, H. Watanabe, M. Ichimura, E. Arai, S. Sumie and H. Hashizume

    Jpn. J. Appl. Phys.   44 ( 12 )   8333 - 8339   2005.04

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  • Electrochemical Deposition of ZnO1-xSx Thin Films Using Three-Step Pulse Reviewed

    Naglaa Fathy and M. Ichimura

    Jpn. J. Appl. Phys.   44   L1295 - L1297   2005.04

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  • Deposition of Cd1-xZnxS (0 <x <1) Alloys by Photochemical Deposition Technique Reviewed

    M. Gunasekaran and M. Ichimura

    Jpn. J. Appl. Phys.   44 ( 10 )   7345 - 7350   2005.04

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  • Photoelectrical properties of ZnS thin films deposited from aqueous solution using pulsed electrochemical deposition Reviewed

    N. Fathy and M. Ichimura

    Solar Energy Mater. Solar Cells   87 ( 1-4 )   747 - 756   2005.04

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  • Crystal growth of pure and doped-KGd(WO4)2 and their characterization for laser applications

    A.Senthil Kumaran, A.L. Chandru, S.M. Babu, I. Bhaumik, S. Ganesamoorthy, A.K. Karnal, V.K. Wadhawan, and M. Ichimura

    J. Cryst. Growth   275   e2117 - e2121   2005.04

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  • Growth and characterization of pure and doped KY(WO4)2 crystals Reviewed

    A.Senthil Kumaran, A.L. Chandru, S.M. Babu, and M. Ichimura

    J. Cryst. Growth   275   e1901 - e1905   2005.04

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  • Photochemical deposition of CuxS thin films from aqueous solutions Reviewed

    J. Podder, R. Kobayashi, and M. Ichimura

    J. Cryst. Growth   275   e937 - e942   2005.04

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  • Characteriztion of Electrical Properties and Photosensitivity of SnS Thin Films Prepared by the Electrochemical Deposition Method Reviewed

    N. Sato, M. Ichimura, E. Arai and Y. Yamazaki

    Solar Energy Mater. Solar Cells   85 ( 2 )   153 - 165   2005.04

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  • Fabrication of SnO2 Thin Films by a Photochemical Deposition Method Reviewed

    M. Ichimura , K. Shibayama and K. Masui

    Thin Solid Films   466 ( 1-2 )   34 - 36   2004.04

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  • Photochemical Deposition of ZnS Thin Films by Intermittent Illumination

    M. Ichimura,R. Kobayashi, and T. Miyawaki

    Jpn. J. Appl. Phys.   43 ( 9 )   L1196 - L1198   2004.04

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  • Preparation of ZnS Thin Films by the Pulsed Electrochemical Deposition Reviewed

    N. Fathy, R. Kobayashi, M. Ichimura

    Mater. Sci. Eng. B   107 ( 7 )   271 - 276   2004.04

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  • Conduction type change with annealing in thin silicon-on-insulator wafers Reviewed

    Y. Shibata , M. Ichimura and E. Arai

    Solid-State Electronics   48 ( 7 )   1249 - 1252   2004.04

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  • Growth of ZnSe Thin Films by Electrocrystallization Technique Reviewed

    S. Soundeswaran, O. Senthil Kumar, R. Dhanasekaran, P. Ramasamy, R. Kumaresen and M. Ichimura

    Materials Chemistry and Physics   82 ( 2 )   268 - 272   2003.04

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  • Characterization of Deep Levels in 6H-SiC by Optical-Capacitance-Transient Spectroscopy Reviewed

    Y. Nakakura, M. Kato, M. Ichimura, E. Arai, Y. Tokuda, and S. Nishino

    J. Appl. Phys.   94 ( 7 )   3233 - 3238   2003.04

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  • Interface Recombination Velocity of Silicon-on-Insulator Wafers Measured by Microwave Reflectance Photoconductivity Decay Method with Electric Field Reviewed

    T. Kuwayama, M. Ichimura, and E. Arai

    Appl. Phys. Lett.   83 ( 7 )   928 - 930   2003.04

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  • As and Sb Diffusion Profiles in Thin Silicon-On-Insulator Wafers

    Y. Shibata, T. Ichino, M. Ichimura and E. Arai

    Jpn. J. Appl. Phys.   42 ( 7 )   4282 - 4283   2003.04

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  • Electrochemical Etching of 6H-SiC Using Aqueous KOH Solutions with Low Surface Roughness Reviewed

    M. Kato, M. Ichimura, E. Arai and P. Ramasamy

    Jpn. J. Appl. Phys.   42 ( 7 )   4233 - 4236   2003.04

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  • Applicability of Phosphorus and Boron Diffusion Parameters Extracted from Predeposition to Drive-in Diffusion for Bulk Silicon and Silicon-on-Insulator Reviewed

    E. Arai, D. Iida, H. Asai, Y. Ieki, H. Uchida, and M. Ichimura

    Jpn. J. Appl. Phys.   42 ( 5 )   1503 - 1510   2003.04

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  • Etch Pit Observation for 6H-SiC by Electrochemical Etching Using an Aqueous KOH Solution Reviewed

    M. Kato, M. Ichimura, E. Arai, and P. Ramasamy

    J. Electrochem. Soc   150 ( 4 )   C208 - C211   2003.04

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  • Sb Pile-up at Oxide/Si Interface during Drive-in Diffusion after Predeposition Using Doped Oxide Source Reviewed

    T. Ichino, H. Uchida, M. Ichimura and E. Arai

    Jpn. J. Appl. Phys   42 ( 3 )   1139 - 1144   2003.04

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  • SnS Thin Films Fabricated by Pulsed and Normal Electrochemical Deposition Reviewed

    K. Takeuchi, M. Ichimura, E. Arai, and Y. Yamazaki

    Sol. Energy Mat. Sol. Cells   75 ( 6 )   427 - 432   2003.04

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  • Photochemical deposition of ZnS thin films from C4H4KNaO6-added solutions Reviewed

    R. Kobayashi, N. Sato, M. Ichimura, E. Arai

    Journal of Optoelectronics and Advanced Materials   5 ( 4 )   893 - 898   2003.04

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  • Deep Center Passivation in 3C-SiC by Hydrogen Plasma with a Grid for Damage Suppression Reviewed

    M. Kato, F. Sobue, M. Ichimura, E. Arai, N. Yamada, Y. Tokuda and T. Okumura

    Solid St. Electron.   46 ( 9 )   2099 - 2104   2002.04

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  • Synthesis of PbS in Aqueous Solutions by Photochemical Reactions Reviewed

    M. Ichimura, T. Narita, and K. Masui

    Mater. Sci. Eng. B   96 ( 9 )   296 - 299   2002.04

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  • Properties of Photochemically Deposited CdSe Films Reviewed

    M. Ichimura, N. Sato, A. Nakamura, K. Takeuchi, and E. Arai

    Physica Status Solidi (a)   193 ( 9 )   132 - 138   2002.04

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  • Deposition of Amorphous SexTe1-x Thin Film Alloys by a Novel Photochemical Deposition Technique and Their Analysis

    R. Kumaresan, M. Ichimura, N. Sato, P. Ramasamy, and E. Arai

    J. Electrochem. Soc.   149 ( 9 )   C464 - C468   2002.04

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  • Application of Novel Photochemical Deposition Technique for the Deposition of Indium Sulfide Reviewed

    R. Kumaresan, M. Ichimura, N. Sato, P. Ramasamy

    Mater. Sci. Eng. B   96 ( 7 )   37 - 42   2002.04

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  • Photochemical Deposition of ZnSe Polycrystalline Thin Films and Their Characterization Reviewed

    R. Kumaresan, M. Ichimura and E. Arai

    Thin Solid Films   414 ( 7 )   25 - 30   2002.04

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  • Boron Diffusion Profiles in Ultrathin Silicon-on-Insulator Structures and Their Relation to Crystalline Quality Reviewed

    H. Uchida, M. Ichimura and E. Arai

    Jpn. J. Appl. Phys.   41 ( 7 )   4436 - 4441   2002.04

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  • Bulk Carrier Lifetime Measurement by the Microwave Reflectance Photochonductivity Decay Method with External Surface Electric Field Reviewed

    M. Ichimura, A. Tada, E. Arai, H. Takamatsu, S. Sumie

    Appl. Phys. Lett.   80 ( 23 )   4390 - 4392   2002.04

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  • Preparation of (Bi, Sb)2S3 Semiconductor Films by Photochemical Deposition Method Reviewed

    H. Sasaki, K. Shibayama, M. Ichimura and K. Masui

    J. Cryst. Growth   237-239 ( 7A )   2125 - 2129   2002.04

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  • Changes in Carrier Profiles of Bonded SOI Wafers with Thermal Annealing Measured by the Spreading Resistance Method Reviewed

    M. Ichimura, S. Ito, and E. Arai

    Solid St. Electron   46 ( 7A )   545 - 553   2002.04

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  • Characterization of Si Wafer Surfaces after Wet Chemical Treatment by the Microwave Reflectance Photoconductivity Decay Method withSurface Electric Field Reviewed

    A. Tada, M. Ichimura, E. Arai, H. Takamatsu, and S. Sumie

    Jpn. J. Appl. Phys.   40 ( 5A )   3069 - 3074   2001.04

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  • Photochemical Deposition of Se and CdSe from Aqueous Solutions Reviewed

    M. Ichimura, A. Nakamura, K. Takeuchi, and E. Arai

    Thin Solid Films   384 ( 4B )   157 - 159   2001.04

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  • Passivation of Deep Levels in 3C-SiC on Si by a Hydrogen Plasma Treatment Reviewed

    M. Kato, F. Sobue, M. Ichimura, E. Arai, N. Yamada, Y. Tokuda, and T. Okumura

    Jpn. J. Appl. Phys.   40 ( 4B )   2983 - 2986   2001.04

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  • Electrical and Optical Properties of CdS Films Grown by Photochemical Deposition from Aqueous Solutions Reviewed

    R. Kumaresan, M. Ichimura, K. Takahashi, K. Takeuchi, F. Goto, and E. Arai

    Jpn. J. Appl. Phys.   40 ( 5A )   3161 - 3162   2001.04

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  • Deep Level Study in Heteroepitaxial 3C-SiC Grown on Si by Hexamethyldisilane Reviewed

    M. Kato, M. Ichimura, E. Arai, Y. Masuda, Y. Chen, S. Nishino, and Y. Tokuda

    Jpn. J. Appl. Phys.   40 ( 8 )   4943 - 4947   2001.04

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  • Sacrificial Anodic Oxidation of 6H-SiC Reviewed

    M. Kato, M. Ichimura, and E. Arai

    Jpn. J. Appl. Phys.   40 ( 11A )   L1145 - L1147   2001.04

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  • Quality Assessment of Bridgman Grown CdTe Single Crystals using Double Crystal X-ray Diffractometry (DCD) and Synchrotron Radiation

    R Kumaresan, R. Gopalakrishnan, S. Moorth Babu, P. Ramasamy, P. Zaumseil, and, M Ichimura

    J. Crystal. Growth   210 ( 11 )   193 - 197   2000.04

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  • Retarded Diffusion of Phosphorus in Silicon-on-Insulator Structures Reviewed

    H. Uchida, Y. Ieki, M. Ichimura, and E. Arai

    Jpn. J. Appl. Phys.   39 ( 2B )   L137 - L140   2000.04

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  • Electrochemical Deposition of SnS Thin Films Reviewed

    M. Ichimura, K. Takeuchi, Y. Ono, and E. Arai

    Thin Solid Films   361-362 ( 12A )   98 - 101   2000.04

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  • Characterization of Si Wafers by μ-PCD with Surface Electric Field Reviewed

    M. Ichimura, M. Hirano, A. Tada, E. Arai, H. Takamatsu, and S. Sumie

    Mater. Sci. Eng. B   73 ( 12A )   230 - 234   2000.04

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  • Slow Decay of Excess Carrier Concentration in Bonded Silicon-on-Insulator Wafers Reviewed

    M. Hirano, M. Ichimura, and E. Arai

    Jpn. J. Appl. Phys.   39 ( 12A )   6513 - 6514   2000.04

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  • Deposition of CdS and ZnS from Aqueous Solutions by a New Photochemical Technique Reviewed

    M. Ichimura, F. Goto, Y. Ono, and E. Arai

    J. Cryst. Growth   198-199 ( 3 )   308 - 312   1999.04

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  • Photochemical Deposition of CdS from Aqueous Solutions Reviewed

    M. Ichimura, F. Goto, and E. Arai

    J. Electrochem. Soc.   146 ( 3 )   1028 - 1034   1999.04

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  • Control of Surface Recombination of Si Wafers by an External Electrode Reviewed

    M. Ichimura, M. Hirano, N. Kato, E. Arai, H. Takamatsu, and S. Sumie

    Jpn. J. Appl. Phys.   38 ( 3B )   L292 - L294   1999.04

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  • Structural and Optical Characterization of CdS Films Grown by Photochemical Deposition Reviewed

    M. Ichimura, F. Goto, and E. Ara

    J. Appl. Phys.   85 ( 10 )   7411 - 7417   1999.04

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  • Search for Midgap Levels in 3C-SiC Grown on Si Substrates Reviewed

    N. Yamada, M. Kato, M. Ichimura, E. Arai, and Y. Tokuda

    Jpn. J. Appl. Phys.   38 ( 10A )   L1094 - L1095   1999.04

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  • Defect Reduction in Electrochemically Deposited CdS Thin Films by Annealing in O2 Reviewed

    F. Goto, K. Shirai, and M. Ichimura

    Solar Energy Mater. & Solar Cells   50 ( 1 )   147 - 153   1998.04

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  • Study of Carrier Emission and Capture Processes at Electron Traps in 3C-SiC Reviewed

    M. Ichimura, Y. Koga, N. Yamada, T. Abe, E. Arai, and Y. Tokuda

    Jpn. J. Appl. Phys.   37 ( 1 )   L18 - L20   1998.04

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  • Measurement of Minority Carrier Recombination Lifetime in Silicon Wafers by Measurement of Photoconductivity Decay by MicrowaveReflectance: Results of Round Robin Test Reviewed

    M. Miyazaki, K. Kawai, and M. Ichimura

    Recombination Lifetime Measurements in Silicon   84 ( 5 )   347 - 366   1998.04

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  • Slow Photoconductivity Decay in 3C-SiC on Si Substrates Reviewed

    M. Ichimura, N. Yamada, H. Tajiri, and E. Arai

    J. Appl. Phys.   84 ( 5 )   2727 - 2731   1998.04

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  • Temperature Dependence of Carrier Recombination Lifetime in Si Wafers Reviewed

    M. Ichimura, H. Tajiri, T. Ito, and E. Arai

    J. Electrochem. Soc.   145 ( 9 )   3265 - 3271   1998.04

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  • Excess Carrier Lifetime of 3C-SiC Measured by the Microwave Photoconductivity Decay Method Reviewed

    M. Ichimura, H. Tajiri, Y. Morita, N. Yamada, and A. Usami

    Appl. Phys. Lett.   70 ( 13 )   1745 - 1747   1997.04

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  • Characterization of Thin Bonded Silicon-on-Insulator Structures by the Microwave Photoconductivity Decay Method

    M. Ichimura, T. Makino, H. Asakura, A. Usami, E. Morita, and E. Arai

    Jpn. J. Appl. Phys.   36 ( 7A )   L839 - L841   1997.04

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  • Contactless Evaluation of the Surface Recombination Velocity at High-Low Junction Surface Fabricated by the Ion-Implantation Technique Reviewed

    T. Makino, M. Ichimura, H. Yoshida, E. Morita, and A. Usami

    Jpn. J. Appl. Phys.   36 ( 2 )   601 - 604   1997.04

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  • A New Technique of Compound Semiconductor Deposition from an Aqueous Solution by Photochemical Reactions Reviewed

    F. Goto, M. Ichimura, and E. Arai

    Jpn. J. Appl. Phys.   36 ( 9 )   L1146 - L1149   1997.04

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  • Raman and Photoluminescence Characterizations of Electrochemically Deposited ZnxCd1-xS Layers Reviewed

    M. Ichimura, T. Furukawa, K. Shirai, and F. Goto

    Mater. Lett.   33 ( 1 )   51 - 55   1997.04

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  • Stillinger-Weber Potentials for III-V Compound Semiconductors and Their Application to the Critical Thickness Calculation for InAs/GaAs Reviewed

    M. Ichimura

    Phys. Stat. Sol. (a)   153 ( 3 )   431 - 437   1996.04

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  • Atomistic Study of Partial Dislocations in Ge/Si (001) Heterostructures Reviewed

    M. Ichimura and J. Narayan

    Phil. Mag. A   73 ( 3 )   767 - 778   1996.04

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  • Relationship between Raman Spectra and Crystallinity of CdS Films Grown by Cathodic Electrodeposition Reviewed

    K. Shirai, Y. Moriguchi, M. Ichimura, A. Usami, and M. Saji

    Jpn. J. Appl. Phys.   35 ( 4 )   2057 - 2060   1996.04

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  • Effects of an Ultrathin Inserted Si Layer on Dislocation Nucleation in Ge/Si Heterostructures Reviewed

    M. Ichimura

    Jpn. J. Appl. Phys.   35 ( 5B )   L609 - L611   1996.04

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  • Surface Condition of Si Implanted GaAs Revealed by the Noncontact Laser/Microwave Method Reviewed

    M. Ichimura, H. Yoshida, and A. Usami

    J. Electron. Mater.   25 ( 7 )   1088 - 1092   1996.04

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  • Photoluminescence and Raman Scattering of Electrochemically Deposited CdS Films Reviewed

    K. Shirai, F. Goto, and M. Ichimura

    Jpn. J. Appl. Phys.   35 ( 11B )   L1483 - L1485   1996.04

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  • Evaluation of the Bonded Silicon on Insulator (SOI) Wafer and the Characteristics of PIN Photodiodes on the Bonded SOI Wafer Reviewed

    A. Usami, K. Kaneko, Y. Fujii, and M. Ichimura

    IEEE Trans. Electron Devices,   42 ( 2 )   239 - 243   1995.04

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  • Atomistic Study of Dislocation Nucleation in Ge/(001)Si Heterostructures Reviewed

    M. Ichimura and J. Narayan

    Phil. Mag. A   72 ( 2 )   281 - 295   1995.04

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  • Characterization of GaAs Heterolayers by Micro-Raman Spectroscopy Reviewed

    M. Ichimura, Y. Moriguchi, A. Usami, M. Tabuchi, and A. Sasaki

    J. Cryst. Growth   149 ( 10 )   167 - 174   1995.04

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  • Raman Study of Strain Relaxation in Ge on Si Reviewed

    M. Ichimura, A. Usami, A. Wakahara, and A. Sasaki

    J. Appl. Phys.   77 ( 10 )   5144 - 5148   1995.04

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  • Raman Spectra of GaAs with Ultrathin InAs Layers Inserted Reviewed

    M. Ichimura, A. Usami, M. Tabuchi, and A. Sasaki

    Phys. Rev. B   51 ( 19 )   13231 - 13237   1995.04

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  • Role of Surface Step on Misfit Dislocation Nucleation and Critical Thickness in Semiconductor Heterostructures Reviewed

    M. Ichimura and J. Narayan

    Mater. Sci. Eng. B   31 ( 2 )   299 - 303   1995.04

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  • Negative Surface Energy Change Associated with Step Formation Caused by Misfit Dislocation Nucleation in Semiconductor Heterostructures Reviewed

    M. Ichimura and J. Narayan

    Phil. Mag. A   72 ( 2 )   297 - 304   1995.04

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  • Raman Study of Misfit Strain Relaxation during Heteroepitaxial Growths Reviewed

    M. Ichimura, A. Usami, T. Wada, and A. Sasaki

    J. Jpn. Assoc. Crystal Growth   Vol.21 ( 5 )   S415 - S419   1994.04

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  • Liquid-Phase Epitaxy of Highly-Lattice-Mismatched InxGa1-xAs Layers on (001) GaAs Substrates Reviewed

    M. Ichimura, S. Nakatani, A. Usami, and T. Wada

    Mater. Lett.   Vol.18 ( 12 )   269 - 272   1994.04

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  • Structural Characterization of a Bonded Silicon-on-Insulator Layer with Voids by micro-Raman Spectroscopy Reviewed

    A. Usami, M. Ichimura, T. Wada, and S. Ishigami

    J. Appl. Phys.   75 ( 12 )   7866 - 7868   1994.04

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  • Optical Characterization of GaSb-Based Ternary and Quaternary Alloys Grown by Liquid Phase Epitaxy at Low Temperatures Reviewed

    M. Ichimura, K. Kato, H. Uekita, N. Kitamura, A. Usami, and T. Wada

    Jpn. J. Appl. Phys.   32 ( 9 )   3707 - 37112   1993.04

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  • Stabilization of Li Acceptors in ZnSe by Above-Band-Gap Photoirradiation Reviewed

    M. Ichimura, T. Wada, Sz. Fujita, and Sg. Fujita

    J. Appl. Phys.   73 ( 11 )   7225 - 7228   1993.04

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  • Observation of Phonon-Plasmon Coupled Modes at the Interface between ZnSe and Semi-insulating GaAs by Micro-Raman Spectroscopy Reviewed

    M. Ichimura, A. Usami, T. Wada, Sz. Fujita, and Sg. Fujita

    Appl. Phys. Lett.   62 ( 15 )   1800 - 1802   1993.04

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  • Thermodynamic Model for the Annealing Process of Si-Implanted GaAs Reviewed

    M. Ichimura, A. Usami, and T. Wada

    Modelling Simul. Mater. Sci. Eng.   1 ( 7 )   529 - 538   1993.04

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  • Micro-Raman Characterization of Molecular-Beam Epitaxial Ge Heterolayers on Si Substrates Reviewed

    M. Ichimura, Y. Moriguchi, A. Usami, T. Wada, A. Wakahara and A. Sasaki

    J. Electron. Mater.   22 ( 7 )   779 - 784   1993.04

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  • Micro-Raman Study on GaAs Layers Directly Grown on (100) Si by Molecular Beam Epitaxy Reviewed

    A. Ito, M. Ichimura, A. Usami, T. Wada, and H. Kano

    J. Appl. Phys.   72 ( 6 )   2531 - 2533   1992.04

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  • Micro-Raman Characterization of a Ge/Si Heterostructure Grown by Chemical Vapor Deposition Reviewed

    M. Ichimura, Y. Moriguchi, A. Usami, and T. Wada

    IEICE Trans. Electron.   E75-C ( 9 )   1056 - 1062   1992.04

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  • Extremely Low-Temperature LPE Growth of AlxGa1-x-yInySb Reviewed

    K. Kato, H. Uekita, M. Ichimura, N. Kitamura, A. Usami, and T. Wada

    Materials Letters   13 ( 3 )   93 - 95   1992.04

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  • Reduction of Compensating Defects in ZnSe and ZnS by Photo-Irradiation Reviewed

    M. Ichimura, T. Wada, Sz. Fujita, and Sg. Fujita

    J. Cryst. Growth   117 ( 3 )   689 - 693   1992.04

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  • Micro-Raman Study of Heteroepitaxial InGaAs Layers Reviewed

    M. Ichimura, Y. Moriguchi, A. Usami, T. Wada, M. Tabuchi, and A. Sasaki

    J. Cryst. Growth   121 ( 3 )   423 - 428   1992.04

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  • Calculation of Point Defect Concentrations in GaAs Grown by Molecular Beam Epitaxy Reviewed

    M. Ichimura and T. Wada

    J. Appl. Phys.   72 ( 3 )   1200 - 1202   1992.04

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  • Raman Spectra of Cubic Zn1-xCdxS Reviewed

    M. Ichimura, A. Usami, T. Wada, M. Funato, K. Ichino, Sz. Fujita, and Sg. Fujita

    Phys. Rev. B   72 ( 7 )   4273 - 4276   1992.04

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  • Point Defect Concentrations in InGaAsP Quaternary Alloys Reviewed

    M. Ichimura and T. Wada

    J. Appl. Phys.   69 ( 7 )   4140 - 4142   1991.04

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  • Crystalline Quality of Extremely-Low-Temperature Grown LPE-GaSb

    N. Kitamura, H. Uekita, M. Ichimura, A. Usami, and T. Wada

    Materials Letters   10 ( 9 )   10,417 - 420   1991.04

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  • Thermodynamic Calculation of Native Defect Concentrations in III-V Alloy Semiconductors Grown by Halide Transport Vapor-Phase Epitaxy Reviewed

    M. Ichimura and T. Wada

    J. Electrochem. Soc.   138 ( 7 )   2097 - 2102   1991.04

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  • A Defect Model for Photoirradiated Semiconductors -Suppression of the Self-compensation in II-VI Materials- Reviewed

    M. Ichimura, T. Wada, Sz. Fujita, and Sg. Fujita

    Jpn. J. Appl. Phys.   30 ( 12 )   3475 - 3481   1991.04

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  • Calculation of Native Defect Concentrations in GaAs Grown by Organometallic Vapor-Phase Epitaxy Reviewed

    M. Ichimura and T. Wada

    J. Cryst. Growth   115 ( 3 )   479 - 483   1991.04

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  • Native Defects in AlxGa1-xSb Alloy Semiconductor Reviewed

    M. Ichimura, K. Higuchi, Y. Hattori, T. Wada, and N. Kitamura,

    J. Appl. Phys.   68 ( 12 )   6153 - 6158   1990.04

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  • Photoluminescence Study of AlxGa1-xSb Grown by Liquid-Phase Epitaxy Reviewed

    N. Kitamura, K. Higuchi, H. Uekita, M. Ichimura, A. Usami, and T. Wada

    Jpn. J. Appl. Phys.   29 ( 8 )   1403 - 1407   1990.04

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  • Calculation of Bond Lengths in Si1-xGex Alloys Based on the Valence-Force-Field Model Reviewed

    M. Ichimura, Y. Nishino, H. Kajiyama, and T. Wada

    Jpn. J. Appl. Phys.   29 ( 5 )   842 - 843   1990.04

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  • Native Defects in III-V Ternary Alloy Semiconductors Grown from Liquid- Solutions Reviewed

    M. Ichimura and T. Wada

    Jpn. J. Appl. Phys.   291515 ( 8 )   1515 - 1520   1990.04

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  • Crystalline Microstructure of III-V Quaternary Alloy Semiconductors Reviewed

    M. Ichimura and A. Sasaki

    J. Cryst. Growth   98 ( 5 )   18 - 26   1989.04

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  • Chemical Potentials of Constituent Compounds in III-V Alloy Semiconductors Reviewed

    M. Ichimura and T. Wada

    J. Cryst. Growth   97 ( 5 )   542 - 550   1989.04

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  • Average Lengths and Statistics of Bonds in In1-xGaxAs1-yPy Quaternary Alloy Semiconductor Reviewed

    M. Ichimura and A. Sasaki

    Jpn. J. Appl. Phys.   27 ( 10 )   1910 - 1915   1988.04

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  • Crystalline Microstructure of Alloy Semiconductors Reviewed

    A. Sasaki and M. Ichimura

    J. Crystallographic Society of Japan   Vol.30 ( 6 )   311 - 321   1988.04

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  • Solution Hardening due to a Nonrandom Atom Arrangement in III-V Ternary Alloy Semiconductors Reviewed

    M. Ichimura and A. Sasaki

    Jpn. J. Appl. Phys.   27 ( 2 )   L176 - L178   1988.04

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  • Atom Arrangement in III-V Quaternary Alloy Semiconductors of (ABC)D Type Reviewed

    M. Ichimura and A. Sasaki

    Jpn. J. Appl. Phys.   27 ( 4 )   642 - 648   1988.04

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  • Bond Statistics and Their Influences on Materials Properties of III-V Quaternary Alloys of Type (AB)III(CD)V

    M. Ichimura and A. Sasaki

    J. Electron. Mater.   17 ( 4 )   305 - 310   1988.04

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  • AlGaSb Single, Double and Multiple Heterostructures Grown by Liquid-Phase Epitaxy and Their Photoluminescence Properties Reviewed

    M. Ichimura, Y. Takeda, and A. Sasaki,

    Jpn. J. Appl. Phys.   27 ( 8 )   1464 - 1468   1988.04

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  • Bonds in III-V Quaternary Alloy Semiconductors of A1-xBxC1-yDy Type Reviewed

    M. Ichimura and A. Sasaki

    Phys. Rev. B   36 ( 18 )   9694 - 9702   1987.04

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  • Calculation of Bond Lengths in InGaAsP Quaternary Alloy Semiconductor Reviewed

    M. Ichimura and A. Sasaki

    Jpn. J. Appl. Phys.   26 ( 2 )   246 - 251   1987.04

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  • Statistics of Primitive Cells in InGaAs and AlGaAs Ternary Alloy Semiconductors

    A.Sasaki and M. Ichimura

    Superlattices and Microstructures   3 ( 2 )   127 - 131   1987.04

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  • Alloy Scattering Mobility in III-V Ternary Alloy Semiconductors with Nonrandom Atom Arrangement Reviewed

    M. Ichimura and A. Sasaki

    Jpn. J. Appl. Phys.   26 ( 5 )   776 - 777   1987.04

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  • Average Bond Lengths and Atom Arrangement in In1-xGaxAs and GaAs1-xPx III-V Ternary Alloy Semiconductors Reviewed

    M. Ichimura and A. Sasaki

    Jpn. J. Appl. Phys.   26 ( 8 )   1296 - 1299   1987.04

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  • Bond Lengths in III-V Ternary Alloy Semiconductors Reviewed

    M. Ichimura and A. Sasaki

    Jpn. J. Appl. Phys.   26 ( 12 )   2061 - 2066   1987.04

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  • Short-Range Order in III-V Ternary Alloy Semiconductors Reviewed

    M. Ichimura and A. Sasaki

    J. Appl. Phys.   60 ( 11 )   3850 - 3855   1986.04

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  • Free Energies and Equilibrium States of Mono- and Bi-Layer Superstructures of III-V Ternary Alloy Semiconductors Reviewed

    M. Ichimura and A. Sasaki

    Jpn. J. Appl. Phys.   25 ( 7 )   976 - 980   1986.04

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  • Predicted Extremely High Mobilities of Two-Dimensional Electrons in AlGaSb/GaSb and AlInAsSb/InAs Single Heterostructures Reviewed

    Y. Takeda, M. Ichimura, and A. Sasaki

    Jpn. J. Appl. Phys.   24 ( 6 )   L455 - L456   1985.04

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