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Affiliation Department |
Department of Life Science and Applied Chemistry
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Title |
Professor |
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Homepage |
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IDA Takashi
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Degree
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Master of Science ( The University of Tokyo )
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Doctor (Science) ( The University of Tokyo )
Research Areas
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Nanotechnology/Materials / Inorganic materials and properties
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Nanotechnology/Materials / Applied physical properties
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Nanotechnology/Materials / Inorganic/coordination chemistry
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Nanotechnology/Materials / Fundamental physical chemistry
From School
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The University of Tokyo Faculty of Science Graduated
- 1985.03
Country：Japan
From Graduate School
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The University of Tokyo Graduate School, Division of Science Doctor's Course Unfinished Course
- 1989.03
Country：Japan
External Career
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Technician, Institute for Molecular Science, Okazaki National Research Institute
1989.04 - 1991.03
Country：Japan
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Himeji Institute of Technology Research Assistant
1991.04 - 1999.07
Country：Japan
Professional Memberships
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分析化学会Ｘ線分析研究懇談会
2019.04
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International Union of Crystallography
2014.08
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国際回折データセンター（ＩＣＤＤ）
2008.03
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The Ceramic Society of Japan
2002.04
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The Crystallographic Society of Japan
1999.04
Research Career
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Estimation of Size of Crystalline Fine Particles
(not selected)
Project Year：
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Structure Analysis by Powder X-ray Diffractometry
(not selected)
Project Year：
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Structure Analysis by Powder X-ray Diffractometry
(not selected)
Project Year：
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Estimation of Crystallite Size and Strain by Powder X-ray D:ffractometry
(not selected)
Project Year：
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Methodology of Powder Diffractometry
(not selected)
Project Year：
Papers
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Lotgering factor Reviewed
Takashi Ida
Annual Report of Advanced Ceramics Research Center, Nagoya Institute of Technology 11 44 - 47 2023.07
Authorship：Lead author, Corresponding author Language：Japanese Publishing type：Research paper (bulletin of university, research institution)
Other Link： http://www.crl.nitech.ac.jp/ar/2022/4447_acrc_ar2022_review.pdf
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Powder X-ray diffraction intensities of corundum calculated by conventional and density functional theory methods and extracted by deconvolutional treatment on experimental data Reviewed
Takashi Ida
Powder Diffraction 38 ( 2 ) 81 - 89 2023.06
Authorship：Lead author, Corresponding author Language：English Publishing type：Research paper (scientific journal)
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Convolution and deconvolutional treatment on sample transparency aberration in Bragg-Brentano geometry Reviewed
Takashi Ida
Powder Diffraction 37 ( 1 ) 13 - 21 2022.03
Authorship：Lead author Language：English Publishing type：Research paper (scientific journal)
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Continuous series of symmetric peak profile functions determined by standard deviation and kurtosis Reviewed International journal
Takashi Ida
Powder Diffraction 36 ( 4 ) 2021.12
Authorship：Lead author Language：English Publishing type：Research paper (scientific journal) Publisher：International Centre for Diffraction Data
A mathematical system for modeling the effects of symmetrized instrumental aberrations has been developed. The system is composed of the truncated Gaussian, sheared Gaussian and Rosin-Rammler type functions. The shape of the function can uniquely be determined by the standard deviation and kurtosis. A practical method to evaluate the convolution with the Lorentzian function and results of application to analysis of experimental powder diffraction data are briefly described.
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Equatorial aberration for powder diffraction data collected by continuous scan of a silicon strip X-ray detector Invited Reviewed International journal
Takashi Ida
Powder Diffraction 64 ( 3 ) 169 - 175 2021.09
Authorship：Lead author Language：English Publishing type：Research paper (scientific journal) Publisher：International Centre for Diffraction Data
Application of continuous-scan integration to collect X-ray diffraction data with a Si strip X-ray detector (CSI-SSXD) introduces additional effects on the peak-shift and deformation of peak shape caused by the equatorial aberration. A deconvolutional method to correct the effects of equatorial aberration in CSI-SSXD data is proposed in this study. There are four critical angles related to the effects of spill-over of the incident X-ray beam from the specimen face in the CSI-SSXD data. Exact values of cumulants of the equatorial aberration function are efficiently evaluated by 4×4 point two-dimensional Gauss-Legendre integral. A naïve two-step deconvolutional method has been applied to remove the effects of the first and third-order cumulants of the equatorial aberration function from the observed CSI-SSXD data. The performance of the algorithm has been tested by analyses of CSI-SSXD data of three LaB6 powder specimens with the widths of 20, 10 and 5 mm, collected with a diffractometer with the goniometer radius of 150 mm.
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Application of deconvolutional treatment to powder diffraction data collected with a Bragg-Brentano diffractometer with a contaminated Cu target with a Ni filter Reviewed
Takashi Ida
Powder Diffraction 35 ( 03 ) 166 - 177 2020.09
Authorship：Lead author Language：English Publishing type：Research paper (scientific journal) Publisher：International Centre for Diffraction Data
A deconvolutional method for preprocessing powder diffraction data has been improved. The cumulants of instrumental aberration functions of Bragg-Brentano (Parrish) diffractometer calculated up to the fourth order are presented. The treatments of axial-divergence aberration and the effective spectroscopic profilee of the source X-ray have been simplified from those used in the previous methods. The current method has been applied to powder diffraction data collected with a Cu-target X-ray tube, used over 20 years, and a N-foil K_beta filter.
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Equatorial aberration of powder diffraction data collected with an Si strip X-ray detector by a continuous-scan integration method Reviewed International journal
T. Ida
Journal of Applied Crystallography 53 679 - 685 2020.05
Authorship：Lead author Language：English Publishing type：Research paper (scientific journal) Publisher：International Union of Crystallography
Exact and approximate mathematical formulas of equatorial aberration for powder diffraction data collected with an Si strip X-ray detector in continuous-scan integration mode are presented. An approximate formula is applied to treat the experimental data measured with a commercial powder diffractometer.
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Deconvolution–convolution treatment on powder diffraction data collected with CuKα X-ray and NiKβ filter Reviewed International journal
Takashi Ida, Shoki Ono, Daiki Hattan, Takehiro Yoshida, Yoshinobu Takatsu, Katsuhiro Nomura
Powder Diffraction 33 ( 2 ) 80 - 87 2018.06
Authorship：Lead author Language：English Publishing type：Research paper (scientific journal) Publisher：International Centre for Diffraction Data
A method to remove small CuKβ peaks and step structures caused by NiK-edge absorption as well as CuKα2 sub-peaks from powder diffraction intensity data measured with Cu-target X-ray source and Ni-foil filter is proposed. The method is based on deconvolution–convolution treatment applying scale transform of abscissa, Fourier transform, and a realistic spectroscopic model for the source X-ray. The validity of the method has been tested by analysis of the powder diffraction data of a standard LaB6 powder (NIST SRM660a) sample, collected with the combination of CuKα X-ray source, Ni-foil Kβ filter, flat powder specimen and one-dimensional Si strip detector. The diffraction intensity data treated with the method have certainly shown background intensity profile without CuKβ peaks and NiK-edge step structures.
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Improvement of deconvolution–convolution treatment of axial-divergence aberration in Bragg–Brentano geometry Reviewed International journal
Takashi Ida, Shoki Ono, Daiki Hattan, Takehiro Yoshida, Yoshinobu Takatsu, Katsuhiro Nomura
Powder Diffraction 33 ( 2 ) 121 - 133 2018.06
Authorship：Lead author Language：English Publishing type：Research paper (scientific journal) Publisher：International Centre for Diffraction Data
An improved method to correct observed shift and asymmetric deformation of diffraction peak profile caused by the axial-divergence aberration in Bragg–Brentano geometry is proposed. The method is based on deconvolution–convolution treatment applying scale transform of abscissa, Fourier transform, and cumulant analysis of an analytical model for the axial-divergence aberration. The method has been applied to the powder diffraction data of a standard LaB6 powder (NIST SRM660a) sample, collected with a one-dimensional Si strip detector. The locations, widths and shape of the peaks in the deconvolved–convolved powder diffraction data have been analyzed. The finally obtained whole powder diffraction pattern ranging from 10° to 145° in diffraction angle has been simulated by the Pawley method applying a symmetric Pearson VII peak profile model to each peak with ten background, two peak-shift, three line-width, and two peak-shape parameters, and the Rp value of the best fit has been estimated at 4.4%.
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Removal of small parasite peaks in powder diffraction data by a multiple deconvolution method Reviewed International journal
Takashi Ida, Shoki Ono, Daiki Hattan, Takehiro Yoshida, Yoshinobu Takatsu, Katsuhiro Nomura
Powder Diffraction 33 ( 2 ) 108 - 114 2018.06
Authorship：Lead author Language：English Publishing type：Research paper (scientific journal) Publisher：International Centre for Diffraction Data
Four series of small parasite peaks observed in powder diffraction data recorded with a Cu-target X-ray tube and a Ni filter on the diffracted beam side in Bragg–Brentano geometry are investigated. One series of the parasite peaks is assigned to the tungsten Lα-emission. Other three types of the parasite peak series are likely to be caused by the K-emissions of Ni, but the peak locations are deviated from those predicted by the Bragg's law. An empirical formula to locate the parasite peaks and a method to remove them from observed powder diffraction data are proposed. The method is based on the whole-pattern deconvolution–convolution treatment on the transformed scale of abscissa. The parameters optimized for the diffraction data measured for Si powder has been applied on treatment of the data of LaB6 powder recorded under the same experimental conditions. It has been confirmed that the parasite peaks in the observed data can effectively be removed by the deconvolution treatment with parameters determined by a reference measurement.
Books and Other Publications
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Handbook of Instrumental Analysis
Takashi Ida et al.（ Role： Contributor）
Kagaku Dojin 2021.03 （ ISBN:978-4-7598-2023-2 ）
Total pages：208 Responsible for pages：94-107 Language：jpn Book type：Scholarly book
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Fummatsu X-sen Kaiseki No Jissai "jointly worked"
Takashi Ida et al.（ Role： Joint author）
Asakura-shoten 2009.07 （ ISBN:9784254140828 ）
Language：jpn Book type：Scholarly book
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Nanoparticle Technology Handbook "jointly worked"
（ Role： Joint author）
2007.11 （ ISBN:9780444531223 ）
Language：eng Book type：Scholarly book
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Nanoparticle Technology Handbook "jointly worked"
Takashi Ida et al.（ Role： Joint author）
Nikkan Kogyo Shimbunsha 2006.04 （ ISBN:9784526056642 ）
Language：jpn Book type：Scholarly book
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Functionality of Material "jointly worked"
Takashi Ida et al.（ Role： Joint author）
Maruzen 1993.04 （ ISBN:4-621-03816-8 ）
Language：jpn Book type：Scholarly book
Misc
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Concept of deconvolution-convolution treatment on powder X-ray diffraction data Reviewed
Takashi Ida
Annual Report of Advanced Ceramics Research Center, Nagoya Institute of Technology 5 37 - 43 2017.06
Authorship：Lead author Language：Japanese Publishing type：Article, review, commentary, editorial, etc. (bulletin of university, research institution) Publisher：Advanced Ceramics Research Center, Nagoya Institute of Technology
This article introduces the core concept of a deconvolution-convolution treatment (DCT) on powder diffraction data, recently proposed by the author. The method is based on a realistic spectroscopic profile of X-ray and the results of cumulant analysis of a precise approximate formula for the axial-divergence aberration in Bragg-Brentano geometry. It is demonstrated that the powder diffraction data treated by the method show almost symmetric single peak profile, and small unwanted contamination peaks in the observed data are effectively removed by the method.
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Activities of ICDD Reviewed
Takashi Ida
Annual Report of Advanced Ceramics Research Center, Nagoya Institute of Technology 4 12 - 19 2016.07
Authorship：Lead author Language：Japanese Publishing type：Article, review, commentary, editorial, etc. (bulletin of university, research institution) Publisher：Advanced Ceramics Research Center, Nagoya Institute of Technology
The article is intended to describe the activities of the International Centre for Diffraction Data (ICDD). ICDD is a non-profit, non-governmental scientific organization, dedicated to collecting, editing, mainaining, publishing, and distributing powder diffraction data. The ICDD membership consisits of worldwide representation from academe, government, and industry. ICDD also provides assistance to the scientific community through a variety of approaches.
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Application of Bayesian inference to structure analysis Reviewed
Takashi Ida
Annual Report of Advanced Ceramics Research Center, Nagoya Institute of Technology 3 11 - 16 2015.07
Authorship：Lead author Language：Japanese Publishing type：Article, review, commentary, editorial, etc. (bulletin of university, research institution) Publisher：Advanced Ceramics Research Center, Nagoya Institute of Technology
The article describes basic concepts of statistical estimation based on experimental data, including (i) Bayesian inference, (ii) maximum a posteriori estimation, (iii) maximum likelihood estimation, (iv) least-squares estimation. It is emphasized that Bayesian inference is nothing but calculation of "conditional probability," which is written in textbooks of high-school mathematics in Japan. Bayesian approach allows prejudice, biased ideas, preconception, and never forces us to get rid of them. The basic concept of Bayesian inference explicitly assumes that we can never reach the absolute truth, but we can always approach to the truth at the same time. A simple implementation of Bayesian inference in crystal structure analysis based on X-ray diffraction measurements is proposed.
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入門講座 分析化学における放射光の利用 粉末X線回折
井田隆
2015年 ( 2月 ) 2015.02
Authorship：Lead author Language：Japanese Publishing type：Article, review, commentary, editorial, etc. (international conference proceedings) Publisher：日本分析化学会
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Advanced Methods for Powder Diffraction Anallysis - II
Takashi Ida
34 ( 4 ) 237 - 242 2014.12
Authorship：Lead author Language：English Publishing type：Article, review, commentary, editorial, etc. (international conference proceedings) Publisher：The Technical Association of Refractories, Japan
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Advanced Methods for Powder Diffraction Analysis - I
Takashi Ida
34 ( 4 ) 232 - 236 2014.12
Authorship：Lead author Language：English Publishing type：Article, review, commentary, editorial, etc. (international conference proceedings) Publisher：The Technical Association of Refractories, Japan
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Evaluation of Crystallite Size by X-ray Diffraction Method
Takashi Ida
Bulletin of The Ceramic Society of Japan 49 ( 3 ) 157 - 162 2014.03
Authorship：Lead author Language：Japanese Publishing type：Article, review, commentary, editorial, etc. (international conference proceedings) Publisher：The Ceramic Society of Japan
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Advanced methods for powder diffraction analysis - II
Takashi Ida
TAIKABUTSU 65 ( 10 ) 470 - 475 2013.10
Authorship：Lead author Language：Japanese Publishing type：Article, review, commentary, editorial, etc. (bulletin of university, research institution)
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Advanced methods for powder diffraction analysis - I
Takashi Ida
TAIKABUTSU 65 ( 8 ) 348 - 353 2013.08
Authorship：Lead author Language：Japanese Publishing type：Article, review, commentary, editorial, etc. (international conference proceedings)
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Particle statistics in synchrotron powder diffractometry
T. Ida, T. Goto, A. Oya, H. Hibino
27 ( B ) 271 - 271 2011.03
Authorship：Lead author Language：English Publishing type：Article, review, commentary, editorial, etc. (other) Publisher：Photon Factory
Presentations
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Bragg-Brentano 型 XRD 測定システムの軸発散収差
井田隆
日本結晶学会年会 2023.10 日本結晶学会
Event date： 2023.10
Language：Japanese Presentation type：Oral presentation (general)
Venue：山口大学常盤キャンパス（宇部） Country：Japan
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Powder diffraction intensities of α-Al2O3 International conference
Takashi Ida
IUCr Congress 2023 2023.08
Event date： 2023.08
Language：English Presentation type：Poster presentation
Venue：Melbourne Country：Australia
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Which is the strongest peak among 104, 113 & 116-reflections of corundum? International conference
Takashi Ida
ICDD Spring Meetings 2023.03 International Centre for Diffraction Data
Event date： 2023.03
Language：English Presentation type：Poster presentation
Venue：Concordville, PA Country：United States
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コランダム回折強度の密度汎函数理論計算
井田隆
日本結晶学会年会 2022.11 日本結晶学会
Event date： 2022.11
Language：Japanese Presentation type：Poster presentation
Venue：西宮 Country：Japan
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反射型粉末回折測定における有限な試料厚さと試料幅の効果
井田隆
日本結晶学会年会 2022.11 日本結晶学会
Event date： 2022.11
Language：Japanese Presentation type：Oral presentation (general)
Venue：西宮 Country：Japan
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Effect of finite width of specimen on sample transparency aberration in Bragg-Brentano geometry International conference
Takashi Ida
Denver X-ray Conference 2022.08 International Centre for Diffraction Data
Event date： 2022.08
Language：English Presentation type：Oral presentation (general)
Venue：Bethesda, MD Country：United States
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集中法反射型粉末回折測定における有限厚さ試料の透過性の効果
井田 隆
日本結晶学会年会 日本結晶学会
Event date： 2021.11
Language：Japanese Presentation type：Oral presentation (general)
Venue：オンライン
反射型の粉末回折測定では，通常はＸ線侵入深さに比べて試料が充分な厚みを持つことを前提とする。試料の厚さが有限な場合，試料の透過性の効果は，回折角依存性の異なる減衰効果と打ち切り効果の二重の畳込として表現される。打ち切り効果に関する逆畳込的処理はピークのブロードニングをもたらすが，ピーク形状が尖鋭化し，ピーク分離の目的で不利にならないことがわかった。
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シリコンストリップ型Ｘ線検出器の連続走査積算により収集された粉末回折データにおける赤道収差
井田 隆
日本結晶学会年会 日本結晶学会
Event date： 2020.11
Language：Japanese Presentation type：Oral presentation (general)
Venue：オンライン
シリコンストリップ型Ｘ線検出器の連続走査積算により収集された粉末回折データにおける赤道収差の数学的な形式と逆畳み込み的な処理について述べた。
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Equatorial Aberration for Powder Diffraction Data Collected by Continuous Scan of a Silicon Strip X-ray Detector International conference
T. Ida
Denver X-ray Conference International Centre for Diffraction Data
Event date： 2020.08
Language：English Presentation type：Oral presentation (general)
Venue：Virtual event
Current data acquisition system of a laboratory powder X-ray diffractometer with a silicon strip X-ray detector (SSXD) usually support a continuous scan integration method, where output counts from each of detector strips are added to the total counts for appropriate -bin of the output data storage. An explicit approximate formula of the equatorial aberration function has been derived.
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Treatment of powder X-ray diffraction data collected with a Bragg-Brentano diffractometer with a Cu K X-ray source and a Ni-foil filter International conference
Takashi Ida
AsCA 2019
Event date： 2019.12
Language：English Presentation type：Poster presentation
Industrial Property Rights
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Crystallite size analysis method and apparatus using powder x-ray diffraction
Takashi Ida, Licai Jiang
Application no：12/560,803 Date applied：2009.09
Announcement no：US 2011/0064199 A1 Date announced：2011.03
Country of applicant：Foreign country Country of acquisition：Foreign country
Awards
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Best Poster Award in ICDD Spring Meetings
2017.03 International Centre for Diffraction Data Decontamination of powder diffraction data measured with copper Kalpha x-ray and nickel filter
Takashi Ida
Award type：Award from international society, conference, symposium, etc. Country：United States
A new method to remove small peaks caused by contamination of x-ray source tube has been developed and demonstrated.
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Ｒｉｃｈａｒｄ and Patricia Spriggs Phase Equillibria Award
2010.10 The Americal Ceramic Society
Genki Kobayashi, Shin-ichi Nishimura, Min-Sik Park, Ryoji Kanno, Masatomo Yashima, Takashi Ida, Atsuo Yamada
Award type：International academic award (Japan or overseas) Country：United States
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ICDD Fellow
2010.03 International Centre for Diffraction Data
Takashi Ida
Award type：International academic award (Japan or overseas) Country：United States
Scientific Research Funds Acquisition Results
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逆畳み込み・畳み込み法による粉末Ｘ線回折データ処理ソフトウェアの開発
2019.04 - 2022.03
科学研究費補助金 基盤研究(B)
井田隆
粉末Ｘ線回折データを処理するために申請者が独自の発想による高速フーリエ変換アルゴリズムとスケール変換処理を用いた装置収差除去ソフトウェアを実用的なアプリケーションプログラムとして開発する。
Committee Memberships
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分析化学会Ｘ線分析研究懇談会 幹事
2019.04
Committee type：Academic society
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国際回折データセンター（ＩＣＤＤ） Director at Large
2016.03
Committee type：Other
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国際結晶学連合（ＩＵＣｒ） Committee member of Commision on Powder Diffraction
2014.08
Committee type：Academic society
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日本結晶学会 情報委員
2010.04 - 2012.03
Committee type：Academic society
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国際回折データセンター（ＩＣＤＤ） Regional Co-chair of Eastern Pacific Rim
2008.03
Committee type：Other
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日本セラミックス協会 東海支部ホームページ委員長
2006.06 - 2021.03
Committee type：Academic society
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日本セラミックス協会 東海支部ＩＴ推進委員
2006.05
Committee type：Academic society
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日本セラミックス協会 東海支部幹事
2005.02
Committee type：Academic society