Papers - YANO Yusuke
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Mixed Mode S Parameter Characteristics of T1+1 Cables Installed at Different Height Reviewed
Hajime Kimura, Yusuke Yano, Osami Wada, Jianqing Wang
2025 Asia-Pacific International Symposium and Exhibition on Electromagnetic Compatibility 2025.05
Language：English Publishing type：Research paper (international conference proceedings)
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Measurement Method for Mixed-Mode S-Parameters of Termination Structure in Differential Communication Line Reviewed
Masahiro Yoshida, Yusuke Yano, Jianqing Wang
IEEE Transactions on Electromagnetic Compatibility 67 ( 2 ) 362 - 373 2025.04
Language：English Publishing type：Research paper (scientific journal)
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Investigation of Issues in Electrostatic Discharge Testing for Automotive Ethernet Transceiver ICs and Electronic Components Reviewed
Jianqing Wang, Yusuke Yano
IEICE Transactions on Communications J108-B ( 2 ) 13 - 22 2024.12
Authorship：Last author Language：Japanese Publishing type：Research paper (scientific journal)
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Improvement of ESD Damage Test Board for CMC for Automotive Ethernet Reviewed
Hironori Ito, Yusuke Yano, Takeshi Ishida, and Jianqing Wang
IEEE Letters on Electromagnetic Compatibility Practice and Applications 6 ( 3 ) 89 - 95 2024.09
Authorship：Corresponding author Language：English Publishing type：Research paper (scientific journal)
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A study on Reducing Cable Length Dependence for Automotive Ethernet EMC Evaluation Reviewed
Hideki Iwasaki, Yusuke Yano, Jianqing Wang
2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan/Asia-Pacific International Symposium on Electromagnetic Compatibility FriAM1B.5 656 - 656 2024.05
Authorship：Corresponding author Language：English Publishing type：Research paper (international conference proceedings)
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Extraction of Parasitic Impedance Difference between Electronic Device Test Boards Reviewed
Yoshika Iwaoka, Yusuke Yano, Jianqing Wang
2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan/Asia-Pacific International Symposium on Electromagnetic Compatibility ThuPM1A.5 582 - 582 2024.05
Authorship：Corresponding author Language：English Publishing type：Research paper (international conference proceedings)
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Measurement Method for Mixed-Mode S-Parameters of Termination Structures in Differential Communication Line Reviewed
Masahiro Yoshida, Yusuke Yano, Jianqing Wang
2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan/Asia-Pacific International Symposium on Electromagnetic Compatibility WedPM1A.2 337 - 337 2024.05
Authorship：Corresponding author Language：English Publishing type：Research paper (international conference proceedings)
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Conducted Emission Evaluation of 1000BASE-RH Optical Ethernet Transceivers Reviewed
Osami Wada, Yusuke Yano
2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan/Asia-Pacific International Symposium on Electromagnetic Compatibility WedAM1D.3 275 - 278 2024.05
Authorship：Last author Language：English Publishing type：Research paper (international conference proceedings)
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Circuit Model Construction for Simulating ESD Discharge Current Flowing through CMCs and ESD Suppression Devices Reviewed
Hironori Ito, Shoma Ishihara, Yusuke Yano, Jianqing Wang
2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan/Asia-Pacific International Symposium on Electromagnetic Compatibility WedAM1D.5 283 - 286 2024.05
Authorship：Corresponding author Language：English Publishing type：Research paper (international conference proceedings)
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Batteryless BLE Module with a Piezoelectric Element Mounted on a Shoe Sole Reviewed
Shusei Dan, Yusuke Yano, Jianqing Wang
Sensors 24 ( 2829 ) 1 - 13 2024.04
Authorship：Corresponding author Language：English Publishing type：Research paper (scientific journal)
DOI： 10.3390/s24092829
DOI： 10.3390/s24092829
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Measurement of Current Waveform Due to Different Load of ESD Gun, TLP-HMM, and CR-HMM Invited Reviewed
Masahiro Yoshida, Yusuke Yano, Takeshi Ishida, Jianqing Wang
2023 45th Annual EOS/ESD Symposium (EOS/ESD) 2023.10
Authorship：Corresponding author Language：English Publishing type：Research paper (international conference proceedings)
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Influence of cable length between TLP test system and DUT and its correction for CMC ESD saturation measurement Reviewed
Yusuke Yano, Kazuha Ishida, Jianqing Wang, Takeshi Ishida
IEICE Communications Express 1 - 7 2023.09
Authorship：Lead author Language：English Publishing type：Research paper (scientific journal)
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Cable Height Dependence in Radiated Immunity Evaluation of Automotive Ethernet 100BASE-T1 Reviewed
Tohlu Matsushima, Akito Kagawa, Yusuke Yano, Yuki Fukumoto
35th URSI General Assembly and Scientific Symposium (URSI GASS 2023) E08-4 2023.08
Language：English Publishing type：Research paper (international conference proceedings)
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Investigation of Reducing Test System Dependence for Automotive Ethernet EMC Evaluation Reviewed
Yusuke Yano, Hideki Iwasaki, and Jianqing Wang
2023 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI) 624 - 624 2023.08
Authorship：Lead author Language：English Publishing type：Research paper (international conference proceedings)
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Improvement of TLP-HMM’s Load Dependence Reviewed
Masahiro Yoshida, Yusuke Yano, Takeshi Ishida, and Jianqing Wang
2023 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI) 381 - 381 2023.08
Authorship：Corresponding author Language：English Publishing type：Research paper (international conference proceedings)
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Comparison of ESD Damage Test for Common Mode Chokes with ESD Gun and TLP-HMM Reviewed
Hironiori Ito, Masahiro Yoshida, Yusuke Yano, Jianqing Wang, Takeshi Ishida, Masanori Sawada
IEEE Letters on Electromagnetic Compatibility Practice and Applications (L-EMCPA) 5 ( 1 ) 10 - 15 2023.03
Authorship：Corresponding author Language：English Publishing type：Research paper (scientific journal)
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On-Chip Power Integrity Simulation Using LSI-Core Macromodels Considering Voltage Fluctuations Caused by Inter-Function-Block Interference Reviewed
Hiroshi Tanaka, Tohlu Matsushima, Yusuke Yano, Osami Wada
IEEE Transactions on Electromagnetic Compatibility 65 ( 1 ) 334 - 342 2023.02
Language：English Publishing type：Research paper (scientific journal)
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Measurement Method for Mode Conversion of Differential Communication Line Termination Structures Reviewed
Masahiro Yoshida, Yusuke Yano, Jianqing Wang, Takeshi Ishida
IEICE Transactions on Communications J105-B ( 12 ) 928 - 937 2022.12
Authorship：Corresponding author Language：Japanese Publishing type：Research paper (scientific journal)
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Influence of Cable Length Between TLP and DUT on ESD Saturation Measurement Reviewed International journal
Yusuke Yano, Jianqing Wang, Takeshi Ishida
2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC 2022) 1 - 1 2022.09
Authorship：Lead author, Corresponding author Language：English Publishing type：Research paper (international conference proceedings)
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Dependence of Disturbance Injection Characteristics of Tubular Wave Coupler on Test Setup Reviewed
Yusuke Yano, Kota Endo, Osami Wada
IEICE Transactions on Communications J105-B ( 8 ) 621 - 628 2022.08
Authorship：Lead author, Corresponding author Language：Japanese Publishing type：Research paper (scientific journal)
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Measurement of Current Waveform Due to Different Load of ESD Gun, TLP-HMM, and CR-HMM Reviewed
Masahiro Yoshida, Yusuke Yano, Takeshi Ishida, Jianqing Wang
2022 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI) ( TP-TH-PM2-TC2 ) 603 - 603 2022.08
Language：English Publishing type：Research paper (international conference proceedings)
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Challenges of Powered ESD Testing for Automotive Ethernet Transceiver ICs Invited Reviewed
Yusuke Yano, Jianqing Wang
Journal of The Japan Institute of Electronics Packaging 25 ( 4 ) 290 - 294 2022.07
Authorship：Lead author, Corresponding author Language：Japanese Publishing type：Research paper (scientific journal)
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Compensating Method of Equivalent Current Sources of LSI-core Macro-model Considering Voltage Fluctuations in On-chip Power Distribution Network Reviewed International journal
Hiroshi Tanaka, Tohlu Matsushima, Yusuke Yano, Osami Wada
IEEE Transactions on Electromagnetic Compatibility 64 ( 4 ) 1250 - 1256 2022.03
Language：English Publishing type：Research paper (scientific journal)
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Common-mode Reduction Method of LVDS by Imbalance Difference Control Reviewed
Osami Wada, Hiroaki Saito, Yusuke Yano, Takashi Hisakado, Tohlu Matsushima
J104-B ( 6 ) 453 - 460 2021.06
Language：Japanese Publishing type：Research paper (scientific journal)
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Evaluation of Side-channel Leakage Simulation by Using EMC Macro-model of Cryptographic Devices Reviewed
Yusuke Yano, Kengo Iokibe, Toshiaki Teshima, Yoshitaka Toyota, Toshihiro Katashita and Yohei Hori
IEICE TRANSACTIONS on Communications E104.B ( 2 ) 178 - 186 2021.02
Authorship：Lead author Language：English Publishing type：Research paper (scientific journal)
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Experimental investigation of communication quality degradation of 1000BASE-T1 by pulse disturbance Reviewed
Yusuke Yano, Tohlu Matsushima and Osami Wada
IEICE Communication Express (ComEX) 9 ( 12 ) 593 - 598 2020.12
Authorship：Lead author Language：English Publishing type：Research paper (scientific journal)
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Investigation of Communication Quality Degradation of 1000BASE-T1 by Pulse Disturbance Reviewed International journal
Yusuke Yano, Takashi Hisakado and Wada Osami
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE 2020.09
Authorship：Lead author Language：English Publishing type：Research paper (international conference proceedings)
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Dimension Dependence of Transfer Characteristics of Tubular Wave Coupler and Improvement of Directivity Reviewed International journal
Kota Endo, Yusuke Yano and Osami Wada
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE 2020.09
Language：English Publishing type：Research paper (international conference proceedings)
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Modifying Noise Source Amplitude Modulation Technique to Estimate Magnitude and Phase of Emissions from Individual Integrated Circuits Reviewed International journal
Kengo Iokibe, Shimpei Yoshino, Yusuke Yano and Yoshitaka Toyota
2019 International Symposium on Electromagnetic Compatibility - EMC EUROPE 2019.09
Language：English Publishing type：Research paper (international conference proceedings)
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A Method for Optimally Designing Snubber Circuits for Buck Converter Circuits to Damp LC Resonance Reviewed International journal
Yusuke Yano, Naoki Kawata, Kengo Iokibe and Yoshitaka Toyota
IEEE Transactions on Electromagnetic Compatibility 61 ( 4 ) 1217 - 1225 2019.08
Authorship：Lead author Language：English Publishing type：Research paper (scientific journal)
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Experimental Identification of Relationship between Leakage Trace SNR and Correlation Coefficient in Differential Power Analysis Reviewed International journal
Yusuke Yano, Toshiaki Teshima, Kengo Iokibe and Yoshitaka Toyota
2019 Joint International Symposium on Electromagnetic Compatibility and Asia-Pacific International Symposium on Electromagnetic Compatibility, Sapporo (EMC Sapporo & APEMC 2019) 2019.06
Authorship：Lead author Language：English Publishing type：Research paper (international conference proceedings)
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Improvement of Prediction Accuracy of Noise-source Equivalent-circuit Model Based on Parameter Extraction by Port Voltage/Current Measurement Reviewed International journal
Uematsu Taishi, Yuhei Osaki, Yoshitaka Toyota, Yusuke Yano, Kengo Iokibe
2019 Joint International Symposium on Electromagnetic Compatibility and Asia-Pacific International Symposium on Electromagnetic Compatibility, Sapporo (EMC Sapporo & APEMC 2019) 2019.06
Language：English Publishing type：Research paper (international conference proceedings)
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Intensity Estimation of Electromagnetic Emission from Individual ICs Based on Noise Source Amplitude Modulation and Correlation Analysis Reviewed
Shimpei YOSHINO, Kengo IOKIBE, Yusuke YANO, and Yoshitaka TOYOTA
Journal of The Japan Institute of Electronics Packaging 22 ( 3 ) 218 - 225 2019.05
Language：Japanese Publishing type：Research paper (scientific journal)
DOI： 10.5104/jiep.22.218
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Extension of Signal-to-Noise Ratio Measurement Method to Byte-by-Byte Side-Channel Attack Reviewed International journal
Kengo Iokibe, Toshiaki Teshima, Yusuke Yano and Yoshitaka Toyota
2018 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC 2018) 2018.05
Language：English Publishing type：Research paper (international conference proceedings)
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Parameter Identification of Noise-source Linear Equivalent Circuit of DC-DC Converter and Its Evaluation Reviewed International journal
Yuhei Osaki, Yusuke Yano, Kengo Iokibe and Yoshitaka Toyota
2017 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC 2017) 2017.06
Language：English Publishing type：Research paper (international conference proceedings)
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A Study of Linear Equivalent Circuit Modeling for Conducted Disturbance Estimation of Power Converter Circuit Reviewed International journal
Yusuke Yano, Hiroki Geshi, Kengo Iokibe, Tetsushi Watanabe and Yoshitaka Toyota
2016 URSI Asia-Pacific Radio Science Conference (AP-RASC 2016) 2016.08
Authorship：Lead author Language：English Publishing type：Research paper (international conference proceedings)
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Signal-to-Noise Ratio Measurements of Side-Channel Traces for Establishing Low-Cost Countermeasure Design Reviewed International journal
Yusuke Yano, Toshiaki Teshima, Kengo Iokibe and Yoshitaka Toyota
2017 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC 2017) 2012.06
Authorship：Lead author Language：English Publishing type：Research paper (international conference proceedings)
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Insertion of Parallel RL Circuits into Power Distribution Network for Simultaneous Switching Current Reduction and Power Integrity Reviewed International journal
Kengo Iokibe, Yusuke Yano and Yoshitaka Toyota
2012 Asia-Pacific Internationl Symposium on Electromagnetic Compatibility in Singapore (APEMC 2012) 2012.05
Language：English Publishing type：Research paper (international conference proceedings)
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Increase of RF Power Current Due to Coupling between Power Distribution and IO Networks Reviewed International journal
Kengo Iokibe, Yusuke Yano, Yoshitaka Toyota and Ryuji Koga
2010 Asia-Pacific Radio Science Conference (AP-RASC'10) 2010.09
Language：English Publishing type：Research paper (international conference proceedings)
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