Papers - YANO Yusuke
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Mixed Mode S Parameter Characteristics of T1+1 Cables Installed at Different Height Reviewed
Hajime Kimura, Yusuke Yano, Osami Wada, Jianqing Wang
2025 Asia-Pacific International Symposium and Exhibition on Electromagnetic Compatibility 2025.05
Language：English Publishing type：Research paper (international conference proceedings)
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Measurement Method for Mixed-Mode S-Parameters of Termination Structure in Differential Communication Line Reviewed
Masahiro Yoshida, Yusuke Yano, Jianqing Wang
IEEE Transactions on Electromagnetic Compatibility 67 ( 2 ) 362 - 373 2025.04
Language：English Publishing type：Research paper (scientific journal)
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Investigation of Issues in Electrostatic Discharge Testing for Automotive Ethernet Transceiver ICs and Electronic Components Reviewed
Jianqing Wang, Yusuke Yano
IEICE Transactions on Communications J108-B ( 2 ) 13 - 22 2024.12
Authorship：Last author Language：Japanese Publishing type：Research paper (scientific journal)
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Improvement of ESD Damage Test Board for CMC for Automotive Ethernet Reviewed
Hironori Ito, Yusuke Yano, Takeshi Ishida, and Jianqing Wang
IEEE Letters on Electromagnetic Compatibility Practice and Applications 6 ( 3 ) 89 - 95 2024.09
Authorship：Corresponding author Language：English Publishing type：Research paper (scientific journal)
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A study on Reducing Cable Length Dependence for Automotive Ethernet EMC Evaluation Reviewed
Hideki Iwasaki, Yusuke Yano, Jianqing Wang
2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan/Asia-Pacific International Symposium on Electromagnetic Compatibility FriAM1B.5 656 - 656 2024.05
Authorship：Corresponding author Language：English Publishing type：Research paper (international conference proceedings)
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Extraction of Parasitic Impedance Difference between Electronic Device Test Boards Reviewed
Yoshika Iwaoka, Yusuke Yano, Jianqing Wang
2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan/Asia-Pacific International Symposium on Electromagnetic Compatibility ThuPM1A.5 582 - 582 2024.05
Authorship：Corresponding author Language：English Publishing type：Research paper (international conference proceedings)
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Measurement Method for Mixed-Mode S-Parameters of Termination Structures in Differential Communication Line Reviewed
Masahiro Yoshida, Yusuke Yano, Jianqing Wang
2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan/Asia-Pacific International Symposium on Electromagnetic Compatibility WedPM1A.2 337 - 337 2024.05
Authorship：Corresponding author Language：English Publishing type：Research paper (international conference proceedings)
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Conducted Emission Evaluation of 1000BASE-RH Optical Ethernet Transceivers Reviewed
Osami Wada, Yusuke Yano
2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan/Asia-Pacific International Symposium on Electromagnetic Compatibility WedAM1D.3 275 - 278 2024.05
Authorship：Last author Language：English Publishing type：Research paper (international conference proceedings)
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Circuit Model Construction for Simulating ESD Discharge Current Flowing through CMCs and ESD Suppression Devices Reviewed
Hironori Ito, Shoma Ishihara, Yusuke Yano, Jianqing Wang
2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan/Asia-Pacific International Symposium on Electromagnetic Compatibility WedAM1D.5 283 - 286 2024.05
Authorship：Corresponding author Language：English Publishing type：Research paper (international conference proceedings)
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Batteryless BLE Module with a Piezoelectric Element Mounted on a Shoe Sole Reviewed
Shusei Dan, Yusuke Yano, Jianqing Wang
Sensors 24 ( 2829 ) 1 - 13 2024.04
Authorship：Corresponding author Language：English Publishing type：Research paper (scientific journal)
DOI： 10.3390/s24092829
DOI： 10.3390/s24092829
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Measurement of Current Waveform Due to Different Load of ESD Gun, TLP-HMM, and CR-HMM Invited Reviewed
Masahiro Yoshida, Yusuke Yano, Takeshi Ishida, Jianqing Wang
2023 45th Annual EOS/ESD Symposium (EOS/ESD) 2023.10
Authorship：Corresponding author Language：English Publishing type：Research paper (international conference proceedings)
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Influence of cable length between TLP test system and DUT and its correction for CMC ESD saturation measurement Reviewed
Yusuke Yano, Kazuha Ishida, Jianqing Wang, Takeshi Ishida
IEICE Communications Express 1 - 7 2023.09
Authorship：Lead author Language：English Publishing type：Research paper (scientific journal)
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Cable Height Dependence in Radiated Immunity Evaluation of Automotive Ethernet 100BASE-T1 Reviewed
Tohlu Matsushima, Akito Kagawa, Yusuke Yano, Yuki Fukumoto
35th URSI General Assembly and Scientific Symposium (URSI GASS 2023) E08-4 2023.08
Language：English Publishing type：Research paper (international conference proceedings)
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Investigation of Reducing Test System Dependence for Automotive Ethernet EMC Evaluation Reviewed
Yusuke Yano, Hideki Iwasaki, and Jianqing Wang
2023 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI) 624 - 624 2023.08
Authorship：Lead author Language：English Publishing type：Research paper (international conference proceedings)
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Improvement of TLP-HMM’s Load Dependence Reviewed
Masahiro Yoshida, Yusuke Yano, Takeshi Ishida, and Jianqing Wang
2023 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI) 381 - 381 2023.08
Authorship：Corresponding author Language：English Publishing type：Research paper (international conference proceedings)
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Comparison of ESD Damage Test for Common Mode Chokes with ESD Gun and TLP-HMM Reviewed
Hironiori Ito, Masahiro Yoshida, Yusuke Yano, Jianqing Wang, Takeshi Ishida, Masanori Sawada
IEEE Letters on Electromagnetic Compatibility Practice and Applications (L-EMCPA) 5 ( 1 ) 10 - 15 2023.03
Authorship：Corresponding author Language：English Publishing type：Research paper (scientific journal)
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On-Chip Power Integrity Simulation Using LSI-Core Macromodels Considering Voltage Fluctuations Caused by Inter-Function-Block Interference Reviewed
Hiroshi Tanaka, Tohlu Matsushima, Yusuke Yano, Osami Wada
IEEE Transactions on Electromagnetic Compatibility 65 ( 1 ) 334 - 342 2023.02
Language：English Publishing type：Research paper (scientific journal)
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Measurement Method for Mode Conversion of Differential Communication Line Termination Structures Reviewed
Masahiro Yoshida, Yusuke Yano, Jianqing Wang, Takeshi Ishida
IEICE Transactions on Communications J105-B ( 12 ) 928 - 937 2022.12
Authorship：Corresponding author Language：Japanese Publishing type：Research paper (scientific journal)
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Influence of Cable Length Between TLP and DUT on ESD Saturation Measurement Reviewed International journal
Yusuke Yano, Jianqing Wang, Takeshi Ishida
2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC 2022) 1 - 1 2022.09
Authorship：Lead author, Corresponding author Language：English Publishing type：Research paper (international conference proceedings)
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Dependence of Disturbance Injection Characteristics of Tubular Wave Coupler on Test Setup Reviewed
Yusuke Yano, Kota Endo, Osami Wada
IEICE Transactions on Communications J105-B ( 8 ) 621 - 628 2022.08
Authorship：Lead author, Corresponding author Language：Japanese Publishing type：Research paper (scientific journal)
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