YANO Yusuke

写真a

Affiliation Department

Department of Electrical and Mechanical Engineering
Department of Electrical and Mechanical Engineering
Center for Future Communications Research

Title

Assistant Professor

Contact information

Contact information

Homepage

https://wlab.web.nitech.ac.jp/wp/

External Link

Degree

  • Ph.D. in Engineering ( 2019.03   Okayama University )

Research Areas

  • Manufacturing Technology (Mechanical Engineering, Electrical and Electronic Engineering, Chemical Engineering) / Electron device and electronic equipment

From School

  • Okayama University   Faculty of Engineering   Department of Communication and Network Engineering   Graduated

    2008.04 - 2010.03

      More details

    Country:Japan

From Graduate School

  • Okayama University   Graduate School, Division of Science and Technology   Division of Electronic and Information Systems Engineering   Master's Course   Completed

    2010.04 - 2012.03

      More details

    Country:Japan

  • Okayama University   Graduate School, Division of Science and Technology   Division of Industrial Innovation Sciences   Doctor's Course   Completed

    2015.10 - 2019.03

      More details

    Country:Japan

External Career

  • Kyoto University   Graduate School of Engineering, Department of Electrical Engineering   Researcher

    2019.04 - 2021.02

      More details

    Country:Japan

  • Sumitomo Electric Industries, Ltd.   Technical Support Staff

    2012.04 - 2015.09

      More details

    Country:Japan

Professional Memberships

  • IEEE

    2020.08

  • JASPAR(Japan Automotive Software Platform and Architecture)

    2019.12

  • The Institute of Electronics, Information and Communication Engineers

    2016.01

 

Papers

  • Measurement of Current Waveform Due to Different Load of ESD Gun, TLP-HMM, and CR-HMM Invited Reviewed

    Masahiro Yoshida, Yusuke Yano, Takeshi Ishida, Jianqing Wang

    2023 45th Annual EOS/ESD Symposium (EOS/ESD)   2023.10

     More details

    Authorship:Corresponding author   Language:English   Publishing type:Research paper (international conference proceedings)  

  • Influence of cable length between TLP test system and DUT and its correction for CMC ESD saturation measurement Reviewed

    Yusuke Yano, Kazuha Ishida, Jianqing Wang, Takeshi Ishida

    IEICE Communications Express   1 - 7   2023.09

     More details

    Authorship:Lead author   Language:English   Publishing type:Research paper (scientific journal)  

    DOI: 10.1587/comex.2023XBL0064

    DOI: 10.1587/comex.2023XBL0064

  • Investigation of Reducing Test System Dependence for Automotive Ethernet EMC Evaluation Reviewed

    Yusuke Yano, Hideki Iwasaki, and Jianqing Wang

    2023 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI)   624 - 624   2023.08

     More details

    Authorship:Lead author   Language:English   Publishing type:Research paper (international conference proceedings)  

  • Improvement of TLP-HMM’s Load Dependence Reviewed

    Masahiro Yoshida, Yusuke Yano, Takeshi Ishida, and Jianqing Wang

    2023 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI)   381 - 381   2023.08

     More details

    Authorship:Corresponding author   Language:English   Publishing type:Research paper (international conference proceedings)  

  • Cable Height Dependence in Radiated Immunity Evaluation of Automotive Ethernet 100BASE-T1 Reviewed

    Tohlu Matsushima, Akito Kagawa, Yusuke Yano, Yuki Fukumoto

    35th URSI General Assembly and Scientific Symposium (URSI GASS 2023)   E08-4   2023.08

     More details

    Language:English   Publishing type:Research paper (international conference proceedings)  

  • Comparison of ESD Damage Test for Common Mode Chokes with ESD Gun and TLP-HMM Reviewed

    Hironiori Ito, Masahiro Yoshida, Yusuke Yano, Jianqing Wang, Takeshi Ishida, Masanori Sawada

    IEEE Letters on Electromagnetic Compatibility Practice and Applications (L-EMCPA)   5 ( 1 )   10 - 15   2023.03

     More details

    Authorship:Corresponding author   Language:English   Publishing type:Research paper (scientific journal)  

    DOI: 10.1109/LEMCPA.2022.3222019

  • On-Chip Power Integrity Simulation Using LSI-Core Macromodels Considering Voltage Fluctuations Caused by Inter-Function-Block Interference Reviewed

    Hiroshi Tanaka, Tohlu Matsushima, Yusuke Yano, Osami Wada

    IEEE Transactions on Electromagnetic Compatibility   65 ( 1 )   334 - 342   2023.02

     More details

    Language:English   Publishing type:Research paper (scientific journal)  

    DOI: 10.1109/TEMC.2022.3224704

    DOI: 10.1109/TEMC.2022.3224704

  • Measurement Method for Mode Conversion of Differential Communication Line Termination Structures Reviewed

    Masahiro Yoshida, Yusuke Yano, Jianqing Wang, Takeshi Ishida

    IEICE Transactions on Communications   J105-B ( 12 )   928 - 937   2022.12

     More details

    Authorship:Corresponding author   Language:Japanese   Publishing type:Research paper (scientific journal)  

    DOI: 10.14923/transcomj.2022JBP3020

    DOI: 10.14923/transcomj.2022JBP3020

  • Influence of Cable Length Between TLP and DUT on ESD Saturation Measurement Reviewed International journal

    Yusuke Yano, Jianqing Wang, Takeshi Ishida

    2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC 2022)   1 - 1   2022.09

     More details

    Authorship:Lead author, Corresponding author   Language:English   Publishing type:Research paper (international conference proceedings)  

  • Dependence of Disturbance Injection Characteristics of Tubular Wave Coupler on Test Setup Reviewed

    Yusuke Yano, Kota Endo, Osami Wada

    IEICE Transactions on Communications   J105-B ( 8 )   621 - 628   2022.08

     More details

    Authorship:Lead author, Corresponding author   Language:Japanese   Publishing type:Research paper (scientific journal)  

    DOI: 10.14923/transcomj.2021PEP0006

display all >>

Presentations

  • A Study on Measurement Method for Mixed-Mode S Parameter of Termination Structures in Differential Communication Line

    Masahiro Yoshida, Yusuke Yano, Jianqing Wang

    IEICE Technical Committee on Electromagnetic Compatibility  2023.11  IEICE Technical Committee on Electromagnetic Compatibility

     More details

    Event date: 2023.11

    Language:Japanese   Presentation type:Oral presentation (general)  

    Venue:Tokyo   Country:Japan  

  • 直接放電試験の信頼性向上のためのTLP-HMM適用事例・課題とその改善検討 Invited

    矢野佑典

    第33回RCJ信頼性シンポジウム  2023.11  一般財団法人日本電子部品信頼性センター

     More details

    Event date: 2023.11

    Language:Japanese   Presentation type:Oral presentation (invited, special)  

    Venue:東京   Country:Japan  

  • Study of Battery-less of BLE Module by Piezoelectric Element Mounted on Shoe Sole

    Syusei Dan, Yusuke Yano, Jianqing Wang

    IEICE Technical Committee on Electromagnetic Compatibility  2023.10  IEICE Technical Committee on Electromagnetic Compatibility

     More details

    Event date: 2023.10

    Language:Japanese   Presentation type:Oral presentation (general)  

    Venue:Yonezawa   Country:Japan  

  • Study of ESD Discharge Current Test Board for ESD Suppression Devices for Automotive Ethernet

    Shoma Ishihara, Yusuke Yano, and Jianqing Wang

    IEICE Technical Committee on Electromagnetic Compatibility  2023.06  IEICE Technical Committee on Electromagnetic Compatibility

     More details

    Event date: 2023.06

    Language:Japanese   Presentation type:Oral presentation (general)  

    Venue:Otaru   Country:Japan  

  • 差動通信線終端構造に対するモード変換量測定方法

    吉田 征弘, 矢野 佑典, 王 建青, 石田 武志

    自動車技術会2023年春季大会  2023.05  自動車技術会

     More details

    Event date: 2023.05 - 2024.05

    Language:Japanese   Presentation type:Poster presentation  

    Venue:横浜   Country:Japan  

  • Investigation of Common Mode Termination Matching for Reducing System Dependence in EMC Testing of Automotive Communications

    Hideki Iwasaki, Yusuke Yano, Jianqing Wang

    IEICE Technical Committee on Electromagnetic Compatibility  2023.05  IEICE Technical Committee on Electromagnetic Compatibility

     More details

    Event date: 2023.05

    Language:Japanese   Presentation type:Oral presentation (general)  

    Venue:Naha   Country:Japan  

  • Improvement of ESD Damage Test Board for CMC for Automobile Ethernet

    Hironori Ito, Yusuke Yano, Jianqing Wang, Takeshi Ishida

    2023 IEICE General Conference  2023.03  IEICE

     More details

    Event date: 2023.03

    Language:Japanese   Presentation type:Oral presentation (general)  

    Venue:Saitama   Country:Japan  

  • Design and Verification of Receiving Electrode of Human Body Communication for Wearable Prosthetic Hand Control Using a Simplified Circuit Model

    Ikuma Kondo, Yusuke Yano, Daisuke Anzai, Jianqing Wang

    IEICE Technical Committee on Electromagnetic Compatibility  2023.01  IEICE Technical Committee on Electromagnetic Compatibility

     More details

    Event date: 2023.01

    Language:Japanese   Presentation type:Oral presentation (general)  

    Venue:Okayama   Country:Japan  

  • Measurement Method for Mode Conversion of Differential Communication Line Termination Structures

    Masahiro Yoshida, Yusuke Yano, Jianqing Wang, Takeshi Ishida

    2022 IEICE Society Conference  2022.09  IEICE

     More details

    Event date: 2022.09

    Language:Japanese   Presentation type:Oral presentation (general)  

    Venue:Online   Country:Japan  

  • Investigation of Equivalent Circuit Modeling for Tubular Wave Coupler

    Yusuke Yano, Kota Endo, Osami Wada

    2022 IEICE Society Conference  2022.09  IEICE

     More details

    Event date: 2022.09

    Language:Japanese   Presentation type:Oral presentation (general)  

    Venue:Online   Country:Japan  

display all >>

Awards

  • TOP DOWNLOADED LETTER AWARD

    2023.10   IEICE   Influence of cable length between TLP test system and DUT and its correction for CMCESD saturation measurement

    Yusuke Yano, Kazuha Ishida, Jianqing Wang, Takeshi Ishida

     More details

    Award type:Honored in official journal of a scientific society, scientific journal  Country:Japan

  • IEEE EMC Society Japan Joint / Sendai Chapters Student Award 2020

    2021.03   IEEE EMC Society Japan Joint Chapter  

    Minseong Lee, Yusuke Yano, Osami Wada

     More details

    Award type:International academic award (Japan or overseas)  Country:Japan

  • 2019年度環境電磁工学研究会若手優秀賞

    2020.03   電子情報通信学会環境電磁工学研究会   DC/DCコンバータの2ポートノイズ源等価回路モデルにおけるパラメータ抽出の改善による予測精度向上

    大崎悠平,矢野佑典,上松大志,五百旗頭健吾,豊田啓孝

     More details

    Award type:Award from Japanese society, conference, symposium, etc.  Country:Japan

  • 第26回エレクトロニクス実装学会春季講演大会優秀賞

    2013.03   エレクトロニクス実装学会  

    五百旗頭健吾, 矢野佑典, 豊田啓孝

     More details

    Award type:Award from Japanese society, conference, symposium, etc.  Country:Japan

  • 岡山大学自然科学研究科(博士前期課程)研究科長賞

    2012.03   岡山大学自然科学研究科  

    矢野佑典

     More details

    Country:Japan

  • 電子情報通信学会環境電磁工学研究会若手奨励賞

    2011.10   電子情報通信学会環境電磁工学研究会  

    矢野佑典, 五百旗頭健吾, 豊田啓孝

     More details

    Award type:Award from Japanese society, conference, symposium, etc.  Country:Japan

 

Committee Memberships

  • 2024 EMC Japan/APEMC Okinawa, General affairs Committee   Member  

    2023.04 - 2024.12   

      More details

    Committee type:Academic society

  • KEC Electronic Industry Development Center   Observer  

    2022.04   

  • 公益社団法人 自動車技術会   委員  

    2022.04   

Social Activities

  • 車載Ethernet技術動向とEMC課題

    Role(s): Lecturer

    中部エレクトロニクス振興会  中部エレクトロニクス振興会講演会  2022.03