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Affiliation Department |
電気・機械工学科 電気電子分野
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Title |
Assistant Professor |
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Contact information |
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Homepage |
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External Link |
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YANO Yusuke
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Research Areas
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Manufacturing Technology (Mechanical Engineering, Electrical and Electronic Engineering, Chemical Engineering) / Electron device and electronic equipment
From School
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Okayama University Faculty of Engineering Department of Communication and Network Engineering Graduated
2008.04 - 2010.03
Country：Japan
From Graduate School
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Okayama University Graduate School, Division of Science and Technology Division of Electronic and Information Systems Engineering Master's Course Completed
2010.04 - 2012.03
Country：Japan
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Okayama University Graduate School, Division of Science and Technology Division of Industrial Innovation Sciences Doctor's Course Completed
2015.10 - 2019.03
Country：Japan
External Career
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Kyoto University Graduate School of Engineering, Department of Electrical Engineering Researcher
2019.04 - 2021.02
Country：Japan
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Sumitomo Electric Industries, Ltd. Technical Support Staff
2012.04 - 2015.09
Country：Japan
Professional Memberships
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IEEE
2020.08
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The Institute of Electronics, Information and Communication Engineers
2016.01
Papers
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Improvement of ESD Damage Test Board for CMC for Automotive Ethernet Reviewed
Hironori Ito, Yusuke Yano, Takeshi Ishida, and Jianqing Wang
IEEE Letters on Electromagnetic Compatibility Practice and Applications 6 ( 3 ) 89 - 95 2024.09
Authorship：Corresponding author Language：English Publishing type：Research paper (scientific journal)
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A study on Reducing Cable Length Dependence for Automotive Ethernet EMC Evaluation Reviewed
Hideki Iwasaki, Yusuke Yano, Jianqing Wang
2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan/Asia-Pacific International Symposium on Electromagnetic Compatibility FriAM1B.5 656 - 656 2024.05
Authorship：Corresponding author Language：English Publishing type：Research paper (international conference proceedings)
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Extraction of Parasitic Impedance Difference between Electronic Device Test Boards Reviewed
Yoshika Iwaoka, Yusuke Yano, Jianqing Wang
2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan/Asia-Pacific International Symposium on Electromagnetic Compatibility ThuPM1A.5 582 - 582 2024.05
Authorship：Corresponding author Language：English Publishing type：Research paper (international conference proceedings)
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Measurement Method for Mixed-Mode S-Parameters of Termination Structures in Differential Communication Line Reviewed
Masahiro Yoshida, Yusuke Yano, Jianqing Wang
2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan/Asia-Pacific International Symposium on Electromagnetic Compatibility WedPM1A.2 337 - 337 2024.05
Authorship：Corresponding author Language：English Publishing type：Research paper (international conference proceedings)
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Conducted Emission Evaluation of 1000BASE-RH Optical Ethernet Transceivers Reviewed
Osami Wada, Yusuke Yano
2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan/Asia-Pacific International Symposium on Electromagnetic Compatibility WedAM1D.3 275 - 278 2024.05
Authorship：Last author Language：English Publishing type：Research paper (international conference proceedings)
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Circuit Model Construction for Simulating ESD Discharge Current Flowing through CMCs and ESD Suppression Devices Reviewed
Hironori Ito, Shoma Ishihara, Yusuke Yano, Jianqing Wang
2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan/Asia-Pacific International Symposium on Electromagnetic Compatibility WedAM1D.5 283 - 286 2024.05
Authorship：Corresponding author Language：English Publishing type：Research paper (international conference proceedings)
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Batteryless BLE Module with a Piezoelectric Element Mounted on a Shoe Sole Reviewed
Shusei Dan, Yusuke Yano, Jianqing Wang
Sensors 24 ( 2829 ) 1 - 13 2024.04
Authorship：Corresponding author Language：English Publishing type：Research paper (scientific journal)
DOI： 10.3390/s24092829
DOI： 10.3390/s24092829
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Measurement of Current Waveform Due to Different Load of ESD Gun, TLP-HMM, and CR-HMM Invited Reviewed
Masahiro Yoshida, Yusuke Yano, Takeshi Ishida, Jianqing Wang
2023 45th Annual EOS/ESD Symposium (EOS/ESD) 2023.10
Authorship：Corresponding author Language：English Publishing type：Research paper (international conference proceedings)
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Influence of cable length between TLP test system and DUT and its correction for CMC ESD saturation measurement Reviewed
Yusuke Yano, Kazuha Ishida, Jianqing Wang, Takeshi Ishida
IEICE Communications Express 1 - 7 2023.09
Authorship：Lead author Language：English Publishing type：Research paper (scientific journal)
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Investigation of Reducing Test System Dependence for Automotive Ethernet EMC Evaluation Reviewed
Yusuke Yano, Hideki Iwasaki, and Jianqing Wang
2023 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI) 624 - 624 2023.08
Authorship：Lead author Language：English Publishing type：Research paper (international conference proceedings)
Presentations
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Extraction of difference in parasitic impedance of common mode choke mounted on different printed circuit boards
Yoshika Iwaoka, Yusuke Yano, Jianqing Wang
IEICE Technical Committee on Electromagnetic Compatibility 2024.12 IEICE Technical Committee on Electromagnetic Compatibility
Event date： 2024.12
Language：Japanese Presentation type：Oral presentation (general)
Venue：Toki Country：Japan
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A Study of ESD Noise Voltage Induced in Wearable Bio-signal Sensor
Yusuke Shimizu, Yusuke Yano, Jianqing Wang
2024 IEICE Society Conference 2024.09 IEICE
Event date： 2024.09
Language：Japanese Presentation type：Oral presentation (general)
Venue：Saitama Country：Japan
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Basic study for reducing configuration dependence of T1-UTP cable common mode characteristics
Hajime Kimura, Yusuke Yano, Osami Wada, Jianqing Wang
IEICE Technical Committee on Electromagnetic Compatibility 2024.07 IEICE Technical Committee on Electromagnetic Compatibility
Event date： 2024.07
Language：Japanese Presentation type：Oral presentation (general)
Venue：Tokyo Country：Japan
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Investigation of Interference Voltage to Automotive Ethernet Transceiver IC in Powered ESD Test using Circuit Simulation
Toya Nakatani, Yusuke Yano, Jianqing Wang
IEICE Technical Committee on Electromagnetic Compatibility 2024.03 IEICE Technical Committee on Electromagnetic Compatibility
Event date： 2024.03
Language：Japanese Presentation type：Oral presentation (general)
Venue：Matsue Country：Japan
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A Study on Measurement Method for Mixed-Mode S Parameter of Termination Structures in Differential Communication Line
Masahiro Yoshida, Yusuke Yano, Jianqing Wang
IEICE Technical Committee on Electromagnetic Compatibility 2023.11 IEICE Technical Committee on Electromagnetic Compatibility
Event date： 2023.11
Language：Japanese Presentation type：Oral presentation (general)
Venue：Tokyo Country：Japan
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直接放電試験の信頼性向上のためのTLP-HMM適用事例・課題とその改善検討 Invited
矢野佑典
第33回RCJ信頼性シンポジウム 2023.11 一般財団法人日本電子部品信頼性センター
Event date： 2023.11
Language：Japanese Presentation type：Oral presentation (invited, special)
Venue：東京 Country：Japan
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Study of Battery-less of BLE Module by Piezoelectric Element Mounted on Shoe Sole
Syusei Dan, Yusuke Yano, Jianqing Wang
IEICE Technical Committee on Electromagnetic Compatibility 2023.10 IEICE Technical Committee on Electromagnetic Compatibility
Event date： 2023.10
Language：Japanese Presentation type：Oral presentation (general)
Venue：Yonezawa Country：Japan
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Study of ESD Discharge Current Test Board for ESD Suppression Devices for Automotive Ethernet
Shoma Ishihara, Yusuke Yano, and Jianqing Wang
IEICE Technical Committee on Electromagnetic Compatibility 2023.06 IEICE Technical Committee on Electromagnetic Compatibility
Event date： 2023.06
Language：Japanese Presentation type：Oral presentation (general)
Venue：Otaru Country：Japan
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差動通信線終端構造に対するモード変換量測定方法
吉田 征弘, 矢野 佑典, 王 建青, 石田 武志
自動車技術会2023年春季大会 2023.05 自動車技術会
Event date： 2023.05 - 2024.05
Language：Japanese Presentation type：Poster presentation
Venue：横浜 Country：Japan
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Investigation of Common Mode Termination Matching for Reducing System Dependence in EMC Testing of Automotive Communications
Hideki Iwasaki, Yusuke Yano, Jianqing Wang
IEICE Technical Committee on Electromagnetic Compatibility 2023.05 IEICE Technical Committee on Electromagnetic Compatibility
Event date： 2023.05
Language：Japanese Presentation type：Oral presentation (general)
Venue：Naha Country：Japan
Awards
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特別優秀賞
2024 名古屋工業大学
Country：Japan
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TOP DOWNLOADED LETTER AWARD
2023.10 IEICE Influence of cable length between TLP test system and DUT and its correction for CMCESD saturation measurement
Yusuke Yano, Kazuha Ishida, Jianqing Wang, Takeshi Ishida
Award type：Honored in official journal of a scientific society, scientific journal Country：Japan
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IEEE EMC Society Japan Joint / Sendai Chapters Student Award 2020
2021.03 IEEE EMC Society Japan Joint Chapter
Minseong Lee, Yusuke Yano, Osami Wada
Award type：International academic award (Japan or overseas) Country：Japan
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2019年度環境電磁工学研究会若手優秀賞
2020.03 電子情報通信学会環境電磁工学研究会 DC/DCコンバータの2ポートノイズ源等価回路モデルにおけるパラメータ抽出の改善による予測精度向上
大崎悠平,矢野佑典,上松大志,五百旗頭健吾,豊田啓孝
Award type：Award from Japanese society, conference, symposium, etc. Country：Japan
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第26回エレクトロニクス実装学会春季講演大会優秀賞
2013.03 エレクトロニクス実装学会
五百旗頭健吾, 矢野佑典, 豊田啓孝
Award type：Award from Japanese society, conference, symposium, etc. Country：Japan
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岡山大学自然科学研究科（博士前期課程）研究科長賞
2012.03 岡山大学自然科学研究科
矢野佑典
Country：Japan
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電子情報通信学会環境電磁工学研究会若手奨励賞
2011.10 電子情報通信学会環境電磁工学研究会
矢野佑典, 五百旗頭健吾, 豊田啓孝
Award type：Award from Japanese society, conference, symposium, etc. Country：Japan
Scientific Research Funds Acquisition Results
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車載システムにおけるEMC問題の発生原理解明によるモデルベースEMC設計法の革新
Grant number：24K17260 2024.04 - 2027.03
日本学術振興会 科学研究費助成事業 若手研究
Authorship：Principal investigator
Committee Memberships
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2024 EMC Japan/APEMC Okinawa, General affairs Committee Member
2023.04 - 2024.12
Committee type：Academic society
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KEC Electronic Industry Development Center Observer
2022.04
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公益社団法人 自動車技術会 委員
2022.04
Social Activities
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車載Ethernet技術動向とEMC課題
Role(s)： Lecturer
中部エレクトロニクス振興会 中部エレクトロニクス振興会講演会 2022.03