Papers - KATO Masashi

Division display  81 - 100 of about 146 /  All the affair displays >>
  • Identification of structures of the deep levels in 4H-SiC Reviewed

    Hiroki Nakane, Masashi Kato, Masaya Ichimura, Takeshi Ohshima

    Materials Science Forum   778-780   277 - 280   2014.02

     More details

    Language:English   Publishing type:Research paper (international conference proceedings)  

    DOI: 10.4028/www.scientific.net/MSF.778-780.277

  • Impact of carrier lifetime on efficiency of photolytic hydrogen generation by p-type SiC Reviewed

    Keiko Miyake, Tomonari Yasuda, Masashi Kato, Masaya Ichimura, Tomoaki Hatayama, Takeshi Ohshima

    Materials Science Forum   778-780   503 - 506   2014.02

     More details

    Language:English   Publishing type:Research paper (international conference proceedings)  

    DOI: 10.4028/www.scientific.net/MSF.778-780.503

  • Estimation of surface recombination velocities for n-type 4H-SiC surfaces treated by various processes Reviewed

    Yuto Mori, Masashi Kato, Masaya Ichimura

    Materials Science Forum   778-780   432 - 435   2014.02

     More details

    Language:English   Publishing type:Research paper (international conference proceedings)  

    DOI: 10.4028/www.scientific.net/MSF.778-780.432

  • Correlation between Microwave Reflectivity and Excess Carrier Concentrations in 4H-SiC Reviewed

    Masashi Kato, Yuto Mori, Masaya Ichimura

    Materials Science Forum   778-780   293 - 296   2014.02

     More details

    Authorship:Lead author   Language:English   Publishing type:Research paper (international conference proceedings)  

    DOI: 10.4028/www.scientific.net/MSF.778-780.293

  • Efficiency of a solar cell with intermediate energy levels: An example study on hydrogen implanted Si solar cells Reviewed

    Masaya Ichimura, Hiromu Sakakibara, Koji Wada, Masashi Kato

    Journal of Applied Physics   114 ( 11 )   114505-1 - 114505-6   2013.09

     More details

    Language:English   Publishing type:Research paper (scientific journal)  

    DOI: 10.1063/1.4821286

  • Excess carrier lifetime and strain distributions in a 3C-SiC wafer grown on an undulant Si substrate Reviewed

    Masashi Kato, Atsushi Yoshida, Masaya Ichimura, Hiroyuki Nagasawa

    Physica Status Solidi A   210 ( 9 )   1719 - 1725   2013.09

     More details

    Authorship:Lead author   Language:English   Publishing type:Research paper (scientific journal)  

    DOI: 10.1002/pssa.201329015

  • Performance Improvement of the Analog ANC Circuit for a Duct by Insertion of an All-Pass Filter Reviewed

    Tatsuki HYODO,Gaku ASAKURA,Kiwamu TSUKADA,Masashi KATO

    IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences   E96-A ( 4 )   824 - 825   2013.04

     More details

    Language:English   Publishing type:Research paper (scientific journal)  

  • Leakage Current Suppression Using Passivation of Defect by Anodic Oxidation for 4H-SiC Schottky Contacts Reviewed

    Masashi Kato, Masaya Kimura, Masaya Ichimura

    Japanese Journal of Applied Physics   52   04CP02-1 - 04CP02-5   2013.02

     More details

    Authorship:Lead author   Language:English   Publishing type:Research paper (scientific journal)  

    DOI: 10.7567/JJAP.52.04CP02

  • Solar-to-hydrogen conversion efficiency of water photolysis with epitaxially grown p-type SiC Reviewed

    Tomonari Yasuda, Masashi Kato, Masaya Ichimura, Tomoaki Hatayama

    Materials Science Forum   740-742   859 - 862   2013.02

     More details

    Language:English   Publishing type:Research paper (international conference proceedings)  

    DOI: 10.4028/www.scientific.net/MSF.740-742.859

  • Deep levels in p-type 4H-SiC induced by low-energy electron irradiation Reviewed

    Kazuki YOSHIHARA, Masashi KATO, Masaya ICHIMURA, Tomoaki HATAYAMA, Takeshi OHSHIMA

    Materials Science Forum   740-742   373 - 376   2013.02

     More details

    Language:English   Publishing type:Research paper (international conference proceedings)  

    DOI: 10.4028/www.scientific.net/MSF.740-742.373

  • 構築型スライドの事前提供と学生指名によるインタラクティブ授業の試み Reviewed

    加藤正史

    電気学会論文誌A 基礎・材料・共通部門誌   132 ( 12 )   1120 - 1121   2012.12

     More details

    Authorship:Lead author   Language:Japanese   Publishing type:Research paper (scientific journal)  

    DOI: 10.1541/ieejfms.132.1120

  • アンケート調査に基づく高校生を対象とした啓発活動に関する一検討 Reviewed

    平田晃正,加藤正史,江龍修,丸田章博

    電気学会論文誌A 基礎・材料・共通部門誌   132 ( 12 )   1124 - 1125   2012.12

     More details

    Language:Japanese   Publishing type:Research paper (scientific journal)  

    DOI: 10.1541/ieejfms.132.1124

  • 卒業研究記録ノートの導入による卒業研究実施状況および達成度の把握 Reviewed

    加藤正史,江龍修,大原繁男

    電気学会論文誌A 基礎・材料・共通部門誌   132 ( 12 )   1122 - 1123   2012.12

     More details

    Authorship:Lead author   Language:Japanese   Publishing type:Research paper (scientific journal)  

    DOI: 10.1541/ieejfms.132.1122

  • SiC photoelectrodes for a self-driven water-splitting cell Reviewed

    Tomonari Yasuda, Masashi Kato, Masaya Ichimura, Tomoaki Hatayama

    APPLIED PHYSICS LETTERS   101   053902-1 - 053902-3   2012.07

     More details

    Language:English   Publishing type:Research paper (scientific journal)  

    DOI: 10.1063/1.4740079

  • Characterization of Photoelectrochemical Properties of SiC as a Water Splitting Material Reviewed

    Tomonari Yasuda, Masashi Kato, Masaya Ichimura

    Materials Science Forum   717-720   585 - 588   2012.05

     More details

    Language:English   Publishing type:Research paper (international conference proceedings)  

    DOI: 10.4028/www.scientific.net/MSF.717-720.585

  • Carrier Diffusivity in Highly Excited Bulk SiC, GaN, and Diamond Crystals by Optical Probes Reviewed

    K. Jarašiūnas, P. Ščajev, T. Malinauskas, M. Kato, E. Ivakin, M. Nesladek, K. Haenen, Ü. Özgür, H. Morkoç

    Materials Science Forum   717-720   309 - 312   2012.05

     More details

    Language:English   Publishing type:Research paper (international conference proceedings)  

    DOI: 10.4028/www.scientific.net/MSF.717-720.309

  • Correlation between Strain and Excess Carrier Lifetime in a 3C-SiC Wafer Reviewed

    Atsushi Yoshida, Masashi Kato, Masaya Ichimura

    Materials Science Forum   717-720   305 - 308   2012.05

     More details

    Language:English   Publishing type:Research paper (international conference proceedings)  

    DOI: 10.4028/www.scientific.net/MSF.717-720.305

  • Excess Carrier Lifetime in p-Type 4H-SiC Epilayers with and without Low-Energy Electron Irradiation Reviewed

    Masashi Kato, Yoshinori Matsushita, Masaya Ichimura, Tomoaki Hatayama, Takeshi Ohshima

    Japanese Journal of Applied Physics   51 ( 2 )   028006   2012.02

     More details

    Authorship:Lead author   Language:English   Publishing type:Research paper (scientific journal)  

    DOI: 10.1143/JJAP.51.02800

  • Estimation of Surface Recombination Velocity from Thickness Dependence of Carrier Lifetime in n-Type 4H-SiC Epilayers Reviewed

    Masashi Kato, Atsushi Yoshida, Masaya Ichimura

    Japanese Journal of Applied Physics   51 ( 2 )   02BP12-1 - 02BP12-6   2012.02

     More details

    Authorship:Lead author   Language:English   Publishing type:Research paper (scientific journal)  

    DOI: 10.1143/JJAP.51.02BP12

  • On applicability of time-resolved optical techniques for characterization of differently grown 3C-SiC crystals and heterostructures Reviewed

    P. Ščajev, P. Onufrijevs, G. Manolis, M. Karaliūnas, S. Nargelas, N. Jegenyes, J. Lorenzzi, G. Ferro, M. Beshkova, R. Vasiliauskas, M. Syväjärvi, R. Yakimova, M. Kato, and K. Jarašiūnas

    Materials Science Forum   711   159 - 163   2012.01

     More details

    Language:English   Publishing type:Research paper (international conference proceedings)  

    DOI: 10.4028/www.scientific.net/MSF.711.159

To the head of this page.▲