Papers - HAYASHI Koichi
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On the charge-up effect of XPS
Jun Kawai, Yoshinobu Mizutani, Kouichi Hayashi, Zenjiro Asaki and Yoshinori Kitajima (KEK-PF)
Journal of Surface Analysis 4 404 - 408 1998
Language：English Publishing type：Research paper (scientific journal)
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Extended X-ray emission fine structure (EXEFS)
Jun Kawai, Kouichi Hayashi
Journal Electron Spectroscopy and Related Phenomena 92 243 - 245 1998
Language：English Publishing type：Research paper (scientific journal)
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Extended X-ray emission fine structure of sodium
Jun Kawai, Kouichi Hayashi and Shigeo Tanuma
Analyst 123 617 - 619 1998
Language：English Publishing type：Research paper (scientific journal)
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Surface analysis of Si/W multilayer using total reflection X-ray photoelectron spectroscopy
Jun Kawai, Kouichi Hayashi, Hiroyuki Amano, Hisataka Takenaka, Yoshinori Kitajima
Jounal Electron Spectroscopy and Related Phenomena 88-91 787 - 791 1998
Language：English Publishing type：Research paper (scientific journal)
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Elucidation of the initial growth process of copper phthalocyanine ultra thin film by energy dispersive X-ray reflectivity measurement
Kouichi Hayashi, Kenji Ishida, Toshihisa Horiuchi and kazumi Matsushige
Advances in X-ray Chemical Analysis Japan 29 71 - 84 1998
Language：Japanese Publishing type：Research paper (scientific journal)
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Extended X-ray absorption fine structure (EXAFS) in X-ray fluorescence spectra
Jun Kawai, Kouichi Hayashi, Yasuhiro Awakura
Journal of the Physical Society of Japan 66 3337 - 3340 1997
Language：English Publishing type：Research paper (scientific journal)
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Extended fine structure in characteristic X-ray fluorescence: a novel structural analysis method of condensed systems
Kouichi Hayashi, Jun Kawai, Yasuhiro Awakura
Spectrochimica Acta Part B 52 2169 - 2172 1997
Language：English Publishing type：Research paper (scientific journal)
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Characterization of island CuPc/Au multilayer using total reflection X-ray photoelectron spectroscopy
Hiroyuki Amano, Jun Kawai, Kouichi Hayashi, Yoshinori Kitajima
Advances in X-ray chemical analysis Japan 28 31 - 44 1997
Language：Japanese Publishing type：Research paper (scientific journal)
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Characterization of oxide layer on multilayer by total reflection X-ray photoelectron spectroscopy
Kouichi Hayashi, Jun Kawai, Shin'ichi Kawato, Toshihisa Horiuchi, Kazumi Matsushige, Hisataka Takenaka, Yoshinori Kitajima
Advances in X-ray chemical analysis Japan 28 53 - 62 1997
Language：Japanese Publishing type：Research paper (scientific journal)
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Evaluation of copper phthalocyanine ultra thin film by total reflection X-ray photoelectron spectroscopy method
Kouichi Hayashi, Jun Kawai, Shin'ichi Kawato, Toshihisa Horiuchi, Kazumi Matsushige, Yoshinori Kitajima
Advances in X-ray chemical analysis Japan 28 45 - 52 1997
Language：Japanese Publishing type：Research paper (scientific journal)
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Effect of applied electric field on the molecular orientation of epitaxially grown organic films
Kouichi Hayashi, Shin'ichi. Kawato, Yasuhiro Fujii, Toshihisa Horiuchi, Kazumi Matsushige
Applied Physics Letter 70 1384 - 1386 1997
Language：English Publishing type：Research paper (scientific journal)
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Total reflection X-ray photoelectron spectroscopy of copper phthalocyanine-gold multilayers
Jun Kawai, Hiroyuki Amano, Kouichi Hayashi, Toshihisa Horiuchi, Kazumi Matsushig
Spectrochimca Acta Part B 52 873 - 879 1997
Language：English Publishing type：Research paper (scientific journal)
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Epitaxial growth behavior of copper phthalocyanine films under applied voltages
Kouichi Hayashi, Shin'ichi. Kawato, Yasuhiro Fujii, Toshihisa Horiuchi, Kazumi Matsushige
Molecular Crystal and Liquid Crystal 294 103 - 106 1997
Language：English Publishing type：Research paper (scientific journal)
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The in-situ observation of organic thin films during growth process by using grazing incidence X-ray diffraction and fluorescence methods
Kouichi Hayashi, Toshihisa Horiuchi and Kazumi Matsushige
Advances in X-Ray Analysis 39 653 - 658 1997
Language：English Publishing type：Research paper (scientific journal)
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Energy dispersive grazing incidence X-ray diffraction on organic thin films epitaxially growth on crystalline substrate
Kenji Ishida, Kouichi Hayashi, Toshihisa Horiuchi, Kazumi Matsushige
Advances in X-Ray Analysis 39 659 - 664 1997
Language：English Publishing type：Research paper (scientific journal)
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Novel GIX2 apparatus for thin film analysis using color Laue method
Toshihisa Horiuchi, Kenji Ishida, Kouichi Hayashi, Kazumi Matsushige, Atsushi Shibata
Advances in X-Ray Analysis 39 171 - 180 1997
Language：English Publishing type：Research paper (scientific journal)
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Orientational changes in copper phthalocyanine thin films by applying voltages during evaporation process
Yasuhiro Fujii, Shin'ichi Kawato, Kouichi Hayashi, Toshihisa Horiuchi, Kazumi Matsushige
TECHNICAL REPORT OF IEICE OME96-27 13 - 16 1996.07
Language：Japanese Publishing type：Research paper (scientific journal)
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In-Situ observation of structural change in organic thin films by ED-GIXR
Kenji Orita, Yasunori Yamamoto, Kouichi Hayashi, Toshihisa Horiuchi, Kazumi Matsushige
TECHNICAL REPORT OF IEICE OME96-27 7 - 10 1996.07
Language：Japanese Publishing type：Research paper (scientific journal)
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Photoelectron spectra enhanced by X-ray total reflection and diffraction from periodic multilayer
Kouichi Hayashi, Shin'ichi Kawato, Toshihisa Horiuchi, Kazumi Matsushige, Yoshinori Kitajima, Hisataka Takenaka and Jun Kawai
Applied Physics Letters 68 1921 - 1923 1996
Language：English Publishing type：Research paper (scientific journal)
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The elucidation of the formation mechanism in the vacuum deposited organic ultra thin films by total reflection x-ray spectroscopy methods
Kouichi Hayashi, Toshihisa Horiuchi and Kazumi Matsushige
Shinkuu 39 563 - 568 1996
Language：Japanese Publishing type：Research paper (scientific journal)
