Papers - IZUMI Hayato

A novel method of systematic quantitative characterization for the mechanical robustness of flexible thin film devices against repeated bending deformation

H. Izumi, M. Nomura, Y. Haga, H. Sugiyama, S. Kamiya

2022.09

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Observation of fatigue fracture origin in single crystal silicon Reviewed International journal

H. Izumi, T. Kita, S. Arai, K. Sasaki, S. Kamiya

Journal of Materials Science   2021.11

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A multidimensional scheme of characterization for performance deterioration behavior of flexible devices under bending deformation Reviewed International journal

Shoji Kamiya, Hayato Izumi, Tomohito Sekine, Nobuyuki Shisido, Hiroko Sugiyama, Yasuko Haga, Takeo Minari, Masaaki Koganemaru, Shizuo Tokito

Thin Solid Films   694   137613   2020.01

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Performance Deterioration Characteristics of Silver-Nanoparticle-Printed Flexible Electric Wirings under Severe Bending Deformation International journal

S. Kamiya, H. Izumi, T. Sekine, Y. Haga, H. Sugiyama, N. Shishido, M. Koganemaru

Proceedings of ICMCTF2019   2019.05

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Increasing the ductility of single crystalline silicon treated by hydrogen plasma International journal

H. Izumi, M. Nakamura, S. Kamiya

Proceedings of the 16th International Conference on Plasma Surface Engineering   2018.09

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Electronic imaging of subcritical defect accumulation in single crystal silicon under fatigue loading Reviewed

S. Kamiya, A. Kongo, H. Sugiyama, H. Izumi

Sensors and Actuators A: Physical   2018.07

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Bending Durability of Organic Thin Film Transistor and Stress Sensing using Mechanoluminecence International journal

H. Izumi, Y. Haga, N. Shishido, S. Kamiya

Proceedings of Asia-Pacific Conference of Transducers and Micro-Nano Technology 2018   2018.06

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Plastic Deformation Enhanced Silicon Surface by Synergistic Effect between Defect and Hydrogen International journal

H. Izumi, M. Nakamura, S. Kamiya

Proceedings of the Asia-Pacific Conference of Transducers and Micro-Nano Technology 2018   2018.06

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World-First Electronic Imaging of Subcritical Slip Growth in Single Crystal Silicon under Fatigue Loading International journal

S. Kamiya, A. Kongo, H. Sugiyama, and H. Izumi

Proceedings of The 19th International Conference on Solid-State Sensors, Actuators and Microsystems   2017.06

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Existential states and effect of hydrogen on surface defects in silicon International journal

M. Nakamura, H. Izumi, and S. Kamiya

Proceedings of International Symposium on Micro-Nano Science and Technology 2016   2016.12

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Effect of hydrogen on the mobility of surface defects inducued in plasma etching process for silicon International coauthorship International journal

M. Nakamura, T. Kim, H. Izumi, S. Kamiya

Proceedings of Plasma Surface Engineering 2016   2016.09

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Shear stress enhanced fatigue damage accumulation in single crystalline silicon under cyclic mechanical loading Reviewed International journal

S. Kamiya, A. Udhayakumar, H. Izumi, K. Koiwa

Sensors and Actuators A: Physical   2016.06

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SHEAR STRESS WITH HYDROGEN, NOT OXYGEN, MATTERS TO THE FATIGUE LIFETIME OF SILICON International coauthorship International journal

S. Kamiya, A. Udhayakumar, H. Izumi, and K. Koiwa

The 18th International Conference on Solid-State Sensors, Actuators and Microsystems, Transducers 2015   2015.06

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Hydrogen enchanced on mechanical fatigue in single crystal silicon Reviewed

H.Izumi, A. Udhayakumar, S. Kamiya

Materials Letters   2015.03

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Fatigue failure and fracture surface analysis of single crystal silicon exposed to oxygen, hydrogen and humidity air environment

A. udhayakumar, S. Kamiya, H. Izumi, N. Shishido

41th Internatinal Conference on Metallurgical Coating and Thin Films   2014.04

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Effect of hydrogen at room temperature on electronic and mechanical properties of dislocations in silicon Reviewed

M. Ogawa, S. Kamiya, H. Izumi, Y. Tokuda

Materials Letters   2014.04

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Defect accumulation and strength reduction in single crystalline silicon induced by cyclic compressive stress Reviewed

S. Kamiya, T. Kiata, H. Izumi

Sensors and Actuators A   2014.02

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Effect of hydrogen on the mechanical properties of silicon crystal surface Reviewed

H. Izumi, R. Mukaiyama, N. Shishido, S. Kamiya

ASME 2013 International Technical Conference and Exhibition on Packaging and Interraction of Electronic and Photnic Microsystems (InterPACK2013)   2013.07

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Direct observation of damage accumulation process inside silicon under mechanical fatigue loading

S. Kamiya, R. Hirai, H.Izumi, N. Umehara, T. Tokoroyama

The 17th International Conference on Solid-State Sensors, Actuators and Microsystem (Transduers 2013)   2013.06

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A prediction scheme of the static fracture strength of MEMS structures based on the characterization of damage distribution on a processed surface Reviewed

V. L. Huy, S. Kamiya, K. Nagayoshi, H. Izumi, J. Gaspar, O. Paul

Journal of Micromechanics and Microengineering   23   1 - 10   2013.02

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