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Affiliation Department etc. |
Department of Electrical and Mechanical Engineering
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Title |
Associate Professor |
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Research Fields, Keywords |
Semiconductor physics |
KATO Masashi
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Graduating School
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-1998.03
Nagoya Institute of Technology Faculty of Engineering Electrical and Computer Engineering Graduated
Graduate School
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-2003.03
Nagoya Institute of Technology Graduate School, Division of Engineering Electrical and Computer EngineeringDoctor's Course Completed
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-2000.03
Nagoya Institute of Technology Graduate School, Division of Engineering Electrical and Computer EngineeringMaster's Course Completed
External Career
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2010.08-2010.09
Researcher
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2009.08-2009.10
Vilnius University Researcher
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2008.08-2008.10
Vilnius University Researcher
Academic Society Affiliations
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2005.01-2010.12
IEEE
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2000.04-Now
The Institute of Electronics, Information and Communication Engineers
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2000.04-2005.12
Materials Research Society
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1998.04-Now
The Japan Society of Applied Physics
Field of expertise (Grants-in-aid for Scientific Research classification)
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Electronic materials/Electric materials
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Device related chemistry
Papers
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K. Nagaya, T. Hirayama, T. Tawara, K. Murata, H. Tsuchida, A. Miyasaka, K. Kojima, T. Kato, H. Okumura, M. Kato
Journal of Applied Physics 128 105702-1 - 105702-7 2020.09 [Refereed]
Research paper (scientific journal) Multiple Authorship
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Mapping of large structural defects in SiC Schottky contacts using internal photoemission microscopy
Kenji Shiojima, Masashi Kato
Materials Science in Semiconductor Processing 118 105182-1 - 105182-12 2020.05 [Refereed]
Research paper (scientific journal) Multiple Authorship
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Masashi Kato, Zhang Xinchi, Kimihiro Kohama, Shuhei Fukaya, Masaya Ichimura
Journal of Applied Physics 127 195702-1 - 195702-7 2020.05 [Refereed]
Research paper (scientific journal) Multiple Authorship
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Highly efficient 3C-SiC photocathodes with texture structures formed by electrochemical etching
Masashi Kato, Tomohiro Ambe
Applied Physics Express 13 026506 2020.02 [Refereed]
Research paper (scientific journal) Multiple Authorship
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Heat shock protein 70 is a key molecule to rescue imbalance caused by low‑frequency noise
Reina Negishi‑Oshino, Nobutaka Ohgami, Tingchao He, Xiang Li, Masashi Kato, Masayoshi Kobayashi, Yishuo Gu, Kanako Komuro, Charalampos E. Angelidis, Masashi Kato
Archives of Toxicology 2019.10 [Refereed]
Research paper (scientific journal) Multiple Authorship
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Characterisation of defects in p-type 4H-, 6H- and 3C-SiC epilayers grown on SiC substrates
Masashi Kato, Naoto Ichikawa, Yoshitaka Nakano
Materials Letters 254 96 - 98 2019.07 [Refereed]
Research paper (scientific journal) Multiple Authorship
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Effects of Nb Doping on the Photocatalytic Performance of Rutile TiO2 Single Crystals
Masashi Kato, Hayao Najima, Takaya Ozawa
Journal of The Electrochemical Society 166 ( 10 ) H468 - H472 2019.06 [Refereed]
Research paper (scientific journal) Multiple Authorship
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Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
Takato Asada, Yoshihito Ichikawa, Masashi Kato
Journal of Visualized Experiments 146 e59007 2019.04 [Refereed] [Invited]
Research paper (scientific journal) Multiple Authorship
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RECOMBINATION AND DIFFUSION PROCESSES IN ELECTRONIC GRADE 4H SILICON CARBIDE
P. Ščajev, L. Subačius, K. Jarašiūnas, M. Kato
Lithuanian Journal of Physics 59 ( 1 ) 26 - 34 2019.04 [Refereed]
Research paper (scientific journal) Multiple Authorship
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Ultraviolet light induced electrical hysteresis effect in graphene-GaN heterojunction
Ajinkya K. Ranade, Rakesh D. Mahyavanshi, Pradeep Desai, Masashi Kato, Masaki Tanemura, Golap Kalita
Applied Physics Letters 114 151102 2019.04 [Refereed]
Research paper (scientific journal) Multiple Authorship
Presentations
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D4-12-O03 Difference in carrier lifetimes for SiC measured by microwave photoconductivity decay and time-resolved photoluminescence methods
Masashi KATO
MATERIALS RESEARCH MEETING 2019 (YOKOHAMA SYMPOSIA) 2019.12 - 2019.12
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D4-11-I08 Carrier Recombination Velocity in 4H-SiC: at Surfaces and Defects
Masashi KATO [Invited]
MATERIALS RESEARCH MEETING 2019 (YOKOHAMA SYMPOSIA) 2019.12 - 2019.12
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WP2-9 Mapping of Large Structural Defects in SiC Schottky Contacts Using Internal Photoemission Microscopy
Kenji Shiojima, Masashi Kato
8th International Symposium on Control of Semiconductor Interfaces (Sendai) 2019.11 - 2019.11
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[Fr-1B-03] High Performance 3C-SiC Photocathode with Texture Structure Formed by Electrochemical Etching
Masashi Kato, Tomohiro Ambe
ICSCRM2019 (Kyoto ICC) 2019.09 - 2019.10 ICSCRM2019 Organizing Committee
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[Fr-3B-05LN] Microscopic FCA system for carrier lifetime measurement in SiC with high spatial resolution
Keisuke Nagaya, Takashi Hirayama, Takeshi Tawara, Koichi Murata, Hidekazu Tsuchida, Akira Miyasaka, Kazutoshi Kojima, Tomohisa Kato, Hajime Okumura, Masashi Kato
ICSCRM2019 (Kyoto ICC) 2019.09 - 2019.10 ICSCRM2019 Organizing Committee
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[Th-P-51LN] Nondestructive depth distribution measurements of carrier lifetime in 4H-SiC thick epitaxial layers with high spatial resolution
akashi Hirayama, Keisuke Nagaya, Akira Miyasaka, Kazutoshi Kojima, Tomohisa Kato, Hajime Okumura, Masashi Kato
ICSCRM2019 (Kyoto ICC) 2019.09 - 2019.10 ICSCRM2019 Organizing Committee
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[A-1-03] Observation of Photoexcited Carrier Recombination in Metal Halide Perovskite Materials with Single and Poly crystalline structures
T. Kawane, G.J. Matt, S. Shrestha, L. Jevgen, C.J. Brabec, A. Kanak, P. Fochuk, M. Kato
SSDM2019 (Nagoya University) 2019.09 - 2019.09 JSAP
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[PS-4-22] Observation of Slow Carrier Recombination in p-type GaN Epilayers on GaN Substrates
S. Zhu, K. Ito, K. Tomita, T. Narita, T. Kachi, M. Kato
SSDM2019 (Nagoya University) 2019.09 - 2019.09 JSAP
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Temperature dependent carrier lifetime measurements on free-standing 4H-SiC epilayer
Jan Beyer, Masashi Kato, Nadine Schüler, Kay Dornich, Johannes Heitmann
European Materials Research Society 2019 Spring Meeting (Nice, France) 2019.05 - 2019.05
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[9p-S321-7] Hydrogen generation by water splitting using TiO2 and 3C-SiC in tandem structure
Zhenhang Liu、Masashi Kato
2019年第66回応用物理学会春季学術講演会 2019.03 - 2019.03
Academic Activity
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2018.04-2019.03
The Japan Society of Applied Physics
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2017.04-Now
The Japan Society of Applied Physics
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2016.12-2017.11
The Japan Society of Applied Physics
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2016.04-2020.03
The Japan Society of Applied Physics
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2014.01-2014.12
The Japan Society of Applied Physics
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2013.12-2014.11
The Japan Society of Applied Physics
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2012.11-2013.10
The Japan Society of Applied Physics
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2011.12-2014.12
The Japan Society of Applied Physics
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2010.12-2011.11
The Japan Society of Applied Physics