Affiliation Department etc. |
Department of Life Science and Applied Chemistry
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Title |
Professor |
Research Fields, Keywords |
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IDA Takashi
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Graduating School
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-1985.03
The University of Tokyo Faculty of Science Graduated
Graduate School
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-1989.03
The University of Tokyo Graduate School, Division of Science Doctor's Course Unfinished Course
Degree
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The University of Tokyo - Master of Science
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The University of Tokyo - Doctor (Science)
External Career
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1991.04-1999.07
Research Associate, Himeji Institute of Technology Research Assistant
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1989.04-1991.03
Technician, Institute for Molecular Science, Okazaki National Research Institute
Academic Society Affiliations
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2014.08-Now
International Union of Crystallography
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2002.04-Now
The Ceramic Society of Japan
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1999.04-Now
The Crystallographic Society of Japan
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1988.04-Now
The Physical Society of Japan
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1984.04-Now
Chemical Society of Japan
Field of expertise (Grants-in-aid for Scientific Research classification)
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Inorganic materials/Physical properties
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Applied materials
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Inorganic chemistry
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Basic chemistry
Research Career
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Estimation of Crystallite Size and Strain by Powder X-ray D:ffractometry
(not selected)
Project Year: -
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Structure Analysis by Powder X-ray Diffractometry
Collaboration in Japan (not selected)
Project Year: -
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Structure Analysis by Powder X-ray Diffractometry
(not selected)
Project Year: -
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Estimation of Size of Crystalline Fine Particles
(not selected)
Project Year: -
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Methodology of Powder Diffractometry
(not selected)
Project Year: -
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Development of High-precision Powder X-ray Diffractometer
(not selected)
Project Year: -
Papers
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Continuous series of symmetric peak profile functions determined by standard deviation and kurtosis
Takashi Ida
Powder Diffraction ( International Centre for Diffraction Data ) 36 ( 4 ) 2021.12 [Refereed]
Research paper (scientific journal) Single Author
A mathematical system for modeling the effects of symmetrized instrumental aberrations has been developed. The system is composed of the truncated Gaussian, sheared Gaussian and Rosin-Rammler type functions. The shape of the function can uniquely be determined by the standard deviation and kurtosis. A practical method to evaluate the convolution with the Lorentzian function and results of application to analysis of experimental powder diffraction data are briefly described.
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Equatorial aberration for powder diffraction data collected by continuous scan of a silicon strip X-ray detector
Takashi Ida
Powder Diffraction ( International Centre for Diffraction Data ) 64 ( 3 ) 169 - 175 2021.09 [Refereed] [Invited]
Research paper (scientific journal) Single Author
Application of continuous-scan integration to collect X-ray diffraction data with a Si strip X-ray detector (CSI-SSXD) introduces additional effects on the peak-shift and deformation of peak shape caused by the equatorial aberration. A deconvolutional method to correct the effects of equatorial aberration in CSI-SSXD data is proposed in this study. There are four critical angles related to the effects of spill-over of the incident X-ray beam from the specimen face in the CSI-SSXD data. Exact values of cumulants of the equatorial aberration function are efficiently evaluated by 4×4 point two-dimensional Gauss-Legendre integral. A naïve two-step deconvolutional method has been applied to remove the effects of the first and third-order cumulants of the equatorial aberration function from the observed CSI-SSXD data. The performance of the algorithm has been tested by analyses of CSI-SSXD data of three LaB6 powder specimens with the widths of 20, 10 and 5 mm, collected with a diffractometer with the goniometer radius of 150 mm.
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Application of deconvolutional treatment to powder diffraction data collected with a Bragg-Brentano diffractometer with a contaminated Cu target with a Ni filter
Takashi Ida
Powder Diffraction ( International Centre for Diffraction Data ) 35 ( 03 ) 166 - 177 2020.09 [Refereed]
Research paper (scientific journal) Single Author
A deconvolutional method for preprocessing powder diffraction data has been improved. The cumulants of instrumental aberration functions of Bragg-Brentano (Parrish) diffractometer calculated up to the fourth order are presented. The treatments of axial-divergence aberration and the effective spectroscopic profilee of the source X-ray have been simplified from those used in the previous methods. The current method has been applied to powder diffraction data collected with a Cu-target X-ray tube, used over 20 years, and a N-foil K_beta filter.
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Equatorial aberration of powder diffraction data collected with an Si strip X-ray detector by a continuous-scan integration method
T. Ida
Journal of Applied Crystallography ( International Union of Crystallography ) 53 679 - 685 2020.05 [Refereed]
Research paper (scientific journal) Single Author
Exact and approximate mathematical formulas of equatorial aberration for powder diffraction data collected with an Si strip X-ray detector in continuous-scan integration mode are presented. An approximate formula is applied to treat the experimental data measured with a commercial powder diffractometer.
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Takashi Ida, Shoki Ono, Daiki Hattan, Takehiro Yoshida, Yoshinobu Takatsu, Katsuhiro Nomura
Powder Diffraction ( International Centre for Diffraction Data ) 33 ( 2 ) 80 - 87 2018.06 [Refereed]
Research paper (scientific journal) Multiple Authorship
A method to remove small CuKβ peaks and step structures caused by NiK-edge absorption as well as CuKα2 sub-peaks from powder diffraction intensity data measured with Cu-target X-ray source and Ni-foil filter is proposed. The method is based on deconvolution–convolution treatment applying scale transform of abscissa, Fourier transform, and a realistic spectroscopic model for the source X-ray. The validity of the method has been tested by analysis of the powder diffraction data of a standard LaB6 powder (NIST SRM660a) sample, collected with the combination of CuKα X-ray source, Ni-foil Kβ filter, flat powder specimen and one-dimensional Si strip detector. The diffraction intensity data treated with the method have certainly shown background intensity profile without CuKβ peaks and NiK-edge step structures.
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Takashi Ida, Shoki Ono, Daiki Hattan, Takehiro Yoshida, Yoshinobu Takatsu, Katsuhiro Nomura
Powder Diffraction ( International Centre for Diffraction Data ) 33 ( 2 ) 121 - 133 2018.06 [Refereed]
Research paper (scientific journal) Multiple Authorship
An improved method to correct observed shift and asymmetric deformation of diffraction peak profile caused by the axial-divergence aberration in Bragg–Brentano geometry is proposed. The method is based on deconvolution–convolution treatment applying scale transform of abscissa, Fourier transform, and cumulant analysis of an analytical model for the axial-divergence aberration. The method has been applied to the powder diffraction data of a standard LaB6 powder (NIST SRM660a) sample, collected with a one-dimensional Si strip detector. The locations, widths and shape of the peaks in the deconvolved–convolved powder diffraction data have been analyzed. The finally obtained whole powder diffraction pattern ranging from 10° to 145° in diffraction angle has been simulated by the Pawley method applying a symmetric Pearson VII peak profile model to each peak with ten background, two peak-shift, three line-width, and two peak-shape parameters, and the Rp value of the best fit has been estimated at 4.4%.
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Removal of small parasite peaks in powder diffraction data by a multiple deconvolution method
Takashi Ida, Shoki Ono, Daiki Hattan, Takehiro Yoshida, Yoshinobu Takatsu, Katsuhiro Nomura
Powder Diffraction ( International Centre for Diffraction Data ) 33 ( 2 ) 108 - 114 2018.06 [Refereed]
Research paper (scientific journal) Multiple Authorship
Four series of small parasite peaks observed in powder diffraction data recorded with a Cu-target X-ray tube and a Ni filter on the diffracted beam side in Bragg–Brentano geometry are investigated. One series of the parasite peaks is assigned to the tungsten Lα-emission. Other three types of the parasite peak series are likely to be caused by the K-emissions of Ni, but the peak locations are deviated from those predicted by the Bragg's law. An empirical formula to locate the parasite peaks and a method to remove them from observed powder diffraction data are proposed. The method is based on the whole-pattern deconvolution–convolution treatment on the transformed scale of abscissa. The parameters optimized for the diffraction data measured for Si powder has been applied on treatment of the data of LaB6 powder recorded under the same experimental conditions. It has been confirmed that the parasite peaks in the observed data can effectively be removed by the deconvolution treatment with parameters determined by a reference measurement.
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Phase transition behavior of (K,Na) Nb O3 - based high-performance lead-free piezoelectric ceramic composite with different phase compositions depending on Na fraction
Hideto Yamada, Takayuki Matsuoka, Masato Yamazaki, Kazushige Ohbayashi, Takashi Ida
Japanese Journal of Applied Physics ( The Japan Society of Applied Physics ) 57 ( 1 ) 011502 2018.01 [Refereed]
Research paper (scientific journal) Multiple Authorship
The structures of the main (K1− x Nax)NbO3 perovskite in a high-performance lead-free piezoelectric ceramic composite (K1− x Nax)0.86 Ca0.04 Li0.02 Nb0.85 O3−δ–K0.85 Ti0.85 Nb1.15 O5 – Ba Zr O3 – MgO – Fe2 O3 (x = 0.52 and 0.70) with trace amounts of Li Mg Fe Ti O4 inverse spinel and (Li,K)2 (Mg,Fe,Ti,Nb)6 O13 layered structure have been investigated by transmission electron microscopy (TEM) and synchrotron powder X-ray diffractometry (XRD) with varying temperatures. The bright-field TEM images have shown tetragonal 90°-domain contrasts at 80 and 40 °C, and the XRD profile has been simulated by adding an average structure of two differently oriented tetragonal structures bound by a 90°-domain wall for the x = 0.52 sample. Aggregates of tilted NbO6 nanodomains have been observed in a high-resolution TEM image, and the crossover of P4mm–Amm2 features from 60 to 20 °C and diffuse 2 × 2 × 2 superlattice reflections of the tilted NbO6 Imm2 structure have been observed in XRD data for the x = 0.70 sample.
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Analysis of powder diffraction data collected with synchrotron x-ray and multiple 2D x-ray detectors applying a beta-distribution peak profile model
T. Ida, K. Wachi, D. Hattan, S. Ono, S. Tachiki, Y. Nakanishi, Y. Sakuma, A. Wada, S. Towata
Powder Diffraction ( International Centre for Diffraction Data ) 32 ( 3 ) S172 2017.09 [Refereed]
Research paper (international conference proceedings) Multiple Authorship
A powder diffraction measurement system constructed on a beam-line BL5S2 at Aichi Synchrotron Radiation Center in Seto, Japan, has been modified for extensive use of two-dimensional (2D) X-ray detectors. Four flat 2D detectors are currently mounted on the movable stages on supporting rods radially attached to the 2Θ-wheel of the goniometer with the interval of 25°. The 2D powder diffraction intensity data are reduced to conventional 1D format of powder diffraction data by the method based on averaging of the pixel intensities with geometrical corrections, which also enables evaluation of standard uncertainties about the reduced intensity data. The 1D powder diffraction data of a 0.1 mm-capillary LaB6 (NIST SRM660b) sample obtained at the camera length of 340 mm have shown almost symmetric peak profile with slight asymmetry simulated by a beta-distribution profile function.
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Crystal structure and phase transition behavior in (K1-x)NbO3-based lead-free piezoelectric ceramic over a wide range of temperatures
H. Yamada, T. Matsuoka, H. Kozuka, M. Yamazaki, K. Ohbayashi, T. Ida
Journal of Applied Physics ( American Institute of Physics ) 120 214102 2016.12 [Refereed]
Research paper (scientific journal) Multiple Authorship
The phase transition temperature in a (K, Na)NbO3 (KNN) phase of a KNN-based composite lead-free piezoelectric ceramic with a KTiNbO5 system ((K1−xNax)0.86Ca0.04Li0.02Nb0.85O3−δ–K0.85Ti0.85Nb1.15O5–BaZrO3–Co3O4–Fe2O3–ZnO) is lower than that in an undoped KNN ceramic by approximately 200 °C. We have studied the structural changes around the phase transition by using synchrotron powder X-ray diffraction and transmission electron microscopy. The crystal system of the main KNN phase is assigned to tetragonal as a stable structure at room temperature and does not change to orthorhombic on lowering the temperature all at once. The crystal structure changes from tetragonal to orthorhombic through the successive transition state. The curve of the phase transition temperature from x = 0.33 to 0.75 has a V shape and reaches its lowest value of approximately 0 °C in the vicinity of x = 0.56. From selected-area electron diffraction patterns of the KNN phase, weak superlattice spots owing to the tilt-ordered NbO6 octahedra are observed for x ≥ 0.56. This tilt-ordered NbO6 octahedral phase is formed at the nanometer-scale (nanodomains) in the tetragonal and orthorhombic KNN matrices, regardless of the phase transition. The minimum x to generate the nanodomains is substantially equal to the Na fraction at which the starting temperature of the successive phase transition shifts to the lowest.
Books
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Handbook of Instrumental Analysis
Takashi Ida et al. (Part: Allotment Writing )
Kagaku Dojin 2021.03 ISBN: 978-4-7598-2023-2
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Fummatsu X-sen Kaiseki No Jissai "jointly worked"
Takashi Ida et al. (Part: Multiple Authorship )
Asakura-shoten 2009.07 ISBN: 9784254140828
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Nanoparticle Technology Handbook(共著)
T. Ida et al. (Part: Multiple Authorship , pp. 270-274 )
Elsevier 2007.11 ISBN: 9780444531223
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Nanoparticle Technology Handbook "jointly worked"
Takashi Ida et al. (Part: Multiple Authorship )
Nikkan Kogyo Shimbunsha 2006.04 ISBN: 9784526056642
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Functionality of Material "jointly worked"
Takashi Ida et al. (Part: Multiple Authorship )
Maruzen 1993.04 ISBN: 4-621-03816-8
Review Papers
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Concept of deconvolution-convolution treatment on powder X-ray diffraction data
Takashi Ida
Annual Report of Advanced Ceramics Research Center, Nagoya Institute of Technology ( Advanced Ceramics Research Center, Nagoya Institute of Technology ) 5 37 - 43 2017.06 [Refereed]
Introduction and explanation (bulletin of university, research institution) Single Author
This article introduces the core concept of a deconvolution-convolution treatment (DCT) on powder diffraction data, recently proposed by the author. The method is based on a realistic spectroscopic profile of X-ray and the results of cumulant analysis of a precise approximate formula for the axial-divergence aberration in Bragg-Brentano geometry. It is demonstrated that the powder diffraction data treated by the method show almost symmetric single peak profile, and small unwanted contamination peaks in the observed data are effectively removed by the method.
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Activities of ICDD
Takashi Ida
Annual Report of Advanced Ceramics Research Center, Nagoya Institute of Technology ( Advanced Ceramics Research Center, Nagoya Institute of Technology ) 4 12 - 19 2016.07 [Refereed]
Introduction and explanation (bulletin of university, research institution) Single Author
The article is intended to describe the activities of the International Centre for Diffraction Data (ICDD). ICDD is a non-profit, non-governmental scientific organization, dedicated to collecting, editing, mainaining, publishing, and distributing powder diffraction data. The ICDD membership consisits of worldwide representation from academe, government, and industry. ICDD also provides assistance to the scientific community through a variety of approaches.
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Application of Bayesian inference to structure analysis
Takashi Ida
Annual Report of Advanced Ceramics Research Center, Nagoya Institute of Technology ( Advanced Ceramics Research Center, Nagoya Institute of Technology ) 3 11 - 16 2015.07 [Refereed]
Introduction and explanation (bulletin of university, research institution) Single Author
The article describes basic concepts of statistical estimation based on experimental data, including (i) Bayesian inference, (ii) maximum a posteriori estimation, (iii) maximum likelihood estimation, (iv) least-squares estimation. It is emphasized that Bayesian inference is nothing but calculation of "conditional probability," which is written in textbooks of high-school mathematics in Japan. Bayesian approach allows prejudice, biased ideas, preconception, and never forces us to get rid of them. The basic concept of Bayesian inference explicitly assumes that we can never reach the absolute truth, but we can always approach to the truth at the same time. A simple implementation of Bayesian inference in crystal structure analysis based on X-ray diffraction measurements is proposed.
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Advanced Methods for Powder Diffraction Anallysis - II
Takashi Ida
Journal of the Technical Association of Refractories, Japan ( The Technical Association of Refractories, Japan ) 34 ( 4 ) 237 - 242 2014.12
Introduction and explanation (international conference proceedings) Single Author
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Advanced Methods for Powder Diffraction Analysis - I
Takashi Ida
Journal of the Technical Association of Refractories, Japan ( The Technical Association of Refractories, Japan ) 34 ( 4 ) 232 - 236 2014.12
Introduction and explanation (international conference proceedings) Single Author
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Evaluation of Crystallite Size by X-ray Diffraction Method
Takashi Ida
Bulletin of The Ceramic Society of Japan ( The Ceramic Society of Japan ) 49 ( 3 ) 157 - 162 2014.03
Introduction and explanation (international conference proceedings) Single Author
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Advanced methods for powder diffraction analysis - II
Takashi Ida
TAIKABUTSU 65 ( 10 ) 470 - 475 2013.10
Introduction and explanation (bulletin of university, research institution) Single Author
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Advanced methods for powder diffraction analysis - I
Takashi Ida
TAIKABUTSU 65 ( 8 ) 348 - 353 2013.08
Introduction and explanation (international conference proceedings) Single Author
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Particle statistics in synchrotron powder diffractometry
T. Ida, T. Goto, A. Oya, H. Hibino
Photon Factory Activity Report 2009 ( Photon Factory ) 27 ( B ) 271 - 271 2011.03
Introduction and explanation (others) Multiple Authorship
Presentations
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T. Ida
Denver X-ray Conference (Virtual event) 2020.08 - 2020.08 International Centre for Diffraction Data
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Treatment of powder X-ray diffraction data collected with a Bragg-Brentano diffractometer with a Cu K X-ray source and a Ni-foil filter
Takashi Ida
AsCA 2019 2019.12 - 2019.12
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Powder Diffraction Method with Laboratory & Synchrotron Sources of X-ray
Takashi Ida
Pacific Rim Conference of Ceramic Societies (Okinawa Convention Center, Ginowan, Okinawa) 2019.10 - 2019.11 Pacrim13 Organizing Committee
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Further Improvements of Deconvolution Convolution Method for Powder XRD Data
Takashi Ida
ICDD 2019 Spring Meetings (Newtown Square, PA, USA) 2019.03 - 2019.03 International Centre for Diffraction Data
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Automation of deconvolution-convolution treatment on powder X-ray diffraction data
Takashi Ida
AsCA 2018 2018.12 - 2018.12
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Study on tetragonal-cubic phase transition of barium titanate
Daiki Hattan, Takashi Ida, Katsuhiro Nomura
Academic Forum on Ceramics Research in Tokai (Nagoya) 2017.12 - 2017.12 Tokai Branch, The Ceramic Society of Japan
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Deconvolution-convolution treatment of powder diffraction data collected in Bragg-Brentano geometry
T. Ida, D. Hattan, K. Nomura
The 24th Congress & General Assembly of the International Union of Crystallography (IUCr 2017) (Hyderabad, India) 2017.08 - 2017.08 International Union of Crystallography
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Investigation of tetragonal-cubic transition of barium titanate
D. Hattan, S. Ono, Y. Takatsu, T. Yoshida, H. Hibino, T. Ida, K. Nomura
The 24th Congress & General Assembly of the International Union of Crystallography (IUCr 2017) (Hyderabad, India) 2017.08 - 2017.08 International Union of Crystallography
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Improveme t of deconvolution-convolution method for powder diffractometry
T. Ida, D. Hattan, K. Nomura
Denver X-ray Conference (Big Sky Resort, MT, USA) 2017.07 - 2017.08 International Centre for Diffraction Data
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Decontamination of powder diffraction data measured with copper K alpha x-ray and nickel filter
T. Ida, D. Hattan, K. Nomura
ICDD Spring Meetings (Newtown Square, PA, USA) 2017.03 - 2017.03 International Centre for Diffraction Data
Academic Activity
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2014.08-Now
International Union of Crystallography
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2010.04-2012.03
The Crystallographic Society of Japan
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2006.06-2021.03
The Ceramic Society of Japan
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2006.05-Now
The Ceramic Society of Japan
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2005.02-Now
The Ceramic Society of Japan